The goal of this research was to investigate an experimental infrared transmission technique to extract the full stress components of the in-plane residual stresses in thin multi crystalline silicon wafer, and try to meet the need of photovoltaic industry to in situ measure residual stress for large cast wafers.
| Identifer | oai:union.ndltd.org:GATECH/oai:smartech.gatech.edu:1853/34762 |
| Date | 18 May 2010 |
| Creators | Li, Fang |
| Publisher | Georgia Institute of Technology |
| Source Sets | Georgia Tech Electronic Thesis and Dissertation Archive |
| Detected Language | English |
| Type | Dissertation |
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