This dissertation presents a novel technique called duplicate with choose (DWCh) which is a modification of the fault detection technique duplicate with compare (DWC). DWCh adds a smart decider block to DWC that monitors the duplicated circuits and decides which circuit is fault free when a fault occurs. If chosen correctly, DWCh is able to mask faults at a lower cost than conventional techniques like TMR.This dissertation derives reliability expressions for DWCh showing that under ideal conditions its reliability exceeds the most commonly used fault masking technique for spacecraft, triple modular redundancy. For non-ideal conditions, DWCh provides a lower cost alternative than TMR but with lower reliability as well. Three types of DWCh smart deciders were developed for use with digital communications receivers. The first type used histograms as the statistical basis for the decider. The second type made use of moments for decision. The third type, although not generally applicable to other systems, used a signal common to communications receivers with excellent results. The communications receivers were subjected to hardware fault injection to gather datastreams affected by real world faults. The captured datastreams were used with Simulink models of the different deciders to quantify their performance and discover how a practical implementation of DWCh differs from the theoretical model. The increase in mean time to failure for DWCh when compared to simplex ranged from 20x to 130x depending on the specific smart decider tested.

With significant advances in wired and wireless technologies and also increased shrinking in the size of VLSI circuits, many devices have become very large because they need to contain several large units. This large number of gates and in turn large number of transistors causes the devices to be more prone to faults. These faults specially in sensitive and critical applications may cause serious failures and hence should be avoided. On the other hand, some critical applications such as cryptosystems may also be prone to deliberately injected faults by malicious attackers. Some of these faults can produce erroneous results that can reveal some important secret information of the cryptosystems. Furthermore, yield factor improvement is always an important issue in VLSI design and fabrication processes. Digital systems such as cryptosystems and digital signal processors usually contain finite field operations. Therefore, error detection and correction of such operations have become an important issue recently. In most of the work reported so far, error detection and correction are applied using redundancies in space (hardware), time, and/or information (coding theory). In this work, schemes based on these redundancies are presented to detect errors in important finite field arithmetic operations resulting from hardware faults. Finite fields are used in a number of practical cryptosystems and channel encoders/decoders. The schemes presented here can detect errors in arithmetic operations of finite fields represented in different bases, including polynomial, dual and/or normal basis, and implemented in various architectures, including bit-serial, bit-parallel and/or systolic arrays.

With significant advances in wired and wireless technologies and also increased shrinking in the size of VLSI circuits, many devices have become very large because they need to contain several large units. This large number of gates and in turn large number of transistors causes the devices to be more prone to faults. These faults specially in sensitive and critical applications may cause serious failures and hence should be avoided. On the other hand, some critical applications such as cryptosystems may also be prone to deliberately injected faults by malicious attackers. Some of these faults can produce erroneous results that can reveal some important secret information of the cryptosystems. Furthermore, yield factor improvement is always an important issue in VLSI design and fabrication processes. Digital systems such as cryptosystems and digital signal processors usually contain finite field operations. Therefore, error detection and correction of such operations have become an important issue recently. In most of the work reported so far, error detection and correction are applied using redundancies in space (hardware), time, and/or information (coding theory). In this work, schemes based on these redundancies are presented to detect errors in important finite field arithmetic operations resulting from hardware faults. Finite fields are used in a number of practical cryptosystems and channel encoders/decoders. The schemes presented here can detect errors in arithmetic operations of finite fields represented in different bases, including polynomial, dual and/or normal basis, and implemented in various architectures, including bit-serial, bit-parallel and/or systolic arrays.