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  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.

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Showing 1 to 3 of 3 (0.076 seconds)

Spelling suggestions: "subject:"conducted 2mission"" "subject:"conducted 2emission""

1

CONDUCTED EMISSION STUDY ON SI AND SIC POWER DEVICES

Guo, Wilson 13 May 2019 (has links)
No description available.
Electrical Engineering
Conducted Emission
Silicon Carbide
Power Devices
Double Pulse Test
Three Phase Inverter
2

Méthodologie de prédiction des niveaux d'émission conduite dans les circuits intégrés, à l'aide de VHDL-AMS / A VHDL-AMS based prediction methodology of conducted emission in integrated circuits

Perdriau, Richard 25 March 2004 (has links)
Depuis de nombreuses années, la prise en compte des critères de compatibilité électromagnétique (CEM) constitue une étape capitale dans la conception des systèmes électroniques. Or, l'augmentation de la complexité des circuits intégrés rend indispensable l'étude du comportement électromagnétique directement au niveau du silicium. L'objectif de ces travaux est la définition d'une méthodologie de prédiction, avant fonderie, de l'émission conduite des circuits intégrés. Celle-ci s'appuie sur le langage VHDL-AMS et le modèle ICEM (Integrated Circuit Electromagnetic Model), et peut s'intégrer dans un flot de conception industriel. / For many years, taking into account electromagnetic compatibility (EMC) constraints has been a fundamental requirement in electronic system design. However, the increase in complexity of integrated circuits now demands the study of their electromagnetic behavior at chip level. The objective of this work is the definition of a methodology aimed at predicting conducted emission in integrated circuits. This methodology is based on the VHDL-AMS language and the ICEM (Integrated Circuit Electromagnetic Model) model, and can be integrated into an industrial design flow.
EMC
Compatibilité électromagnétique
Memories
Modeling
Conducted emission
ICEM
Prediction
EMI
VHDL-AMS
CEM
Prédiction
Emission conduite
Electromagnetic compatibility
Modélisation
Simulation
Mémoires
3

Skener elektromagnetických polí a jeho využití při měření elektromagnetické kompatibility / Electromagnetic field scanner and its utilization in EMC measurement

Chupáč, Michal January 2013 (has links)
Master’s thesis is focused on making the acquaintance of EMC issues and ways of electromagnetic field scanner RS321 utilization for pre-compliance measurements. First part contains analysis of available equipment’s influence on measurement results on the basis of gathered specification. Next part includes an example measurement used as operational manual for scanner and its controlling program. The most important part is correction evaluation for performed EMI measurement of signal generator using its EMC certification protocol and application of gained correction curve on independent EMI measurement of device tested by EMC testing laboratory. Other possibilities of scanner utilization are mentioned in the next chapters. Last part of the thesis contains suitability evaluation of EMC scanner on the basis of findings from performed measurements.

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