abstract: The long wavelength infrared region (LWIR) and mid wavelength infrared region (MWIR) are of great interest as detection in this region offers a wide range of real time applications. Optoelectronic devices operating in the LWIR and MWIR region offer potential applications such as; optical gas sensing, free-space optical communications, infrared counter-measures, biomedical and thermal imaging etc. HgCdTe is a prominent narrow bandgap material that operates in the LWIR region. The focus of this research work is to simulate and analyze the characteristics of a Hg1-xCdxTe photodetector. To achieve this, the tool `OPTODET' has been developed, where various device parameters can be varied and the resultant output can be analyzed. By the study of output characteristics in response to various changes in device parameters will allow users to understand the considerations that must be made in order to reach the optimum working point of an infrared detector. The tool which has been developed is a 1-D drift diffusion based simulator which solves the 1-D Poisson equation to determine potentials and utilizes the results of the 1-D electron and hole continuity equations to determine current. Parameters such as absorption co-efficient, quantum efficiency, dark current, noise, Transit time and detectivity can be simulated. All major recombination mechanisms such as SRH, Radiative and Auger recombination have been considered. Effects of band to band tunnelling have also been considered to correctly model the dark current characteristics. / Dissertation/Thesis / M.S. Electrical Engineering 2011

Les exigences liées aux photodétecteurs modernes font de la maîtrise du niveau de bruit un enjeu majeur pour les technologies de demain. Le Random Telegraph Signal (RTS), à l'origine de « pixels clignotants » en imagerie, gênants pour l'utilisateur comme pour les algorithmes de traitement et d'analyse du signal, fait partie des sources de bruit problématiques. Ce travail en fait l'étude dans les détecteurs infrarouge quantiques refroidis à base de HgCdTe. Le premier chapitre présentera des généralités sur la détection infrarouge, le fonctionnement des photodétecteurs quantiques, le matériau HgCdTe, et le bruit. On exposera ensuite les études réalisées sur le bruit RTS dans les imageurs pour différents domaines de l'infrarouge et trois technologies de fabrication de photodiodes. L'évolution des caractéristiques du bruit (amplitude et fréquence) en fonction de la température du détecteur, du flux de photons reçus, de la polarisation appliquée, ou encore du temps d'intégration seront également analysées. Le troisième chapitre sera consacré à l'origine du bruit RTS. Pour cela, différentes architectures d'étages d'entrée de circuit de lecture et de technologies de fabrication de photodiodes seront passées en revue. Enfin, le dernier chapitre exposera l'étude par Deep Level Transient Spectroscopy des défauts profonds électriquement actifs dans la bande interdite du HgCdTe pour le proche infrarouge (Short Wave InfraRed, à 2,5µm). / Infrared detectors are currently facing two major issues: high operating temperature (HOT) and size, weight, and power (SWaP) requirements. To maintain high performance at higher operating temperatures, pixels exhibiting extra noise such as 1/f noise or Random Telegraph Signal (RTS) noise must be limited. This work study the RTS noise in HgCdTe cooled infrared quantum detectors. The first part concerns generalities about the infrared detection, the physic of quantum photodetectors, the HgCdTe material and the noise. Then we present the studies made on RTS noise for different domains of the infrared spectra and for three technologies of photodiodes (Std, AOP and P/N). The evolution of the main features of RTS noise (frequency and amplitude) as a function of the focal plane array temperature, the flux of photons received, the integration time and the applied polarization will be analyzed. The third part is about the origin of the RTS noise. Two architectures of ReadOut Integrated Circuits (ROIC) and two technologies of photodiodes will be examined. Finally, the last part will present the study of electrically active defects in HgCdTe SWIR (2,5µm) made by Deep Level Transient Spectroscopy.

Ces travaux de thèse ont développé l’ensemble des problématiques de diffusion liées à la fabrication de la technologie HgCdTe p/n, avec pour objectif l’obtention d’un modèle numérique permettant la simulation complète de la diode. Nous avons étudié le phénomène d’interdiffusion Hg/Cd, indispensable au processus de passivation du photodétecteur. Dans un milieu monocristallin le coefficient d’interdiffusion est calculé par la loi de Darken qui fait intervenir le facteur thermodynamique, dont nous avons déterminé la variation en température. L’exodiffusion de l’indium, le dopant n, et sa diffusion dans le HgCdTe ont aussi été étudiées. L’arsenic est utilisé comme dopant p et est donc activé en conditions riche-Hg. Nous avons tout d’abord étudié sa diffusion, tout d’abord dans des conditions classiques, puis après son incorporation dans le HgCdTe en présence de défauts hors-équilibre. / This thesis work focuses on the modeling of the different diffusion phenomena that occur during the processing steps of the p/n HgCdTe technology. Hg/Cd interdiffusion is essential for the passivation of the HgCdTe and so was addressed. In a monocrystalline material, the interdiffusion coefficient is calculated with the Darken law. It includes the thermodynamic factor which temperature dependence was determined. Indium exodiffusion and diffusion in HgCdTe were also studied. Arsenic is used as a p dopant and so is activated in Hg-rich conditions. Its diffusion was studied firstly in classic conditions, and then after its incorporation in HgCdTe with the influence of out of equilibrium point defects.

Face à l’émergence de l’imagerie multi et hyperspectrale, il existe une demande croissante de connaissance fine de la réponse spectrale des détecteurs infrarouge. Dans ce travail de thèse, nous proposons une démarche de modélisation optique des réponses spectrales des plans focaux infrarouge HgCdTe. L’objectif est de mieux maîtriser les origines physiques des oscillations observées sur les réponses spectrales des pixels d’une matrice de détection, ainsi que des disparités de longueurs d’onde de coupure. Ces phénomènes étaient peu étudiés dans la littérature; pourtant, ils sont responsables en partie du bruit spatial fixe qui limite les performances des détecteurs. Nous proposons une description qui conserve l’interprétation physique des phénomènes observés (absorption, interférences,…), tout en permettant d’extraire les paramètres technologiques (responsables de ces non-uniformités) de la façon la plus indépendante possible. Le principe repose sur la décomposition du comportement global du détecteur, qui peut sembler complexe, en une multitude de briques élémentaires, simples à modéliser. L’étude a été appliquée au cas particulier d’un micro-spectromètre infrarouge intégré au plan de détection. Une analyse de sensibilité sur le modèle proposé a alors permis d’évaluer la précision nécessaire sur les paramètres technologique afin d’obtenir une bonne qualité de restitution de spectres. Cette démarche est généralisable à d’autres architectures de détecteurs et d’autres technologies de fabrication, à condition de maîtriser les propriétés optiques des matériaux mis en jeu. / Due to the emergence of multi and hyperspectral imaging, there is an increasing demand for the control of the spectral response of infrared detectors. In this thesis, we propose an optical modelling approach of the spectral response of HgCdTe focal plane arrays. The aim is to better identify the physical origins of the oscillations observed on the spectral responses of the pixels belonging to the same detector array, as well as the cutoff wavelength disparities. These phenomena were not studied in the literature; though, they are partly responsible for the fixed pattern noise that limits the performance of the detectors. We propose a description that takes account of the physical interpretation of the observed phenomena (absorption, interference…), while allowing the extraction of the technological parameters (that are responsible for such non-uniformities) in the most independent way possible. The principle is based on the decomposition of the global behaviour of the detector, which may seem complex, as a multitude of elementary phenomena, which are easy to model. The study was applied to the particular case of a micro-spectrometer integrated to an infrared detection array. A sensitivity analysis of the proposed model was then performed to deduce the necessary precision on the technological parameters to obtain good quality spectra restitution. This approach can be generalized to other architectures detectors and other manufacturing technologies, provided that the optical properties of the materials involved are well known.

L’infrarouge proche (1.5-2μm) ou SWIR (Short Wavelength Infrared) est une région particulièrement adaptée à la mesure de gaz à effet de serre par lidar à absorption différen- tielle (DIAL). En effet, (i) cet intervalle spectral contient des raies d’absorption intenses pour les principaux gaz à effet de serre (CO2, CH4, H2O, etc.) (ii) le taux d’extinction lors de la propagation du faisceau laser y est faible (iii) c’est une région spectrale dite en sécurité oculaire. Bien qu’abordée avec les moyens existants (détection hétérodyne), la mesure DIAL dans le SWIR a longtemps souffert de l’absence de photo-détecteurs ultra-sensibles. Les développements récents (années 2000) portant sur les photodiodes à avalanche (APD) HgCdTe ont changé la donne. En effet, ces dernières présentent de remarquables qualités d’amplification car elles allient trois propriétés fondamentales : un faible excès de bruit, un très faible courant d’obscurité et des gains importants. De telles propriétés sont essentielles pour les applications reposant sur la détection de très faibles signaux et en particulier le lidar.Dans cette thèse, nous analysons les performances d’un détecteur monopixel (200 μm) à base d’APD HgCdTe (conçu sur mesure par le CEA-LETI) dans le cadre de mesures expérimentales de la concentration de CO2 atmosphérique par lidar DIAL. L’émetteur laser est également un prototype, précédemment développé au Laboratoire de Météoro- logie Dynamique. Il produit alternativement des impulsions de 10 mJ à deux fréquences contrôlées dans la plage 2050-2054nm, le tout à une fréquence de répétition de 2kHz. Grâce à l’association de ces deux technologies de pointe nous avons pu effectuer les pre- mières mesures DIAL utilisant la technologie HgCdTe APD.Les expériences menées nous ont permis de confirmer le remarquable niveau de per- formances en sensibilité attendu (75 photons de bruit par temps caractéristique d’une bande passante de 20 MHz) et soulignent le potentiel futur d’un tel capteur pour toutes les applications faible flux dans le SWIR. Concernant les mesures DIAL, nous avons ob- tenu expérimentalement une précision relative de 10-20 % sur la concentration en CO2 pour une mesure dans la couche limite avec une résolution de 100 m - 4 s sur une portée de 1.5km. Par ailleurs, l’analyse fine de la réponse impulsionnelle de la photodiode à avalanche révèle une dégradation notable du long term settling time lorsqu’on la pola- rise. Ce phénomène contraint la plage d’utilisation du capteur, ce que nous discutons en tenant ce comportement du détecteur dans une simulation lidar. / The Short Wavelength Infrared (SWIR) region (1.5-2 μm) is well adapted for diffe- rential absorption lidar technique (DIAL) for several reasons : (i) it covers absorption bands with suitable intensity for the main greenhouse gases (CO2, CH4, H2O, etc.) (ii) the extinction due to particles is low (iii) it belongs to the eye safe domain. However, one main drawback has long been the lack of efficient photodetectors for such frequencies. A major enhancement occurred in the early 2000s when it was understood that HgCdTe avalanche photodiodes (APD) present close to unity excess noise factor on top of high gain and very low dark current. These features make this technology an almost ideal amplifier, especially useful for ultra low flux applications such as lidar.In this thesis, we analyze the performances of a custom large diameter (200μm) monopixel HgCdTe-APD based detector (designed at CEA-LETI) in the framework of atmospheric CO2 measurements with the DIAL technique. The laser emitter, a custom solid-state Ho :YLF laser developed at the Laboratoire de Météorologie Dynamique, is tunable in the 2050-2054nm range and produces 10 mJ pulses at a repetition rate of 2kHz. This emitter is associated to a detection chain adapted to the HgCdTe APD based detector to provide the first atmospheric DIAL measurements using the HgCdTe APD technology.Experiments confirmed the outstanding sensitivity of the detector (75 noise photons per characteristic time given a 20MHz bandwidth) and highlight the huge potential of this technology for any application relying on low light flux detection in SWIR. With the system previously mentioned, we reach an precision of 10-20 % on CO2 mixing ratio for a time-space resolution of 100 m and 4 s for measurements in the atmospheric boundary layer. Regarding the detector impulse response, we have shown evidence of a negative influence of reverse bias on the long term settling time of the APD. This phenomenon limits the dynamic range of useful signals and contraints the DIAL system. Thanks to numerical simulation taking into account this behaviour, we derive numerically expected biases on DIAL measurements.

Ce travail de thèse présente les caractéristiques optiques et électriques de dopants dans des couches de CdHgTe, CdZnTe et CdS. Ces 3 matériaux II-VI ont pour point commun d'être utilisés dans des dispositifs de détection, que ce soit la détection de lumière infrarouge pour les couches de CdHgTe et CdZnTe ou la détection visible comme c'est le cas pour le CdS. La caractérisation optique de ces couches de matériaux II-VI a été réalisée par la technique de photoluminescence et corrélée à des mesures électriques effectuées par effet Hall en température. Dans un premier temps, une étude du dopage intrinsèque par les lacunes de mercure et du dopage extrinsèque par incorporation d'arsenic de l'alliage CdHgTe, couche active des détecteurs IR a été réalisée. Pour cela, des mesures optiques par photoluminescence (sur un banc mis en place au laboratoire pendant la 1ere année de thèse permettant de travailler depuis les basses températures jusqu'à l'ambiante entre 1µm et 12 µm dans l'IR) sur des couches de CdHgTe réalisées par épitaxie en phase liquide (EPL) de différentes compositions en Cd ont été effectuées. La corrélation de ces mesures optiques avec des mesures électriques par effet Hall en température a permis d'identifier les énergies d'activation des 2 niveaux de la lacune de mercure ainsi que de démontrer le phénomène de U-négativité de la lacune de mercure dans le CdHgTe. De plus, la comparaison de spectres de PL d'échantillons dopés arsenic pendant la croissance par épitaxie par jets moléculaires (EJM) avec des mesures disponibles réalisées par absorption de rayons X (EXAFS) a permis d'observer des transitions optiques associées aux différents complexes arsenic formés avant et après le recuit d'activation. Par ailleurs, un travail de modélisation du phénomène de désordre d'alliage dans le CdHgTe a été réalisé. Plus précisément, un modèle basé sur une statistique gaussienne associée aux fluctuations d'alliage autour d'un gap moyen et une statistique de Boltzman a été développé pour ajuster dans un premier temps des spectres d'absorption puis pour ajuster les spectres de photoluminescence. Ce modèle nous a permis d'ajuster étroitement les spectres de photoluminescence et d'absorption, tout en prenant en compte intrinsèquement le désordre d'alliage du matériau. Nous avons ainsi constaté que l'ajustement des spectres par des fonctions gaussiennes comme il est réalisé communément dans la littérature permet de trouver les bons écarts entre les pics d'émission et donc les bonnes énergies d'ionisation.. Dans un deuxième temps, toujours dans le cas de la détection infrarouge, le travail a porté sur l'étude du substrat CdZnTe utilisé pour l'épitaxie du CdHgTe. Des comparaisons des spectres de PL avec les paramètres de croissance ont été effectuées. Plus particulièrement, une étude sur une zone spécifique de certains échantillons présentant une absorption du rayonnement IR a été réalisée afin d'en comprendre l'origine. Enfin, nous nous sommes intéressés à la couche de CdS, matériau II-VI dopé intrinsèquement (type n) utilisé comme fenêtre transparente et formant la jonction p-n avec le CdTe dans les cellules solaires, détecteurs de lumière visible. Dans cette partie, nous avons chercher à étudier l'influence des différentes méthodes de dépôts, sublimation ou bain chimique de la couche de CdS sur un substrat de verre, en comparant les spectres d'émission de photoluminescence obtenus ainsi que les types de traitements thermiques effectués après dépôts. Ces mesures ont été corrélées avec le rendement des cellules solaires finales.

[Truncated abstract] Infrared radiation detectors find application in a wide range of military and civilian applications: for example, target identification, astronomy, atmospheric sensing and medical imaging. The greatest sensitivity, response speed, and wavelength range is offered by infrared detectors based on HgCdTe semiconductor material, the growth and characterisation of which is the subject of this thesis. Molecular Beam Epitaxy (MBE) is a versatile method of depositing layers of semiconductor material on a suitable crystalline substrate. In particular, MBE facilitates the growth of multilayer structures, thus allowing bandgap engineered devices to be realised. By modulating the bandgap within the device structure it is possible to improve the sensitivity or increase the operating temperature of photodetectors when compared to devices fabricated on single layer material. Furthermore, dual-band detectors may be fabricated using multi-layered HgCdTe material. The bulk of this thesis is concerned with the development of the MBE process for multilayer growth, from modelling of the growth process to characterisation of the material produced, and measurement of photoconductive devices fabricated on these wafers. In this thesis a previously published model of HgCdTe growth by MBE is reviewed in detail, and is applied to the growth of double layer heterostructures in order to determine the optimum method of changing the mole fraction between layers. The model has been used to predict the change in the temperature of the phase limit when the mole fraction and growth rate change suddenly as is the case during growth of an abrupt heterostructure. Two options for growth of an abrupt heterostructure were examined (a) modulating the CdTe flux and (b) modulating the Te flux. The change in the phase limit temperature between the layers was calculated as being 4:1±C for option (a) and 5:2±C for option (b) when growing a Hg(0:7)Cd(0:3)Te/Hg(0:56)Cd(0:44)Te heterostructure

abstract: HgCdTe is the dominant material currently in use for infrared (IR) focal-plane-array (FPA) technology. In this dissertation, transmission electron microscopy (TEM) was used for the characterization of epitaxial HgCdTe epilayers and HgCdTe-based devices. The microstructure of CdTe surface passivation layers deposited either by hot-wall epitaxy (HWE) or molecular beam epitaxy (MBE) on HgCdTe heterostructures was evaluated. The as-deposited CdTe passivation layers were polycrystalline and columnar. The CdTe grains were larger and more irregular when deposited by HWE, whereas those deposited by MBE were generally well-textured with mostly vertical grain boundaries. Observations and measurements using several TEM techniques showed that the CdTe/HgCdTe interface became considerably more abrupt after annealing, and the crystallinity of the CdTe layer was also improved. The microstructure and compositional profiles of CdTe(211)B/ZnTe/Si(211) heterostructures grown by MBE was investigated. Many inclined {111}-type stacking faults were present throughout the thin ZnTe layer, terminating near the point of initiation of CdTe growth. A rotation angle of about 3.5° was observed between lattice planes of the Si substrate and the final CdTe epilayer. Lattice parameter measurement and elemental profiles indicated that some local intermixing of Zn and Cd had taken place. The average widths of the ZnTe layer and the (Cd, Zn)Te transition region were found to be roughly 6.5 nm and 3.5 nm, respectively. Initial observations of CdTe(211)B/GaAs(211) heterostructures indicated much reduced defect densities near the vicinity of the substrate and within the CdTe epilayers. HgCdTe epilayers grown on CdTe(211)B/GaAs(211) composite substrate were generally of high quality, despite the presence of precipitates at the HgCdTe/CdTe interface. The microstructure of HgCdSe thin films grown by MBE on ZnTe/Si(112) and GaSb(112) substrates were investigated. The quality of the HgCdSe growth was dependent on the growth temperature and materials flux, independent of the substrate. The materials grown at 100°C were generally of high quality, while those grown at 140°C had {111}-type stacking defects and high dislocation densities. For epitaxial growth of HgCdSe on GaSb substrates, better preparation of the GaSb buffer layer will be essential in order to ensure that high-quality HgCdSe can be grown. / Dissertation/Thesis / Ph.D. Materials Science and Engineering 2011

abstract: HgCdTe is currently the dominant material for infrared sensing and imaging, and is usually grown on lattice-matched bulk CdZnTe (CZT) substrates. There have been significant recent efforts to identify alternative substrates to CZT as well as alternative detector materials to HgCdTe. In this dissertation research, a wide range of transmission electron microscopy (TEM) imaging and analytical techniques was used in the characterization of epitaxial HgCdTe and related materials and substrates for third generation IR detectors. ZnTe layers grown on Si substrates are considered to be promising candidates for lattice-matched, large-area, and low-cost composite substrates for deposition of II-VI and III-V compound semiconductors with lattice constants near 6.1 Å. After optimizing MBE growth conditions including substrate pretreatment prior to film growth, as well as nucleation and growth temperatures, thick ZnTe/Si films with high crystallinity, low defect density, and excellent surface morphology were achieved. Changes in the Zn/Te flux ratio used during growth were also investigated. Small-probe microanalysis confirmed that a small amount of As was present at the ZnTe/Si interface. A microstructural study of HgCdTe/CdTe/GaAs (211)B and CdTe/GaAs (211)B heterostructures grown using MBE was carried out. High quality MBE-grown CdTe on GaAs(211)B substrates was demonstrated to be a viable composite substrate platform for HgCdTe growth. In addition, analysis of interfacial misfit dislocations and residual strain showed that the CdTe/GaAs interface was fully relaxed. In the case of HgCdTe/CdTe/ GaAs(211)B, thin HgTe buffer layers between HgCdTe and CdTe were also investigated for improving the HgCdTe crystal quality. A set of ZnTe layers epitaxially grown on GaSb(211)B substrates using MBE was studied using high resolution X-ray diffraction (HRXRD) measurements and TEM characterization in order to investigate conditions for defect-free growth. HRXRD results gave critical thickness estimates between 350 nm and 375 nm, in good agreement with theoretical predictions. Moreover, TEM results confirmed that ZnTe layers with thicknesses of 350 nm had highly coherent interfaces and very low dislocation densities, unlike samples with the thicker ZnTe layers. / Dissertation/Thesis / Ph.D. Materials Science and Engineering 2012

In this work, we have designed, simulated, fabricated and characterized homojunction Hg1-xCdxTe detector for high operating temperature in the MWIR region. The IR photon detectors need cryogenic cooling to suppress thermal generation. The temperature of operation in narrow gap semiconductor devices is limited by the noise due to statistical nature of thermal generation-recombination in narrow gap semiconductors. To make IR systems affordable they have to be operated without cooling or with minimal cooling compatible with low cost, low power and long life. Several fundamental and technological limitations to uncooled operation of photon detectors have been discussed in Chapter-1 of this thesis. Way and means adopted to increase the operating temperature, such as non-equilibrium operation, use of multilayer stacked hetero¬structures, optical immersion etc. have also been discussed. Key to improving the detector performance at any temperature is reduction of dark currents to level below the photocurrent and ultimately to the level where detector noise is determined by the fluctuations in photon flux from the scene (BLIP limit). In addition, design of present generation uncooled Hg1-xCdxTe infrared photon detectors relies on complex hetero-structures with a basic unit cell of type n+/π/p+. Theoretical modeling and numerical simulations on TLHJ device consisting of backside illuminated n+/π/p+ photodiodes have been performed. A numerical model for solving carrier transport equations for Hg1-xCdxTe infrared photodiodes was developed in MATLAB. Finite difference discretization of carrier transport equations and successive over relaxation method have been adopted. Numerical models are more appropriate than analytical models when analyzing multi-layer hetero-structures because we can account for realistic doping profiles, compositional grading and hetero-structures using this model. The model can be suitably modified to accommodate different device architectures, designs, material properties and operating temperature. Such a generalized model is useful to a device designer to customize the detector performance as per the availability of the material to suit the application specific requirements. The present work therefore proposes a more flexible, accurate and generalized methodology to accommodate the user needs by simulating the position dependence of carrier concentration, electrostatic potential and g-r rates and their effect on detector performance vis-à¬vis contact doping, absorber doping and absorber width on device performance. We detail aspects of our simulation model by developing a library of Hg1-xCdxTe properties using analytical and empirical expressions for material parameters (energy band gap, electron affinity, intrinsic carrier concentration, carrier effective mass, carrier mobility, dielectric constant and absorption coefficient). The PDEs were solved using the FDM coupled with SOR method. Behavior of Hg1-xCdxTe diodes (homo/hetero-junction) under different biasing, illumination and non equilibrium situations were modeled. Model has been validated for experimental measured data on n on p Hg1-xCdxTe photodiodes. The numerical computations are next applied to simulation/modeling of MWIR (λc=4.5 μm) n+/π/p+ TLHJ device for operation at T=250K. Several recombination processes occur in Hg1¬-xCdxTe depending on material quality, operating temperature, device design and processing conditions. Detailed mathematical models of radiative, Auger, Shockley Read Hall (SRH), surface recombination and optical g-r are analyzed and their effect on carrier lifetime have been evaluated. Analytical models for dark currents affecting the performance of Hg1-xCdxTe diodes at different temperatures are discussed. The mechanisms contributing to dark current are: (i) the thermal diffusion of minority carriers from the neutral regions (IDiff); (ii) generation-recombination from the space charge region of diode (IG-R) (iii) trap assisted tunneling currents, wherein the traps in the depletion region or the traps in the quasi neutral p region close to the depletion edge participate in the tunneling process(ITAT); (iii) band-to-band tunneling currents (IBTB) and (iv) surface leakage currents due to shunt resistance. Total current of a photodiode is ITOT=IDiff+IG-R+ITAT+IBTB+ISH-IP, where IP is the photocurrent. We evaluate the variation of electrostatic potential, carrier concentration, and electric field and g-r profiles as a function of position. The effect of variation in absorber width, doping and contact doping on D* is also analyzed. The mathematical models of different g-r processes (Auger, SRH, radiative, surface recombination and optical generation) affecting the device performance analyzed and their affect on carrier lifetimes are investigated. Responsivity ~3.25Amp-Watt-1, noise current~2pA/Hz1/2 and D* ~8x109 cmHz1/2watt-1 at 0.1V reverse bias have been calculated using optimized values of doping concentration, absorber width and carrier lifetime. The suitability of the method has been illustrated by demonstrating the feasibility of achieving the optimum device performance by carefully selecting the device design and other parameters. The numerical models provided insight about the operation and performance of Hg1-xCdxTe Auger-suppressed infrared photodiodes. Hetero-junction configuration increases the dynamic resistance, while the heavily doped contacts reduce the contact resistance. Wide gap/heavily doped contacts present a barrier to injection of minority carries into the absorber layer. At the same time they allow collection of minority carriers generated in the absorber region at the contacts. Hg1-xCdxTe hetero-diodes are grown by MOCVD and MBE with precise doping and compositional gradient control to reduce g-r contributions from defects and dislocations to the dark current in order to reap advantages of Auger suppression. Measured dark currents in hetero-junction photodiodes continue to be larger than expected in spite of the advancements in MBE technique. Delineation of an array on hetero-structures involves mesa separation of the diodes thus creating additional surface requiring passivation. Overall, the whole effort of fabricating a hetero Hg1-xCdxTe detector array is disproportionate to the overall gain in the performance. Therefore, we employ a much simpler fabrication process of homo-junction Hg1-xCdxTe detectors. It involves a planar device fabrication approach thus minimizing the surface passivation problem. We have deliberated upon the specific growth, characterization techniques and processing steps employed in our study. We discuss some of the experimental issues. We also presented results on the novel processing techniques developed that are potentially applicable to HOT technology and Hg1-xCdxTe technology in general. Hg1-xCdxTe (x=0.27-0.31) layer of ~ 15×15mm2 area and 15-20µm thickness is grown on CdZnTe substrate by Liquid Phase Epitaxy (LPE) in-house. As grown wafer is vacancy doped p-type with a carrier concentration of ~5×1015-1x1016 cm-3 and hole mobility of ~400cm2V-1s-1@80K. Planar n+/ν/p junction ~2-3µm deep is formed by B+ ion implantation and subsequent annealing; details are outlined in Chapter-4. Hall measurements and differential Hall measurements were used to find the carrier concentration, carrier mobility, resistivity of the wafer. The diodes are formed in the form of a 2D array along with various PEV’s for process characterization. Composition of Hg1-xCdxTe wafers used for the work is in the range of 0.27¬ 0.31 as determined by FTIR, corresponding to cutoff wavelength of 4.5-6.5µm. Junction depth and doping profile of the diodes after ion implantation was characterized by differential Hall technique. Transient minority carrier lifetime in fabricated MWIR n+/ν/p Hg1-xCdxTe (x=0.27) diodes were characterized using diode reverse-recovery technique. We prefer this method because it is a direct indicator of device as well as material quality post processing. By this time the device has undergone all the chemical/mechanical treatments and the measured lifetime is the cumulative of g-r mechanisms operative in bulk, space charge region and surface of diode. The value of lifetime extracted from the measured data lies in the range of 80-160ns. Variable temperature lifetime data was also extracted to determine the prevalent g-r process operative in the device. Diode dark I-V and junction C-V measurements were also made to correlate the observed behavior of the measured lifetime with g-r processes. Evidence of Auger suppression at room temperature is seen in the dark I-V characteristics via observation of negative differential resistance in the homo-junction Hg1-xCdxTe diodes. The experimental data is fitted using the numerical and analytical models developed. Based on this fitting, the current mechanisms limiting the dark current in these photodiodes are extracted. An improved analytical I-V model is reported by incorporating TAT and electric field enhanced Shockley-Read-Hall generation recombination process due to dislocations. Tunneling currents are fitted before and after the Auger suppression of carriers with energy level of trap (Et), trap density (Nt) and the doping concentrations of n+ and νregions as fitting parameters. Values of Et and Nt were determined as 0.78-0.80Eg and ~7-9×1014 cm-3 respectively in all cases. Doping concentration of νregion was found to exhibit non-equilibrium depletion from a value of 2×1016 to 4×1015 cm-3. Quantum efficiency of the diodes was found to ~25-30%. Note, that these are wafer level measurements on unpackaged device without backside AR coating. In addition to junction diodes, we present results on several PEV's such as VADA, MIS/MIM capacitors and TLM structures both at room and low temperature. Variable temperature measurements for a VADA tile and subsequent analysis provide evidence of g-r processes originating from defects, dislocations and dislocation loops, which are non-uniformly distributed across the Hg1-xCdxTe wafer and contributes to TAT current at high temperatures. MIS analysis yielded surface charge density lying between 3×1010-1×1011 cm-2 for ZnS/CdTe surface corresponding to a near flat band condition. Results of low and variable temperature measurements on the devices have also been shown to correlate it with the possibility of operating the device at mid temperatures such as 180-250K.