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1	Simulação com o código GEANT4 de medida de espessura de revestimento metálico em metal por XRF / GEANT4 simulation of measure thickness of metallic coating on metal by XRF Ievgeniia Ievsieieva 17 September 2012 (has links) Conselho Nacional de Desenvolvimento Científico e Tecnológico / Nesta dissertação são apresentados resultados de simulações Monte Carlo de fluorescência de raios X (XRF), utilizando o programa GEANT4, para medidas de espessura de revestimento metálico (Ni e Zn) em base metálica (Fe). As simulações foram feitas para dois tamanhos de espessura para cada metal de revestimento, (5μm e 10μm), com passos de 0,1 μm e 0,001 μm e com 106 histórias. No cálculo da espessura do revestimento foram feitas as aproximações de feixe de raios X monoenegético, com a análise da transmissão apenas da energia do K-alfa e para uma geometria compatível com um sistema real de medição (ARTAX-200). Os resultados mostraram a eficiência da metodologia de simulação e do cálculo da espessura do revestimento, o que permitirá futuros cálculos, inclusive para multirevestimentos metálicos em base metálica. / This dissertation is presented results of x-ray fluorescence (XRF) Monte Carlo simulations) using GEANT4 for metallic coating (Ni and Zn) thickness determination on metallic base (Fe). The simulations were made for two values of coating thickness for each covering (5 μm and 10 μm), with steps of 0.1 μm and 0.001 μm, and with 106 stories. The monoenergetic x-ray approach was used assuming the transmission of only K-alpha line. The experiment and geometry was similar to the real system of measurement (ARTAX-200 ). The results showed the efficiency of the simulation methodology, as well as the ability to measure the thickness of coating by XRF. Thus, a continuation of this study for multilayer metal coating could be promising. Simulações Monte Carlo GEANT4 Fluorescência de raios X Medidas de espessura Revestimento metálico Monte Carlo simulations GEANT4 X-ray fluorescence Thickness determination Metallic coating ENGENHARIA NUCLEAR
2	Simulação com o código GEANT4 de medida de espessura de revestimento metálico em metal por XRF / GEANT4 simulation of measure thickness of metallic coating on metal by XRF Ievgeniia Ievsieieva 17 September 2012 (has links) Conselho Nacional de Desenvolvimento Científico e Tecnológico / Nesta dissertação são apresentados resultados de simulações Monte Carlo de fluorescência de raios X (XRF), utilizando o programa GEANT4, para medidas de espessura de revestimento metálico (Ni e Zn) em base metálica (Fe). As simulações foram feitas para dois tamanhos de espessura para cada metal de revestimento, (5μm e 10μm), com passos de 0,1 μm e 0,001 μm e com 106 histórias. No cálculo da espessura do revestimento foram feitas as aproximações de feixe de raios X monoenegético, com a análise da transmissão apenas da energia do K-alfa e para uma geometria compatível com um sistema real de medição (ARTAX-200). Os resultados mostraram a eficiência da metodologia de simulação e do cálculo da espessura do revestimento, o que permitirá futuros cálculos, inclusive para multirevestimentos metálicos em base metálica. / This dissertation is presented results of x-ray fluorescence (XRF) Monte Carlo simulations) using GEANT4 for metallic coating (Ni and Zn) thickness determination on metallic base (Fe). The simulations were made for two values of coating thickness for each covering (5 μm and 10 μm), with steps of 0.1 μm and 0.001 μm, and with 106 stories. The monoenergetic x-ray approach was used assuming the transmission of only K-alpha line. The experiment and geometry was similar to the real system of measurement (ARTAX-200 ). The results showed the efficiency of the simulation methodology, as well as the ability to measure the thickness of coating by XRF. Thus, a continuation of this study for multilayer metal coating could be promising. Simulações Monte Carlo GEANT4 Fluorescência de raios X Medidas de espessura Revestimento metálico Monte Carlo simulations GEANT4 X-ray fluorescence Thickness determination Metallic coating ENGENHARIA NUCLEAR
3	The Development of Image Processing Algorithms in Cryo-EM Rui Yan (6591728) 15 May 2019 (has links) Cryo-electron microscopy (cryo-EM) has been established as the leading imaging technique for structural studies from small proteins to whole cells at a molecular level. The great advances in cryo-EM have led to the ability to provide unique insights into a wide variety of biological processes in a close to native, hydrated state at near-atomic resolutions. The developments of computational approaches have significantly contributed to the exciting achievements of cryo-EM. This dissertation emphasizes new approaches to address image processing problems in cryo-EM, including tilt series alignment evaluation, simultaneous determination of sample thickness, tilt, and electron mean free path based on Beer-Lambert law, Model-Based Iterative Reconstruction (MBIR) on tomographic data, minimization of objective lens astigmatism in instrument alignment and defocus and magnification dependent astigmatism of TEM images. The final goal of these methodological developments is to improve the 3D reconstruction of cryo-EM and visualize more detailed characterization. Biophysics Structural Biology Computational Biology cryo electron microscopy cryo electron tomography image processing algorithms Beer-Lambert Law alignment accuracy thickness determination mean free path inelastic scattering least square methods Model-Based Iterative Reconstruction contrast improvement missing wedge artifacts reduction missing information restoration subtomogram averaging astigmatism correction objective lens stigmators single-pass tuning strategy defocus-dependent astigmatism magnification-dependent astigmatism

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