A indústria de microeletrônica tem recorrido cada vez mais à metodologia de projeto baseado em células para fazer frente à crescente complexidade dos projetos de circuitos integrados digitais, uma vez que circuitos baseados em células são projetados mais rápida e economicamente que circuitos full-custom. Entretanto, apesar do progresso ocorrido na área de Electronic Design Automation, circuitos digitais baseados em células apresentam desempenho inferior ao de circuitos full-custom. Assim, torna-se interessante encontrar maneiras de se fazer com que circuitos baseados em células tenham desempenho próximo ao de circuitos full-custom, sem que isso implique elevação significativa nos custos do projeto. Com tal objetivo em vista, esta tese apresenta contribuições para um fluxo automático de otimização local para circuitos digitais baseados em células. Por otimização local se entende a otimização do circuito em pequenas janelas de contexto, onde são feitas otimizações considerando o contexto global. Deste modo, a otimização local pode incluir a detecção e isolamento de regiões críticas do circuito e a geração de redes lógicas e de redes de transistores de diferentes topologias que são dimensionadas de acordo com as restrições de projeto em questão. Como as otimizações locais atuam em um contexto reduzido, várias soluções podem ser obtidas considerando as restrições locais, entre as quais se escolhe a mais adequada para substituir o subcircuito (região crítica) original. A contribuição específica desta tese é o desenvolvimento de um método de dimensionamento de subcircuitos capaz de obter soluções com área ativa mínima, respeitando a capacitância máxima de entrada, a carga a ser acionada, e a restrição de atraso imposta. O método é baseado em uma formulação de logical effort, e a principal contribuição é calcular analiticamente a derivada da área para obter área mínima, ao invés de fazer a derivada do atraso para obter o atraso mínimo, como é feito na formulação tradicional do logical effort. Simulações elétricas mostram que o modelo proposto é muito preciso para uma abordagem de primeira ordem, uma vez que apresenta erros médios de 1,48% para dissipação de potência, 2,28% para atraso de propagação e 6,5% para os tamanhos dos transistores. / Microelectronics industry has been relying more and more upon cell-based design methodology to face the growing complexity in the design of digital integrated circuits, since cell-based integrated circuits are designed in a faster and cheaper way than fullcustom circuits. Nevertheless, in spite of the advancements in the field of Electronic Design Automation, cell-based digital integrated circuits show inferior performance when compared with full-custom circuits. Therefore, it is desirable to find ways to bring the performance of cell-based circuits closer to that of full-custom circuits without compromising the design costs of the former circuits. Bearing this goal in mind, this thesis presents contributions towards an automatic flow of local optimization for cellbased digital circuits. By local optimization, it is meant circuit optimization within small context windows, in which optimizations are done taking into account the global context. This way, local optimization may include the detection and isolation of critical regions of the circuit and the generation of logic and transistor networks; these networks are sized according to the existing design constraints. Since local optimizations act in a reduced context, several solutions may be obtained considering local constraints, out of which the fittest solution is chosen to replace the original subcircuit (critical region). The specific contribution of this thesis is the development of a subcircuit sizing method capable of obtaining minimum active area solutions, taking into account the maximum input capacitance, the output load to be driven, and the imposed delay constraint. The method is based on the logical effort formulation, and the main contribution is to compute the area derivative to obtain minimum area, instead of making the delay derivative to obtain minimum delay, as it is done in the traditional logical effort formulation. Electrical simulations show that the proposed method is very precise for a first order approach, as it presents average errors of 1.48% in power dissipation, 2.28% in propagation delay, and 6.5% in transistor sizes.

<p>This thesis investigates four D flip-flops with data transmission look-ahead circuits. Based on logical effort and power-delay products to resize all the transistor widths along the critical path in µm CMOS technology. The main goal is to verify and proof this kind of circuits can be used when the input data have low switching probabilities. From comparing the average energy consumption between the normal D flip-flops and D flip-flops with look-ahead circuits, D flip-flops with look-ahead circuits consume less power when the data switching activities are low.</p>

This thesis investigates four D flip-flops with data transmission look-ahead circuits. Based on logical effort and power-delay products to resize all the transistor widths along the critical path in µm CMOS technology. The main goal is to verify and proof this kind of circuits can be used when the input data have low switching probabilities. From comparing the average energy consumption between the normal D flip-flops and D flip-flops with look-ahead circuits, D flip-flops with look-ahead circuits consume less power when the data switching activities are low.

Circuit designers perform optimization procedures targeting speed and power during the design of a circuit. Gate sizing can be applied to optimize for speed, while Dual-VT and Dynamic Voltage Scaling (DVS) can be applied to optimize for leakage and dynamic power, respectively. Both gate sizing and Dual-VT are design-time techniques, which are applied to the circuit at a fixed voltage. On the other hand, DVS is a run-time technique and implies that the circuit will be operating at a different voltage than that used during the optimization phase at design-time. After some analysis, the risk of non-critical paths becoming critical paths at run-time is detected under these circumstances. The following questions arise: 1) should we take DVS into account during the optimization phase? 2) Does DVS impose any restrictions while performing design-time circuit optimizations?. This thesis is a case study of applying DVS to a circuit that has been optimized for speed and power, and aims at answering the previous two questions. We used a 45-nm CMOS design kit and flow. Synthesis, placement and routing, and timing analysis were applied to the benchmark circuit ISCAS?85 c432. Logical Effort and Dual-VT algorithms were implemented and applied to the circuit to optimize for speed and leakage power, respectively. Optimizations were run for the circuit operating at different voltages. Finally, the impact of DVS on circuit optimization was studied based on HSPICE simulations sweeping the supply voltage for each optimization. The results showed that DVS had no impact on gate sizing optimizations, but it did on Dual-VT optimizations. It is shown that we should not optimize at an arbitrary voltage. Moreover, simulations showed that Dual-VT optimizations should be performed at the lowest voltage that DVS is intended to operate, otherwise non-critical paths will become critical paths at run-time.

The primary metrics associated with a logic gate's performance are speed, power, and area. We define a gate as a specific CMOS transistor level implementation of a particu- lar boolean function in a specific fabrication technology at a constant rail voltage, constant length, and where the ratio of any two transistor widths are constant. Asking how fast a gate switches then is highly situational; it changes with load capacitance, choice of inputs, input slew rate, and the size of the gate. Predicting how much energy the gate consumes depends on the time frame, how many times the gate has switched in this time frame, input selection, input slew rate, load capacitance, and gate width. Logical Effort (LE) predicts gate delay with a simple linear equation: d = t(gh+p). Where g and p are gate and input dependent parameters independent of load size and gate size, and h is the ratio of output ca- pacitance to input capacitance (directly related to gate width), and t is a process dependent conversion factor. The product, gh, then is the delay associated with driving a subsequent gate, and p is the delay of the gate driving itself. The prediction ignores input slew rate and the linear dependence fails for very large values of h, but for input slew rates on the same order as the output slew rate, and for reasonable fan-outs, LE provides remarkably accurate predictions of gate switching time. The methodology goes on to solve for the widths nec- essary for each gate in an arbitrary logic path to minimize delay. Designs can quickly be compared, analyzed and optimized. By breaking down delay into components, one is able to intuitively choose better logic implementations, if parasitic delay is dominating, often a better implementation is one with smaller fan-in gates and less logic depth, if effort delay is dominating then then higher logic depth can lead to faster results. What the method does not do is predict the power consumption ramifications of all of these choices. What about minimizing power on non-critical paths, for instance? To our knowledge, no methodology exists to predict power consumption in a similar fashion. We propose a power prediction methodology, Logical Power (LP), compatible with LE that breaks down power consumption into dynamic, static, and short-circuit com- ponents with linear equations dependent on h. This would allow a compact and efficient way to characterize a gate that scales with its environment, as well as to allow designers optimizing with LE to consider not only the speed ramifications of individual gate sizings but power as well. For instance given a target path delay higher than the theoretical mini- mum predicted by LE, sizings could be chosen with LE and LP that minimize power that still result in meeting the target delay. The other major contribution of this work is a new short-circuit power measurement technique for simulation that more accurately distinguishes between short-circuit and the parasitic portions of dynamic power in total active power dissipation than all known tech- niques.

Column Reduction Multiplier techniques provide the fastest multiplier designs and involve three steps. First, a partial product array of terms is formed by logically ANDing each bit of the multiplier with each bit of the multiplicand. Second, adders or counters are used to reduce the number of terms in each bit column to a final two. This activity is commonly described as column reduction and occurs in multiple stages. Finally, some form of carry propagate adder (CPA) is applied to the final two terms in order to sum them to produce the final product of the multiplication. Since forming the partial products, in the first step, is simply forming an array of the logical AND's of two bits, there is little opportunity for delay improvement for the first step. There has been much work done in optimizing the reduction stages for column multipliers in the second reduction step. All of the reduction approaches of the second step result in non-uniform arrival times to the input of the final carry propagate adder in the final step. The designs for carry propagate adders have been done assuming that the input bits all have the same arrival time. It is not evident that the non-uniform arrival times from the columns impacts the performance of the multiplier. A thorough analysis of the several column reduction methods and the impact of carry propagate adder designs, along with the column reduction design step, to provide the fastest possible final results, for an array of multiplier widths has not been undertaken. This dissertation investigates the design impact of three carry propagate adders, with different performance attributes, on the final delay results for four column reduction multipliers and suggests general ways to optimize the total delay for the multipliers. / text

This dissertation presents a new systematic approach to flip-flop design using Internal Clock Gating, (ICG), and Adaptive Body-Bias, (ABB), in order to reduce power consumption. The process requires careful transistor resizing in order to maintain signal integrity and the functionality of the flip-flop at the target frequency.A novel flip-flop architecture, based on the Transmission Gate Flip-Flop, (TGFF), which incorporated ICG and ABB techniques, was designed. This architecture was simulated intensively in order to determine under what conditions its use is appropriate. In addition, it was necessary to establish a methodology for creating a standard testbench and environment setup for the required Hspice simulations. Software tools were written in C++ and Perl in order to facilitate the interface between Cadence Design Tools and Hspice.The new flip-flop, which was named the Low-Power Flip-Flop, (LPFF), was compared to the Transmission-Gate Flip-Flop, (TGFF), and to the Transmission-Gate with Clock-Gating Flip-Flop, (TGCGFF). Comprehensive Hspice simulations of the three flip-flop designs, implemented with Bsim3v3 transistor models for TSMC 180 nm technology, were used as the means of comparison.Simulations demonstrated that the new flip-flop is appropriate for applications that require low switching activity. In such a situation the LPFF consumes 7.8% to 95.7% less power than the TGFF and 0.8% to 23.7% less power than the TGCGFF. Power savings obtained by the LPFF increase as the length of the period with no switching activity increases, especially when the input data is all zeros. The trade-off is an increase in the D-to-Q delays and in the flip-flop area. The LPFF presented D-to-Q delays of 60% to 69% longer than the delays of the TGFF and 9% to 11% longer than the delays of the TGCGFF. The LPFF cells require an area that is 15% to 34% larger than the TGFF cells and 6% to 17% larger than the TGCGFF cells.

A indústria de microeletrônica tem recorrido cada vez mais à metodologia de projeto baseado em células para fazer frente à crescente complexidade dos projetos de circuitos integrados digitais, uma vez que circuitos baseados em células são projetados mais rápida e economicamente que circuitos full-custom. Entretanto, apesar do progresso ocorrido na área de Electronic Design Automation, circuitos digitais baseados em células apresentam desempenho inferior ao de circuitos full-custom. Assim, torna-se interessante encontrar maneiras de se fazer com que circuitos baseados em células tenham desempenho próximo ao de circuitos full-custom, sem que isso implique elevação significativa nos custos do projeto. Com tal objetivo em vista, esta tese apresenta contribuições para um fluxo automático de otimização local para circuitos digitais baseados em células. Por otimização local se entende a otimização do circuito em pequenas janelas de contexto, onde são feitas otimizações considerando o contexto global. Deste modo, a otimização local pode incluir a detecção e isolamento de regiões críticas do circuito e a geração de redes lógicas e de redes de transistores de diferentes topologias que são dimensionadas de acordo com as restrições de projeto em questão. Como as otimizações locais atuam em um contexto reduzido, várias soluções podem ser obtidas considerando as restrições locais, entre as quais se escolhe a mais adequada para substituir o subcircuito (região crítica) original. A contribuição específica desta tese é o desenvolvimento de um método de dimensionamento de subcircuitos capaz de obter soluções com área ativa mínima, respeitando a capacitância máxima de entrada, a carga a ser acionada, e a restrição de atraso imposta. O método é baseado em uma formulação de logical effort, e a principal contribuição é calcular analiticamente a derivada da área para obter área mínima, ao invés de fazer a derivada do atraso para obter o atraso mínimo, como é feito na formulação tradicional do logical effort. Simulações elétricas mostram que o modelo proposto é muito preciso para uma abordagem de primeira ordem, uma vez que apresenta erros médios de 1,48% para dissipação de potência, 2,28% para atraso de propagação e 6,5% para os tamanhos dos transistores. / Microelectronics industry has been relying more and more upon cell-based design methodology to face the growing complexity in the design of digital integrated circuits, since cell-based integrated circuits are designed in a faster and cheaper way than fullcustom circuits. Nevertheless, in spite of the advancements in the field of Electronic Design Automation, cell-based digital integrated circuits show inferior performance when compared with full-custom circuits. Therefore, it is desirable to find ways to bring the performance of cell-based circuits closer to that of full-custom circuits without compromising the design costs of the former circuits. Bearing this goal in mind, this thesis presents contributions towards an automatic flow of local optimization for cellbased digital circuits. By local optimization, it is meant circuit optimization within small context windows, in which optimizations are done taking into account the global context. This way, local optimization may include the detection and isolation of critical regions of the circuit and the generation of logic and transistor networks; these networks are sized according to the existing design constraints. Since local optimizations act in a reduced context, several solutions may be obtained considering local constraints, out of which the fittest solution is chosen to replace the original subcircuit (critical region). The specific contribution of this thesis is the development of a subcircuit sizing method capable of obtaining minimum active area solutions, taking into account the maximum input capacitance, the output load to be driven, and the imposed delay constraint. The method is based on the logical effort formulation, and the main contribution is to compute the area derivative to obtain minimum area, instead of making the delay derivative to obtain minimum delay, as it is done in the traditional logical effort formulation. Electrical simulations show that the proposed method is very precise for a first order approach, as it presents average errors of 1.48% in power dissipation, 2.28% in propagation delay, and 6.5% in transistor sizes.

A indústria de microeletrônica tem recorrido cada vez mais à metodologia de projeto baseado em células para fazer frente à crescente complexidade dos projetos de circuitos integrados digitais, uma vez que circuitos baseados em células são projetados mais rápida e economicamente que circuitos full-custom. Entretanto, apesar do progresso ocorrido na área de Electronic Design Automation, circuitos digitais baseados em células apresentam desempenho inferior ao de circuitos full-custom. Assim, torna-se interessante encontrar maneiras de se fazer com que circuitos baseados em células tenham desempenho próximo ao de circuitos full-custom, sem que isso implique elevação significativa nos custos do projeto. Com tal objetivo em vista, esta tese apresenta contribuições para um fluxo automático de otimização local para circuitos digitais baseados em células. Por otimização local se entende a otimização do circuito em pequenas janelas de contexto, onde são feitas otimizações considerando o contexto global. Deste modo, a otimização local pode incluir a detecção e isolamento de regiões críticas do circuito e a geração de redes lógicas e de redes de transistores de diferentes topologias que são dimensionadas de acordo com as restrições de projeto em questão. Como as otimizações locais atuam em um contexto reduzido, várias soluções podem ser obtidas considerando as restrições locais, entre as quais se escolhe a mais adequada para substituir o subcircuito (região crítica) original. A contribuição específica desta tese é o desenvolvimento de um método de dimensionamento de subcircuitos capaz de obter soluções com área ativa mínima, respeitando a capacitância máxima de entrada, a carga a ser acionada, e a restrição de atraso imposta. O método é baseado em uma formulação de logical effort, e a principal contribuição é calcular analiticamente a derivada da área para obter área mínima, ao invés de fazer a derivada do atraso para obter o atraso mínimo, como é feito na formulação tradicional do logical effort. Simulações elétricas mostram que o modelo proposto é muito preciso para uma abordagem de primeira ordem, uma vez que apresenta erros médios de 1,48% para dissipação de potência, 2,28% para atraso de propagação e 6,5% para os tamanhos dos transistores. / Microelectronics industry has been relying more and more upon cell-based design methodology to face the growing complexity in the design of digital integrated circuits, since cell-based integrated circuits are designed in a faster and cheaper way than fullcustom circuits. Nevertheless, in spite of the advancements in the field of Electronic Design Automation, cell-based digital integrated circuits show inferior performance when compared with full-custom circuits. Therefore, it is desirable to find ways to bring the performance of cell-based circuits closer to that of full-custom circuits without compromising the design costs of the former circuits. Bearing this goal in mind, this thesis presents contributions towards an automatic flow of local optimization for cellbased digital circuits. By local optimization, it is meant circuit optimization within small context windows, in which optimizations are done taking into account the global context. This way, local optimization may include the detection and isolation of critical regions of the circuit and the generation of logic and transistor networks; these networks are sized according to the existing design constraints. Since local optimizations act in a reduced context, several solutions may be obtained considering local constraints, out of which the fittest solution is chosen to replace the original subcircuit (critical region). The specific contribution of this thesis is the development of a subcircuit sizing method capable of obtaining minimum active area solutions, taking into account the maximum input capacitance, the output load to be driven, and the imposed delay constraint. The method is based on the logical effort formulation, and the main contribution is to compute the area derivative to obtain minimum area, instead of making the delay derivative to obtain minimum delay, as it is done in the traditional logical effort formulation. Electrical simulations show that the proposed method is very precise for a first order approach, as it presents average errors of 1.48% in power dissipation, 2.28% in propagation delay, and 6.5% in transistor sizes.

This thesis deals with evolutionary design of the digital circuits performed by a cartesian genetic programing and optimization by a coevolution. Algorithm coevolves fitness predictors that are optimized for a population of candidate digital circuits. The thesis presents theoretical basis, especially genetic programming, coevolution in genetic programming, design of the digital circuits, and deals with possibilities of the utilization of the coevolution in the combinational circuit design. On the basis of this proposal, the application designing and optimizing logical circuits is implemented. Application functionality is verified in the five test tasks. The comparison between Cartesian genetic programming with and without coevolution is considered. Then logical circuits evolved using cartesian genetic programming with and without coevolution is compared with conventional design methods. Evolution using coevolution has reduced the number of evaluation of circuits during evolution in comparison with standard cartesian genetic programming without coevolution and in some cases is found solution with better parameters (i.e. less logical gates or less delay).