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  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.
211

A study of the relationship between the dielectric constant and accessibility of cellulose

Kane, Daniel E., January 1953 (has links) (PDF)
Thesis (Ph. D.)--Institute of Paper Chemistry, 1953. / Includes bibliographical references (p. 61-64).
212

An investigation of the loss angle and dielectric constant of cellulose

Calkins, Charles Richard, January 1949 (has links) (PDF)
Thesis (Ph. D.)--Institute of Paper Chemistry, 1949. / Includes bibliographical references (p. 135-137).
213

A study of the relationship between the dielectric constant and crystallinity of cellulose /

Verseput, Herman Ward, January 1951 (has links) (PDF)
Thesis (Ph. D.)--Institute of Paper Chemistry, 1951. / Bibliography: leaves 112-118.
214

Non-fourier heat equations in solids analyzed from phonon statistics

Bright, Trevor James. January 2009 (has links)
Thesis (M. S.)--Mechanical Engineering, Georgia Institute of Technology, 2010. / Committee Chair: Zhang, Zhuomin; Committee Member: Kumar, Satish; Committee Member: Peterson, G. P. Part of the SMARTech Electronic Thesis and Dissertation Collection.
215

The effects of post-ash cleaning and chemical treatments on the dielectric properties and reliability of Cu/low-k interconnect structures

Borthakur, Swarnal 28 August 2008 (has links)
Not available / text
216

Characterization and reliability of HFO₂ and hfsion gate dielectrics with tin metal gate

Krishnan, Siddarth A. 28 August 2008 (has links)
Not available / text
217

Charge trapping effects on mobility and threshold voltage instability in high-k gate stacks

Sim, Jang Hoan 28 August 2008 (has links)
Not available / text
218

Nonlinear optical characterization of Si/high-k dielectric interfaces

Carriles Jaimes, Ramón 28 August 2008 (has links)
Not available / text
219

High-permittivity dielectrics and high mobility semiconductors for future scaled technology: Hf-based High-K gate dielectrics and interface engineering for HfO₂/Ge CMOS device

Lu, Nan 28 August 2008 (has links)
Not available / text
220

Analyses of device characteristics in low voltage p-, new material n-, and dual-channel organic field-effect transistors

Jeong, Yeon Taek, 1971- 29 August 2008 (has links)
Not available / text

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