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This thesis addresses the problem of backtracking strategies in test generation. First, a methodology which uses status of absolute dominators as a means for causing backtracking during the test generation process is presented. Then, different heuristics that force the test generation to execute the backtracking procedure are investigated. Experiments which generated test patterns for over 30,000 faults have been used to evaluate these heuristics. According to the experimental results, we recommend a new backtracking strategy that has the best performance among the six strategies explored in this thesis.

Yuan, Feng. / Thesis (M.Phil.)--Chinese University of Hong Kong, 2009. / Includes bibliographical references (leaves 60-65). / Abstract also in Chinese. / Abstract --- p.i / Acknowledgement --- p.ii / Chapter 1 --- Introduction --- p.1 / Chapter 1.1 --- Manufacturing Test --- p.1 / Chapter 1.1.1 --- Functional Testing vs. Structural Testing --- p.2 / Chapter 1.1.2 --- Fault Model --- p.3 / Chapter 1.1.3 --- Automatic Test Pattern Generation --- p.4 / Chapter 1.1.4 --- Design for Testability --- p.6 / Chapter 1.2 --- Pseudo-Functional Manufacturing Test --- p.13 / Chapter 1.3 --- Thesis Motivation and Organization --- p.16 / Chapter 2 --- On Systematic Illegal State Identification --- p.19 / Chapter 2.1 --- Introduction --- p.19 / Chapter 2.2 --- Preliminaries and Motivation --- p.20 / Chapter 2.3 --- What is the Root Cause of Illegal States? --- p.22 / Chapter 2.4 --- Illegal State Identification Flow --- p.26 / Chapter 2.5 --- Justification Scheme Construction --- p.30 / Chapter 2.6 --- Experimental Results --- p.34 / Chapter 2.7 --- Conclusion --- p.35 / Chapter 3 --- Compression-Aware Pseudo-Functional Testing --- p.36 / Chapter 3.1 --- Introduction --- p.36 / Chapter 3.2 --- Motivation --- p.38 / Chapter 3.3 --- Proposed Methodology --- p.40 / Chapter 3.4 --- Pattern Generation in Compression-Aware Pseudo-Functional Testing --- p.42 / Chapter 3.4.1 --- Circuit Pre-Processing --- p.42 / Chapter 3.4.2 --- Pseudo-Functional Random Pattern Generation with Multi-Launch Cycles --- p.43 / Chapter 3.4.3 --- Compressible Test Pattern Generation for Pseudo-Functional Testing --- p.45 / Chapter 3.5 --- Experimental Results --- p.52 / Chapter 3.5.1 --- Experimental Setup --- p.52 / Chapter 3.5.2 --- Results and Discussion --- p.54 / Chapter 3.6 --- Conclusion --- p.56 / Chapter 4 --- Conclusion and Future Work --- p.58 / Bibliography --- p.65

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published_or_final_version / abstract / Electrical and Electronic Engineering / Master / Master of Philosophy

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