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  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.
381

The Reconceptualization and Measurement of Workplace Interpersonal Distrust

Min, Hanyi 23 July 2018 (has links)
No description available.
382

A STUDY OF VARIOUS PROCESS FACTORS IN THE SCALE UP OF A HIGH SHEAR GRANULATED PRODUCT

PAPPA, DAVID MICHAEL 16 January 2002 (has links)
No description available.
383

Development of Rating Scale in Lean Construction

Melam, Madhu Chandra 23 September 2011 (has links)
No description available.
384

Adapting the limited memory of microcomputers to solve large scale manufacturing problems

Connolly, Michael January 1983 (has links)
No description available.
385

Formation of Sulfide Scales and Their Role in Naphthenic Acid Corrosion of Steels

Kanukuntla, Vijaya 25 April 2008 (has links)
No description available.
386

The impact of tuliptree scale feeding on its host, yellow-poplar /

Burns, Denver Peeper January 1967 (has links)
No description available.
387

The use of the Rokeach dogmatism scale in the prediction of students' reactions to proposed innovative practices /

Hall, Ralph Leonard,1935- January 1971 (has links)
No description available.
388

An application of multidimensional scaling to the construction of predictive portfolio selection models /

Oakley, Robert Alan January 1973 (has links)
No description available.
389

A scale analysis of the Wechsler intelligence scale for children with different groups of disadvantaged children /

Vance, Hubert Robert January 1973 (has links)
No description available.
390

An Integrated Test Plan for an Advanced Very Large Scale Integrated Circuit Design Group

Didden, William S. 01 January 1984 (has links) (PDF)
VLSI testing poses a number of problems which includes the selection of test techniques, the determination of acceptable fault coverage levels, and test vector generation. Available device test techniques are examined and compared. Design rules should be employed to assure the design is testable. Logic simulation systems and available test utilities are compared. The various methods of test vector generation are also examined. The selection criteria for test techniques are identified. A table of proposed design rules is included. Testability measurement utilities can be used to statistically predict the test generation effort. Field reject rates and fault coverage are statistically related. Acceptable field reject rates can be achieved with less than full test vector fault coverage. The methods and techniques which are examined form the basis of the recommended integrated test plan. The methods of automatic test vector generation are relatively primitive but are improving.

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