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Determining spectral sensitivity of Kodak micro positive resist 820 /Huck, Matthew L. January 1983 (has links)
Thesis (B.S.)--Rochester Institute of Technology, 1983. / Typescript. Includes bibliographical references (leaves 40-42).
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The ability of surfactants to assist in the removal of image scum in positive resist development /Belden, Michael P. January 1982 (has links)
Thesis (B.S.)--Rochester Institute of Technology, 1982. / Typescript. Includes bibliographical references (leaf 19).
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Direct diffusion resist for gravure /Hurst, Wilson. January 1982 (has links)
Thesis (M.S.)--Rochester Institute of Technology, 1982. / Typescript. Includes bibliographical references (leaf 58).
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Determination of the existence or non-existence of low-intensity reciprocity law failure in Kodak micro positive resist 809 /Middel, Jutta C. January 1984 (has links)
Thesis (B.S.)--Rochester Institute of Technology, 1984. / Typescript. Includes bibliographical references (leaves 29-30).
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Exploration of non-chemically amplified resists based on dissolution inhibitors for 193 nm lithography /Baylav, Burak. January 2010 (has links)
Thesis (M.S.)--Rochester Institute of Technology, 2010. / Typescript. Includes bibliographical references (leaves 45-47).
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Polymers and photoactive compounds for non-chemically amplified deep-UV photoresists /McAdams, Christopher Lee, January 2000 (has links)
Thesis (Ph. D.)--University of Texas at Austin, 2000. / Vita. Includes bibliographical references (leaves 173-177). Available also in a digital version from Dissertation Abstracts.
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Design and study of advanced photoresist materials : positive tone photoresists with reduced environmental impact and materials for 157 nm lithography /Yamada, Shintaro, January 2000 (has links)
Thesis (Ph. D.)--University of Texas at Austin, 2000. / Vita. Includes bibliographical references (leaves 266-276). Available also in a digital version from Dissertation Abstracts.
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Advances in photoresist characterization and lithography simulation /Henderson, Clifford Lee, January 1998 (has links)
Thesis (Ph. D.)--University of Texas at Austin, 1998. / Vita. Includes bibliographical references (leaves 306-313). Available also in a digital version from Dissertation Abstracts.
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Vacuum ultraviolet photochemistry and fourier transform infrared spectroscopy of soft x-ray photoresistsBohn, Paul William. January 1981 (has links)
Thesis (Ph. D.)--University of Wisconsin--Madison, 1981. / Typescript. Vita. eContent provider-neutral record in process. Description based on print version record. Includes bibliographical references (leaves 206-222).
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Advanced lithographic patterning technologies materials and processes /Taylor, James Christopher, January 1900 (has links)
Thesis (Ph. D.)--University of Texas at Austin, 2007. / Vita. Includes bibliographical references.
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