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1	Pilot Variability During Pilot-Induced Oscillation Robbins, Andrew Campbell 23 June 1999 (has links) Pilot Induced Oscillations (PIO) are described as pilot-aircraft dynamic couplings which can lead to instability in an otherwise stable system. Previous and ongoing research has attempted to explain, predict, and avoid such oscillations. In contrast to other research, this effort backs away from pilot models and PIO avoidance and focuses on the characteristics of the pilot before, during, and after a PIO. Often, PIO''s can be explained by limit cycles occurring in a non-linear system where the non-linearities cause a sustained, constant amplitude oscillation. The primary instigators in such a PIO are usually a non-linear element (i.e. rate limit saturation) and a trigger event (i.e. pilot mode switching or increased pilot gain). By performing analysis in the frequency domain, determining such oscillations becomes easier. Using spectrograms and power spectral density functions, the frequency content of a signal in the pilot-aircraft system can also be investigated. An F-14 flight test was recently performed where the hydraulic system was modified to determine the feasibility of trying to recover the aircraft (land on carrier) during such an extreme hydraulic failure. During testing, a severe PIO occurred because of the tight tracking task used during aerial refueling. While performing spectrograms and power spectral analysis, an increase in power concentration at the PIO frequency was observed. With a linear approximation of the F-14 aircraft dynamics, a closed-loop system containing the aircraft, actuator, and pilot dynamics is developed so that limit cycle analysis can be performed. With stable limit cycle solutions found possible, a pilot-in-the-loop simulation is performed to verify the pilot model used in limit cycle analysis. Using the flight test data, limit cycle analysis, and pilot-in-the-loop simulation, a connection between variation in pilot behavior and PIO predicted by the increase in power concentration is investigated. The resulting connection showed that an increase in pilot gain along with a transition from observing pitch attitude to pitch rate are the possible trigger events causing the PIO. The use of spectrograms as a PIO predictor is shown to be possible, provided the necessary calculations can be completed in real-time. / Master of Science PIO Limit Cycle Analysis Power Spectral Density Describing Functions
2	Nonlinear devices characterization and micromachining techniques for RF integrated circuits Parvais, Bertrand J. H. 10 December 2004 (has links) The present work is dedicated to the development of high performance integrated circuits for wireless communications, by acting of three different levels: technologies, devices, and circuits. Silicon-on-Insulator (SOI) CMOS technology is used in the frame of this work. Micromachining technologies are also investigated for the fabrication of three-dimensional tunable capacitors. The reliability of micromachined thin-film devices is improved by the coating of silanes in both liquid- and vapor-phases. Since in telecommunication applications, distortion is responsible for the generation of spurious frequency bands, the linearity behavior of different SOI transistors is analyzed. The validity range of the existing low-frequency nonlinear characterization methods is discussed. New simple techniques valid at both low- and high-frequencies, are provided, based on the integral function method and on the Volterra series. Finally, the design of a crucial nonlinear circuit, the voltage-controlled oscillator, is introduced. The describing function formalism is used to evaluate the oscillation amplitude and is embedded in a design methodology. The frequency tuning by SOI varactors is analyzed in both small- and large-signal regimes. Intermodulation Surface micromachining Dry etching Silanes SOI Release Polysilicon ICP Plasma etching Hydrophobicity LNA RIE Low-noise amplifier IFM Stress Capillarity Linearity Microsystem VCO Silicidation Oscillators Large-signal network analyzer Describing functions Integral function method Silicon-on-insulator Distortion CMOS Circuit design MEMS RF IC Stiction Volterra Phase noise Varactor Tunable capacitor

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Pilot Variability During Pilot-Induced Oscillation

Nonlinear devices characterization and micromachining techniques for RF integrated circuits