Proefschrift--Leyden. / "Samenvatting": p.[164]-169. Includes bibliographical references.

Thesis (DR. ENG.)--Johns Hopkins university, 1931. / Cover title. Vita. By W.B. Kouwenhoven and Leo J. Berberich. "Presented at the Winter convention of the A.I.E.E., New York, N.Y., January 23-27, 1933." Bibliography: p. 7.

Thesis (Ph. D.)--University of Texas at Austin, 2005. / Vita. Includes bibliographical references.

Thesis (Ph.D.)--Hong Kong University of Science and Technology, 2005. / Includes bibliographical references (leaves 161-179). Also available in electronic version.

Thesis (Ph.D.)--Hong Kong University of Science and Technology, 2006. / Includes bibliographical references. Also available in electronic version.

Thesis (Ph. D.)--Oregon Graduate Center, 1988.

No description available.

The deterioration of electrical insulating oils results in the formation of complex oxidation products, many of which are polar in structure. The significance of the microwave-frequency dielectric-loss measurement, when applied to the evaluation of aged transformer oils, is investigated. A cylindrical cavity, operating in the TE₀₁ mode, is used to measure the loss tangent of aged transformer oils. Q-factor measurements are made by a dynamic method which is described. The problem of mode interference in the cavity is investigated in detail. It is found that the loss tangent of transformer oils, measured at X-band, increases as the oil deteriorates through oxidation. The increase is influenced by several factors but closely parallels the increase in acidity. Sludge particles do not in themselves cause a significant increase in the dielectric losses. An indirect correlation between the loss tangent and the sludge content of an oil may exist but has not been established. The change in the dielectric constant of an oil caused by the presence of dissolved water, or by the ageing process, is too small to be measured by the method used. A small but measureable increase in the loss tangent is produced by the presence of water in concentrations of approximately 75 parts per million. / Applied Science, Faculty of / Electrical and Computer Engineering, Department of / Graduate

The dielectric polarization processes, conduction mechanisms and space charge effects occurring in tantalum / tantalum pentoxide / metal devices are investigated. The dielectric properties are analyzed on the basis of an ionic relaxation process with a nearly flat distribution of activation energies. This distribution leads to step response polarization currents following an inverse time law. The effect of an injected electronic space charge on the response of the device due to the removal of a step voltage is analyzed and results are given demonstrating this effect. The devices used exhibit a rectification behaviour. For tantalum positive the currents follow a Schottky law and for tantalum negative, the bulk Poole-Frenkel law. Hysteresis effects are observed as well as the effects of a space charge on the Schottky law currents. On one sample, sufficiently high fields causes an increase in the conductance by a factor of 10³ to 10⁵. For this deformed sample, no hysteresis or rectification is observed and the currents follow a Schottky law for both polarities. The validity of the ionic relaxation model is discussed in light of the observed dielectric losses at low temperatures. The experimental results indicate that an electronic rather than an ionic process could be responsible for the dielectric losses. / Applied Science, Faculty of / Electrical and Computer Engineering, Department of / Graduate

A study has been made of the properties of thin yttrium oxide dielectric films prepared by the electron beam evaporation of high purity Y₂O₃ powder. Films deposited on freshly cleaved NaCl crystals and on polished n-type silicon were examined in the electron microscope. The specimens were found to be polycrystalline, with a crystal size of the order of 100 Å. The structure was found to be essentially the same as found for bulk Y₂O₃. D.C. conduction measurements were made on films of various thicknesses. The characteristics were found to be bulk-limited, with the conductivity decreasing at lower pressures. An activation energy of 0.6 eV was found. The conduction mechanism was believed to be Poole-Frenkel emission of electrons from donor centers into the Y₂O₃ conduction band. The donor centers were believed to be interstitial yttrium atoms rather than oxygen vacancies because of the pressure dependence observed in conductivity. Step response measurements were made, and the results explained on the basis of a loss peak with a most probable relaxation time of 200 seconds. The relaxation of oxygen atoms dissolved in the anion defective Y₂O₃ lattice was assumed to be the mechanism. The results of step response and A.C. bridge loss measurements indicated that different relaxation mechanisms are dominant in different frequency ranges. Internal photoemission measurements were made on Al-Y₂O₃-Al sandwiches. The energy barrier between the electrodes was found to be trapezoidal, with barrier heights of 3.14 and 3.72 eV. / Applied Science, Faculty of / Electrical and Computer Engineering, Department of / Graduate