Detailed magnetometry and polarized neutron reflectometry studies were conducted
on MnSi thin films grown epitaxially on Si(111) substrates. It is demonstrated that
with an in-plane applied field H || [110], a broadly stable skyrmion phase exists at
elevated temperatures and fields.
Magnetometry and transport measurements with an out-of-plane applied field
H || [111] prove that no skyrmion phase exists in this geometry. However, Hall effect
measurements in this geometry show unexpected evidence of a topological Hall effect.
This can be explained with a multi-dimensionally modulated cone phase, which proves
that contrary to recent literature, a topological Hall effect is not sufficient proof of
skyrmions.
The results of this thesis represent a significant step towards a technologically
relevant material in which skyrmions are broadly stable. A material of this type
could be used in novel magnetic storage devices and signi ficantly impact our future
computing capabilities.
| Identifer | oai:union.ndltd.org:LACETR/oai:collectionscanada.gc.ca:NSHD.ca#10222/21672 |
| Date | 01 April 2013 |
| Creators | Wilson, Murray |
| Source Sets | Library and Archives Canada ETDs Repository / Centre d'archives des thèses électroniques de Bibliothèque et Archives Canada |
| Language | English |
| Detected Language | English |
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