Global ETD Search

11	High-Speed Programmable FPGA Configuration Memory Access Using JTAG Gruwell, Ammon Bradley 01 April 2017 (has links) Over the past couple of decades Field Programmable Gate Arrays (FPGAs) have become increasingly useful in a variety of domains. This is due to their low cost and flexibility compared to custom ASICs. This increasing interest in FPGAs has driven the need for tools that both qualify and improve the reliability of FPGAs for applications where the reconfigurability of FPGAs makes them vulnerable to radiation upsets such as in aerospace environments. Such tools ideally work with a wide variety of devices, are highly programmable but simple to use, and perform tasks at relatively high speeds. Of the various FPGA configuration interfaces available, the Joint Test Action Group (JTAG) standard for serial communication is the most universally compatible interface due to its use for verifying integrated circuits and testing printed circuit board connectivity. This universality makes it a good interface for tools seeking to access FPGA configuration memory. This thesis introduces a new tool architecture for high-speed, programmable JTAG access to FPGA configuration memory. This tool, called the JTAG Configuration Manager (JCM), is made up of a large C++ software library that runs on an embedded micro-processor coupled with a hardware JTAG controller module implemented in programmable logic. The JCM software library allows for the development of custom JTAG communication of any kind, although this thesis focuses on applications related to FPGA reliability. The JCM hardware controller module allows these software-generated JTAG sequences to be streamed out at very high speeds. Together the software and hardware provide the high-speed and programmability that is important for many JTAG applications. FPGA JTAG scrubbing fault injection radiation testing laser testing C++ Python BYU configuration readback reliability SEU Xilinx bitstream upset mitigation hardware software high speed configuration memory CRAM SRAM Joint Test Action Group ionizing radiation space aerospace interface serial ARM processor architecture programmable logic MicroZed Zynq Linux Electrical and Computer Engineering
12	Testovací metody pro hodnocení radiačních efektů v přesných analogových a signálově smíšených obvodech pro aplikace v kosmické elektronice / Test Methods for Evaluation of Radiation Effects in High Precision Analog and Mixed-Signal Devices for Space Applications Hofman, Jiří January 2019 (has links) The traditional radiation testing of space electronics has been used for more than fifty years to support the radiation hardness assurance. Its typical goal is to ensure reliable operation of the spacecraft in the harsh environment of space. This PhD research looks into the radiation testing from a different perspective; the goal is to develop radiation testing methods that are focused not only on the reliability of the components but also on a continuous radiation-induced degradation of their performance. Such data are crucial for the understanding of the impact of radiation on the measurement uncertainty of data acquisition systems onboard research space missions.

Search results

High-Speed Programmable FPGA Configuration Memory Access Using JTAG

Testovací metody pro hodnocení radiačních efektů v přesných analogových a signálově smíšených obvodech pro aplikace v kosmické elektronice / Test Methods for Evaluation of Radiation Effects in High Precision Analog and Mixed-Signal Devices for Space Applications