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An I/O algorithm and a test algorithm for a reconfigurable cellular array

Recent advances in VLSI technology have stimulated research efforts in the area of highly reliable fault tolerant, general purpose computing systems, notably, parallel systems. An automatically reconfigurable, fault-tolerant, parallel architecture is suited to VLSI technology. The architecture, a uniformly interconnected array of identical cells, is capable of functional reconfiguration as well as fault reconfiguration. Microprocessor cells are suggested as the "fabric" for implementation of the array. This thesis also introduces an I/O algorithm as an extension to the reconfiguration process, and outlines the steps by which the array cells construct paths from the active-array to the cellular array I/O ports. Path reconfiguration is presented as the method by which fault-free paths replace faulty paths. A testing algorithm is described for use in the self-testing operation of the array. The types of tests that are conducted on cells are outlined, and the basis by which a cell determines the faulty or fault-free status of a cell is described. / M.S.

Identiferoai:union.ndltd.org:VTETD/oai:vtechworks.lib.vt.edu:10919/90927
Date January 1985
CreatorsConnell, Kathleen L.
ContributorsElectrical Engineering
PublisherVirginia Polytechnic Institute and State University
Source SetsVirginia Tech Theses and Dissertation
Languageen_US
Detected LanguageEnglish
TypeThesis, Text
Formatx, 169 leaves, application/pdf, application/pdf
RightsIn Copyright, http://rightsstatements.org/vocab/InC/1.0/
RelationOCLC# 12965132

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