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A test strategy planning methodology driven by economic parameters
No description available.
Links & Downloads
http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.292562
Tags
621.37
Integrated circuit testing
Additional Fields
Identifer
oai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:292562
Date
January 1990
Creators
Dear, Ian D.
Publisher
Brunel University
Source Sets
Ethos UK
Detected Language
English
Type
Electronic Thesis or Dissertation
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