Spelling suggestions: "subject:"[een] SCALE"" "subject:"[enn] SCALE""
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The Reconceptualization and Measurement of Workplace Interpersonal DistrustMin, Hanyi 23 July 2018 (has links)
No description available.
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A STUDY OF VARIOUS PROCESS FACTORS IN THE SCALE UP OF A HIGH SHEAR GRANULATED PRODUCTPAPPA, DAVID MICHAEL 16 January 2002 (has links)
No description available.
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Development of Rating Scale in Lean ConstructionMelam, Madhu Chandra 23 September 2011 (has links)
No description available.
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Adapting the limited memory of microcomputers to solve large scale manufacturing problemsConnolly, Michael January 1983 (has links)
No description available.
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Formation of Sulfide Scales and Their Role in Naphthenic Acid Corrosion of SteelsKanukuntla, Vijaya 25 April 2008 (has links)
No description available.
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The impact of tuliptree scale feeding on its host, yellow-poplar /Burns, Denver Peeper January 1967 (has links)
No description available.
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The use of the Rokeach dogmatism scale in the prediction of students' reactions to proposed innovative practices /Hall, Ralph Leonard,1935- January 1971 (has links)
No description available.
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An application of multidimensional scaling to the construction of predictive portfolio selection models /Oakley, Robert Alan January 1973 (has links)
No description available.
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A scale analysis of the Wechsler intelligence scale for children with different groups of disadvantaged children /Vance, Hubert Robert January 1973 (has links)
No description available.
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An Integrated Test Plan for an Advanced Very Large Scale Integrated Circuit Design GroupDidden, William S. 01 January 1984 (has links) (PDF)
VLSI testing poses a number of problems which includes the selection of test techniques, the determination of acceptable fault coverage levels, and test vector generation. Available device test techniques are examined and compared. Design rules should be employed to assure the design is testable. Logic simulation systems and available test utilities are compared. The various methods of test vector generation are also examined. The selection criteria for test techniques are identified. A table of proposed design rules is included. Testability measurement utilities can be used to statistically predict the test generation effort. Field reject rates and fault coverage are statistically related. Acceptable field reject rates can be achieved with less than full test vector fault coverage. The methods and techniques which are examined form the basis of the recommended integrated test plan. The methods of automatic test vector generation are relatively primitive but are improving.
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