- About
-
The Global ETD Search service is a free service for researchers
to find electronic theses and dissertations. This service is
provided by the
Networked Digital Library of Theses and Dissertations.
Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.
Search results
Showing 91 to 100 of 1082 (0.024 seconds)Spelling suggestions: "subject:"metalloxide"" "subject:"metaloxide""
| 91 |
A CMOS image rejection mixer for cable-TV tuner using switched-capacitor Hilbert transformer /Wong, Wing Kei. January 2004 (has links)
Thesis (M. Phil.)--Hong Kong University of Science and Technology, 2004. / Includes bibliographical references (leaves 78-79). Also available in electronic version. Access restricted to campus users.
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| 92 |
Ultra thin HfO₂ gate stack for sub-100nm ULSI CMOS technologyLee, Sungjoo. January 2002 (has links)
Thesis (Ph. D.)--University of Texas at Austin, 2002. / Vita. Includes bibliographical references.
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| 93 |
A time-base asynchronous readout cmos image sensorGuo, Xiaochuan. January 2002 (has links)
Thesis (Ph. D.)--University of Florida, 2002. / Title from title page of source document. Includes vita. Includes bibliographical references.
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| 94 |
An efficient modeling approach for substrate noise coupling analysis with multiple contacts in heavily doped CMOS processes /Özis̜, Hatice Dicle. January 1900 (has links)
Thesis (M.S.)--Oregon State University, 2002. / Typescript (photocopy). Includes bibliographical references (leaves 63-64). Also available online.
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| 95 |
Modeling of narrow-width effect in MOSFET /Lai, Pui-to. January 1984 (has links)
Thesis--Ph. D., University of Hong Kong, 1985.
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| 96 |
Some experimental studies of neutron irradiation and beryllium implantation induced defects in 6H-SiC /Chen, Xudong. January 2001 (has links)
Thesis (Ph. D.)--University of Hong Kong, 2002. / Includes bibliographical references (leaves 102-108).
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| 97 |
Characterization of hot-carrier induced degradation via small-signal characteristics in mosfets /Lau, Mei Po Mabel. January 2001 (has links) (PDF)
Thesis (Ph. D.)--University of Queensland, 2002. / Includes bibliographical references.
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| 98 |
Fundamental understanding of the physics and modeling of boron source/drain extension evolution during CMOS device fabricationKohli, Puneet 28 August 2008 (has links)
Not available / text
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| 99 |
Bandgap engineering in vertical MOSFETsChen, Xiangdong, 1972- 07 March 2011 (has links)
Not available / text
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| 100 |
Optical receivers and photodetectors in 130nm CMOS technologyCsutak, Sebastian Marius 07 March 2011 (has links)
Not available / text
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