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  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.
1

Hardware and Software Fault-Tolerance of Softcore Processors Implemented in SRAM-Based FPGAs

Rollins, Nathaniel Hatley 09 March 2012 (has links) (PDF)
Softcore processors are an attractive alternative to using expensive radiation-hardened processors for space-based applications. Since they can be implemented in the latest SRAM-based FPGA technologies, they are fast, flexible and significantly less expensive. However, unlike ASIC-based processors, the logic and routing of a softcore processor are vulnerable to the effects of single-event upsets (SEUs). To protect softcore processors from SEUs, this dissertation explores the processor design-space for the LEON3 softcore processor implemented in a commercial SRAM-based FPGA. The traditional mitigation techniques of triple modular redundancy (TMR) and duplication with compare (DWC) and checkpointing provide reliability to a softcore processor at great spatial cost. To reduce the spatial cost, terrestrial ASIC-based processor protection techniques are applied to the LEON3 processor. These techniques come at the cost of time instead of area. The software fault-tolerance techniques used to protect the logic and routing of the LEON3 softcore processor include a modified version of software implemented fault tolerance (SWIFT), consistency checks, software indications, and checkpointing. To measure the reliability of a mitigated LEON3 softcore processor, an updated hardware fault-injection model is created, and novel reliability metrics are employed. The improvement in reliabilty over an unmitigated LEON3 is measured using four metrics: architectural vulnerability factor (AVF), mean time to failure (MTTF), mean useful instructions to failure (MuITF), and reliability-area-performance (RAP). Traditional reliability techniques provide the best reliability: DWC with checkpointing improves the MTTF and MuITF by almost 35x and TMR with triplicated input and outputs improves the MTTF and MuITF by almost 6000x. Software fault-tolerance provides significant reliability for a much lower area cost. Each of these techniques provides greater processor protection than a popular state-of-the-art rad-hard processor.

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