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Statistical Analysis of Specific Secondary Circuit Effect under Fault Insertion in 22 nm FD-SOI Technology Node

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Identiferoai:union.ndltd.org:OhioLink/oai:etd.ohiolink.edu:osu1638449463385479
Date January 2021
CreatorsMcKinsey, Vince Allen
PublisherThe Ohio State University / OhioLINK
Source SetsOhiolink ETDs
LanguageEnglish
Detected LanguageEnglish
Typetext
Sourcehttp://rave.ohiolink.edu/etdc/view?acc_num=osu1638449463385479
Rightsunrestricted, This thesis or dissertation is protected by copyright: all rights reserved. It may not be copied or redistributed beyond the terms of applicable copyright laws.

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