The feasibility of developing test circuits to perform in-circuit testing of analog
circuits is investigated in this thesis. A modular approach to analog testing has been
adopted. Accordingly, the testing of an operational amplifier, which is a basic building
block in analog circuits, is addressed. One convenient technique for measuring the frequency
response of an op-amp requires a unity gain buffer to be inserted into its feedback
loop. This buffer has to be simple in construction, small and accurate. Two buffer circuits
that satisfy these requirements are described in this thesis. Enhanced slewing techniques
are devised to achieve increased levels of performance. The buffers were integrated with
an op-amp into a test chip. Digital logic is used to provide controllability and accessibility
to each of the buffers and the op-amp so that they can characterized separately.
The performance of the enhanced slewing buffers was verified with measurements
performed on the test chip. The performance of the buffers conformed well with the simulated
values. The buffers exhibited excellent settling times even while driving large capacitive
loads. Their output swing and distortion performance were good for inputs as large as
2 V peak-to-peak values. / Graduation date: 1994
| Identifer | oai:union.ndltd.org:ORGSU/oai:ir.library.oregonstate.edu:1957/35884 |
| Date | 22 June 1993 |
| Creators | Rangan, Giri N. K. |
| Contributors | Kenney, John G. |
| Source Sets | Oregon State University |
| Language | en_US |
| Detected Language | English |
| Type | Thesis/Dissertation |
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