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Accurate treatment of interface roughness in nanoscale double-gate metal oxide semiconductor field effect transistors using non-equilibrium green's functions

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1. http://rave.ohiolink.edu/etdc/view?acc_num=ohiou1176318345

Identifer	oai:union.ndltd.org:OhioLink/oai:etd.ohiolink.edu:ohiou1176318345
Date	January 2004
Creators	Fonseca, James Ernest
Publisher	Ohio University / OhioLINK
Source Sets	Ohiolink ETDs
Language	English
Detected Language	English
Type	text
Source	http://rave.ohiolink.edu/etdc/view?acc_num=ohiou1176318345
Rights	unrestricted, This thesis or dissertation is protected by copyright: all rights reserved. It may not be copied or redistributed beyond the terms of applicable copyright laws.