Conventional interferometry is widely used to measure spherical and flat surfaces with nanometer level precision but is plagued by back reflections. We describe a new method of isolating the measurement surface by controlling spectral properties of the source (Spectrally Controlled Interferometry - SCI). Using spectral modulation of the interferometer's source enables formation of localized fringes where the optical path difference is non-zero. As a consequence it becomes possible to form white-light like fringes in common path interferometers, such as the Fizeau. The proposed setup does not require mechanical phase shifting, resulting in simpler instruments and the ability to upgrade existing interferometers. Furthermore, it allows absolute measurement of distance, including radius of curvature of lenses in a single setup with possibility of improving the throughput and removing some modes of failure.