- About
-
The Global ETD Search service is a free service for researchers
to find electronic theses and dissertations. This service is
provided by the
Networked Digital Library of Theses and Dissertations.
Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.
Search results
Showing 131 to 140 of 1070 (0.036 seconds)Spelling suggestions: "subject:"metalloxide"" "subject:"metaloxide""
| 131 |
Low noise design techniques for radio frequency integrated circuits /Li, Xiaoyong, January 2004 (has links)
Thesis (Ph. D.)--University of Washington, 2004. / Vita. Includes bibliographical references (p. 120-126).
|
| 132 |
Comparison and analysis of jitter in CMOS ring oscillators /Natesan, Peroly. January 1900 (has links)
Thesis (M.S.)--Oregon State University, 2004. / Typescript (photocopy). Includes bibliographical references (leaves 56-58). Also available on the World Wide Web.
|
| 133 |
An evaluation of the electrical, material, and reliability characteristics and process viability of ZrO₂ and ZrOxNy for future generation MOS gate dielectricNieh, Renee Elizabeth. January 2002 (has links) (PDF)
Thesis (Ph. D.)--University of Texas at Austin, 2002. / Vita. Includes bibliographical references. Available also from UMI Company.
|
| 134 |
Technology, characteristics, and modeling of large-grain polysilicon MOSFET /Singh, Jagar. January 2002 (has links)
Thesis (Ph. D.)--Hong Kong University of Science and Technology, 2002. / Includes bibliographical references. Also available in electronic version. Access restricted to campus users.
|
| 135 |
Narrow-channel effect in MOSFET /Li, Eddie Herbert. January 1900 (has links)
Thesis (M. Phil.)--University of Hong Kong, 1990.
|
| 136 |
Electrical reliability of N-Mos devices with N2O-based oxides as gate dielectrics /Zeng, Xu, January 1996 (has links)
Thesis (Ph. D.)--University of Hong Kong, 1996. / Includes bibliographical references (leaves 158-160).
|
| 137 |
High frequency techniques for advanced MOS device characterizationWang, Yun, January 2008 (has links)
Thesis (Ph. D.)--Rutgers University, 2008. / "Graduate Program in Electrical and Computer Engineering." Includes bibliographical references (p. 189-201).
|
| 138 |
Automatic layout generation of static CMOS combinational cells and blocks /Guan, Bingzhong. January 1996 (has links)
Thesis (Ph. D.)--University of Washington, 1996. / Vita. Includes bibliographical references (leaves [127]-133).
|
| 139 |
Some experimental studies of neutron irradiation and beryllium implantation induced defects in 6H-SiCChen, Xudong. January 2001 (has links)
Thesis (Ph.D.)--University of Hong Kong, 2002. / Includes bibliographical references (leaves 102-108) Also available in print.
|
| 140 |
A timing macro model for performance optimization of CMOS logic circuits.Shum, Roger Chi Fai, Carleton University. Dissertation. Engineering, Electrical. January 1992 (has links)
Thesis (M. Eng.)--Carleton University, 1992. / Also available in electronic format on the Internet.
|
Page generated in 0.0424 seconds