NDLTD Global ETD Search
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  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.

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1

Effects of Gate Stress and Parasitic Package Inductance on the Reliability of GaN HEMTs

Tine, Cheikh Abdoulahi, Tine January 2017 (has links)
No description available.
Electrical Engineering
Engineering
Reliability
gate stress
package parasitic inductance
device modeling
GaN degradation
Gallium Nitride
step stress analysis

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