Darbe atlikta literatūros analizė šių procesų: (i) vykstančių vandens garų plazmoje; (ii) titano dangų oksidacija vandens garų plazmoje ir (iii) titano dioksido fotokatalitinės ir hidrofilinės savybės. TiO2 dangos buvo gautos po titano dangų ekspozicijos H2O garų plazmoje. Tyrimai parodė, kad TiO2 danga vandens garų plazmos aplinkoje formuoja elektrocheminį elementą. Darbe tirtos plazma aktyvuotos vandens skaldymo reakcijos. Parodyta, kad susidarę protonai pernešami per kietą TiO2 elektrolitą, o elektronai migruoja per plazmoje susiformavusią išorinę grandinę. Proceso metu dangos paviršinis sluoksnis formuojasi į TiO2–SiO2 kompozitą. Nors procesai vyksta žemoje temperatūroje, gauti rezultatai parodė masės pernešimo reiškinius, būdingus aukštoms temperatūroms. Pateikti nagrinėtų procesų mechanizmai. Darbo metu bandinių eksperimentinė analizė atlikta elektroninės dispersinės spektroskopijos (EDS), rentgeno spindulių difrakcijos (RSD), Auger elektroninės spektroskopijos (AES), skenuojančio elektroninio mikroskopo (SEM), optinės mikroskopijos ir kontaktinio profilometro metodais. / Processes in water vapor plasma, titania film oxidation in water vapor plasma and titanium dioxide photocatalytic and hydrophilic properties are discussed in this paper. Titatium dioxide thin films were obtained after titanium thin film exposure in water vapor plasma. Specimen together with H2O plasma forms electrochemical cell. In plasma film surface is activated and photocatalytic water splitting reactions occurs. Generated hydrogen ions are transported through solid titanium electrolyte and electrons are conducted to an external circuit via plasma. Titanium dioxide films surfaces are converted into composited composed of TiO2 and SiO2. Although oxidation process occurs in room temperature results showed mass transfer processes which occurs in high temperature. Specimens were analysed by electron dispersion spectroscopy (EDS), (X-ray diffraction (XRD), Auger electron spectroscopy (AES), glow discharge optical emission spectroscopy (GDOES), scanning electron microscopy (SEM), optical microscopy and nanoprofilometer methods.

The recent discoveries of topological insulators (TI) has opened a new realm for study¬ing topological systems and exploring the exotic properties they offer. The in-built topological protection against direct backscattering and absence of localization makes two-dimensional (2D) surface states of bismuth chalcogenide-based strong TI a promising platform for studying interesting phenomena in condensed matter physics like dissipation-less transport, quantum anomalous hall effect, topological magnetoelectric effect, majo¬rana fermions etc. and also makes this system very suitable for applications in the fields of electronics and spintronics. However, realization of these novel states can be difficult because of scattering of surface states from different types of disorders (intrinsic or ex¬trinsic) or the presence of parallel channels in the bulk of the sample which can dominate over surface transport. The main goal of this thesis is to evaluate the performance of TI as an electronic element and look into elastic and inelastic scattering processes and kinetics of these scatterers. In most part of this work we concentrate on the magnitude and origin of low-frequency flicker noise or the 1/f-noise, a key performance marker in electronics, to characterize the electrical transport in TI. In this work we have studied 1/f-noise in both mechanically exfoliated TI-flakes and epitaxially grown TI films by varying chemical potential and temperature. Our study of exfoliated TI-flakes with a wide range of thickness (10 nm to 80 μm) suggests that whereas at thinner (<100 nm) samples and at low temperature (<70 K), the electrical transport happens entirely at the surface, resistance fluctuations in the surface states are mainly caused by potential fluctuations caused by generation-recombination processes in the bulk of TI. Study of 1/f-noise in MBE-grown magnetically doped TI reveals signature of hopping transport through localized bulk mid gap states. These states can either be Cr-impurity band or disorder-induced mobility edge states of bulk valence band. Our study of quantum transport in exfoliated TI-devices indicate presence of a de-coherence mechanism which saturates phase-coherence length and temperature below T< 3 K and results from a unique scattering mechanism caused by localized magnetic moments in these systems