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  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.
1

A reconfiguration-based defect-tolerant design paradigm for nanotechnologies

He, Chen 28 August 2008 (has links)
Not available / text
2

A reconfiguration-based defect-tolerant design paradigm for nanotechnologies

He, Chen, January 1900 (has links) (PDF)
Thesis (Ph. D.)--University of Texas at Austin, 2006. / Vita. Includes bibliographical references.
3

Low-cost Methods for Error Detection in Multi-core Systems

Meixner, Albert, January 2008 (has links)
Thesis (Ph. D.)--Duke University, 2008.
4

Failure recovery in redundant serial manipulators /

Cocca, Christopher David, January 2000 (has links)
Thesis (Ph. D.)--University of Texas at Austin, 2000. / Vita. Includes bibliographical references (leaves 214-223). Available also in a digital version from Dissertation Abstracts.
5

Fault tolerance control of complex dynamical systems

Clements, N. Scott 05 1900 (has links)
No description available.
6

Modeling and simulation of fault tolerant properties of quantum-dot cellular automata devices

Padgett, Benjamin David. January 2010 (has links)
I present a theoretical study of fault tolerant properties in Quantum-dot Cellular Automata (QCA) devices. The study consists of modeling and simulation of various possible manufacturing, fabrication and operational defects. My focus is to explore the effects of temperature and dot displacement defects at the cell level of various QCA devices. Results of simple devices such as binary wire, logical gates, inverter, cross-over and XOR will be presented. A Hubbard-type Hamiltonian and the inter-cellular Hartree approximation have been used for modeling the QCA devices. Random distribution has been used for defect simulations. In order to show the operational limit of a device, defect parameters have been defined and calculated. Results show fault tolerance of a device is strongly dependent on the temperature as well as on the manufacturing defects. / Cell design -- Basic logic gates -- The exclusive or gate. / Department of Physics and Astronomy
7

Designing orthogonal Gough-Stewart platforms with robust fault tolerance

Aphale, Sumeet S. January 2005 (has links)
Thesis (Ph. D.)--University of Wyoming, 2005. / Title from PDF title page (viewed on March 4, 2008). Includes bibliographical references (p. 95-102).
8

Fault tolerant N-DOF Gough-Stewart platforms kinematics, dynamics, and design /

Yi, Yong. January 2005 (has links)
Thesis (Ph. D.)--University of Wyoming, 2005. / Title from PDF title page (viewed on Nov. 2, 2007). Includes bibliographical references (p. 94-99).
9

Fault propagation timing analysis to aid in the selection of sensors for health management systems

Johnson, Jeremy Ryan, January 2008 (has links) (PDF)
Thesis (M.S.)--Missouri University of Science and Technology, 2008. / Vita. The entire thesis text is included in file. Title from title screen of thesis/dissertation PDF file (viewed May 19, 2008) Degree granted by Missouri University of Science and Technology, formerly known as University of Missouri--Rolla. Includes bibliographical references (p. 39-41).
10

Fault tolerant attitude sensing and force feedback control for unmanned aerial vehicles /

Jagadish, Chirag. Chang, Bor-Chin. January 2009 (has links)
Thesis (Ph.D.)--Drexel University, 2009. / Includes abstract and vita. Includes bibliographical references (leaves 81-84).

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