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A Low-Power Low-Cost 256MHzS/s 6-bit Analog to Digital Converter Using Selective Reference VoltageShieh, Chung-Hsiao 05 July 2005 (has links)
In this paper, we present a low-power low-cost 6-bits, ADC using selective reference voltage technique. Using selective reference voltage technique, the different bit uses different comparator can be achieved. Meanwhile, the outputs from comparators are a binary code which can be used for generating logic condition thereby controlling the switches. Because the conventional n bits flash ADC requires 2n - 1 comparators and its power, area and input capacitance are all proportional to 2n - 1. Whereas, the proposed n bits ADC needs only n comparators which can save more power and area, and its input capacitance are proportional to n only, and keep high speed.
Our proposed ADC is design by TSMC 1P6M 0.18£gm process with 6-bits resolution, 1.8V power supply. The signal input range 0.5V~1.1V, sampling rate 256MS/s, DNL +0.46LSB~ -0.49LSB, INL +0.85LSB~ -0.05LSB. In addition, the FOM of the ADC is only 0.26 pJ/Conv and the power consumption is only 4.2mW.It is good for a low-power and low cost customer electronic application.
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A new methodology of an on chip time measurement circuit for high speed digital testing applicationsAbas, Mohd Amir January 2003 (has links)
No description available.
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A 43mW single-channel 4GS/s 4-bit flash ADC IN 0.18um CMOSSheikhaei, Samad 05 1900 (has links)
The continued speed improvement of serial links and appearance of new communication technologies, such as ultra wideband (UWB), have introduced increasing demands on the speed and power specifications of high speed low to medium resolution analog to digital converters (ADCs). While multi channel ADCs can achieve high speeds, they often require extensive and costly post fabrication calibration.
A single channel 4 bit flash ADC, suitable for abovementioned or similar applications, implemented entirely using current mode logic (CML) blocks, is presented. CML implementation allows for high sampling rates, while typically providing low power consumption at high speeds. To improve the conversion rate, both the analog (comparator array) and the digital (encoder) parts of the ADC are fully pipelined. Furthermore, the logic functions in the encoder are reformulated to reduce wire crossings and delay and to equalize the wires lengths in the layout. To keep the design simple, inductors are avoided. As a result, a compact design with small wire parasitics is achieved. Moreover, some geometric layout techniques, including a common centroid layout for the resistor ladder, are introduced to reduce the effect of mismatches to eliminate the use of digital calibration.
The ADC is designed and fabricated in 0.18um CMOS and operates at 4GS/s. It achieves an effective number of bits (ENOB) of 3.71 (3.14, 2.75) for a 10MHz (0.501GHz, 1.491GHz) signal sampled at 4GS/s (3GS/s, 3GS/s). Differential/integral nonlinearity (DNL/INL) errors are between +/-0.35LSB and +/-0.26LSB, respectively. The ADC consumes 43mW from a 1.8V supply and occupies 0.06mm2 active area.
Due to the use of CML circuits, the ADC achieves the highest speed reported for a single channel 4 bit ADC in a 0.18um CMOS technology. It also reports the best power performance among the 4-bit ADCs with similar or higher speeds. The active area is also among the smallest reported.
In addition, in this thesis, the signal to noise ratio (SNR) of an ADC is formulated in terms of its INL performance. The related formulas in the literature are not accurate for low resolution ADCs, and yet they do not take the input waveform into account. Two standard waveforms, ramp and sinusoid, are considered here. The SNR formulas are derived and confirmed by simulation results.
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Design of high speed folding and interpolating analog-to-digital converterLi, Yunchu 30 September 2004 (has links)
High-speed and low resolution analog-to-digital converters (ADC) are key elements in
the read channel of optical and magnetic data storage systems. The required resolution is
about 6-7 bits while the sampling rate and effective resolution bandwidth requirements
increase with each generation of storage system. Folding is a technique to reduce the
number of comparators used in the flash architecture. By means of an analog preprocessing
circuit in folding A/D converters the number of comparators can be reduced significantly.
Folding architectures exhibit low power and low latency as well as the ability to run at high
sampling rates. Folding ADCs employing interpolation schemes to generate extra folding
waveforms are called "Folding and Interpolating ADC" (F&I ADC).
The aim of this research is to increase the input bandwidth of high speed conversion, and
low latency F&I ADC. Behavioral models are developed to analyze the bandwidth
limitation at the architecture level. A front-end sample-and-hold unit is employed to tackle
the frequency multiplication problem, which is intrinsic for all F&I ADCs. Current-mode
signal processing is adopted to increase the bandwidth of the folding amplifiers and
interpolators, which are the bottleneck of the whole system. An operational
transconductance amplifier (OTA) based folding amplifier, current mirror-based
interpolator, very low impedance fast current comparator are proposed and designed to
carry out the current-mode signal processing. A new bit synchronization scheme is
proposed to correct the error caused by the delay difference between the coarse and fine
channels.
A prototype chip was designed and fabricated in 0.35μm CMOS process to verify the
ideas. The S/H and F&I ADC prototype is realized in 0.35μm double-poly CMOS process
(only one poly is used). Integral nonlinearity (INL) is 1.0 LSB and Differential nonlinearity
(DNL) is 0.6 LSB at 110 KHz. The ADC occupies 1.2mm2 active area and dissipates
200mW (excluding 70mW of S/H) from 3.3V supply. At 300MSPS sampling rate, the ADC
achieves no less than 6 ENOB with input signal lower than 60MHz. It has the highest input
bandwidth of 60MHz reported in the literature for this type of CMOS ADC with similar
resolution and sample rate.
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A 43mW single-channel 4GS/s 4-bit flash ADC IN 0.18um CMOSSheikhaei, Samad 05 1900 (has links)
The continued speed improvement of serial links and appearance of new communication technologies, such as ultra wideband (UWB), have introduced increasing demands on the speed and power specifications of high speed low to medium resolution analog to digital converters (ADCs). While multi channel ADCs can achieve high speeds, they often require extensive and costly post fabrication calibration.
A single channel 4 bit flash ADC, suitable for abovementioned or similar applications, implemented entirely using current mode logic (CML) blocks, is presented. CML implementation allows for high sampling rates, while typically providing low power consumption at high speeds. To improve the conversion rate, both the analog (comparator array) and the digital (encoder) parts of the ADC are fully pipelined. Furthermore, the logic functions in the encoder are reformulated to reduce wire crossings and delay and to equalize the wires lengths in the layout. To keep the design simple, inductors are avoided. As a result, a compact design with small wire parasitics is achieved. Moreover, some geometric layout techniques, including a common centroid layout for the resistor ladder, are introduced to reduce the effect of mismatches to eliminate the use of digital calibration.
The ADC is designed and fabricated in 0.18um CMOS and operates at 4GS/s. It achieves an effective number of bits (ENOB) of 3.71 (3.14, 2.75) for a 10MHz (0.501GHz, 1.491GHz) signal sampled at 4GS/s (3GS/s, 3GS/s). Differential/integral nonlinearity (DNL/INL) errors are between +/-0.35LSB and +/-0.26LSB, respectively. The ADC consumes 43mW from a 1.8V supply and occupies 0.06mm2 active area.
Due to the use of CML circuits, the ADC achieves the highest speed reported for a single channel 4 bit ADC in a 0.18um CMOS technology. It also reports the best power performance among the 4-bit ADCs with similar or higher speeds. The active area is also among the smallest reported.
In addition, in this thesis, the signal to noise ratio (SNR) of an ADC is formulated in terms of its INL performance. The related formulas in the literature are not accurate for low resolution ADCs, and yet they do not take the input waveform into account. Two standard waveforms, ramp and sinusoid, are considered here. The SNR formulas are derived and confirmed by simulation results.
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A 43mW single-channel 4GS/s 4-bit flash ADC IN 0.18um CMOSSheikhaei, Samad 05 1900 (has links)
The continued speed improvement of serial links and appearance of new communication technologies, such as ultra wideband (UWB), have introduced increasing demands on the speed and power specifications of high speed low to medium resolution analog to digital converters (ADCs). While multi channel ADCs can achieve high speeds, they often require extensive and costly post fabrication calibration.
A single channel 4 bit flash ADC, suitable for abovementioned or similar applications, implemented entirely using current mode logic (CML) blocks, is presented. CML implementation allows for high sampling rates, while typically providing low power consumption at high speeds. To improve the conversion rate, both the analog (comparator array) and the digital (encoder) parts of the ADC are fully pipelined. Furthermore, the logic functions in the encoder are reformulated to reduce wire crossings and delay and to equalize the wires lengths in the layout. To keep the design simple, inductors are avoided. As a result, a compact design with small wire parasitics is achieved. Moreover, some geometric layout techniques, including a common centroid layout for the resistor ladder, are introduced to reduce the effect of mismatches to eliminate the use of digital calibration.
The ADC is designed and fabricated in 0.18um CMOS and operates at 4GS/s. It achieves an effective number of bits (ENOB) of 3.71 (3.14, 2.75) for a 10MHz (0.501GHz, 1.491GHz) signal sampled at 4GS/s (3GS/s, 3GS/s). Differential/integral nonlinearity (DNL/INL) errors are between +/-0.35LSB and +/-0.26LSB, respectively. The ADC consumes 43mW from a 1.8V supply and occupies 0.06mm2 active area.
Due to the use of CML circuits, the ADC achieves the highest speed reported for a single channel 4 bit ADC in a 0.18um CMOS technology. It also reports the best power performance among the 4-bit ADCs with similar or higher speeds. The active area is also among the smallest reported.
In addition, in this thesis, the signal to noise ratio (SNR) of an ADC is formulated in terms of its INL performance. The related formulas in the literature are not accurate for low resolution ADCs, and yet they do not take the input waveform into account. Two standard waveforms, ramp and sinusoid, are considered here. The SNR formulas are derived and confirmed by simulation results. / Applied Science, Faculty of / Electrical and Computer Engineering, Department of / Graduate
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DIGITALLY ASSISTED TECHNIQUES FOR NYQUIST RATE ANALOG-to-DIGITAL CONVERTERSMajidi, Rabeeh 05 May 2015 (has links)
With the advance of technology and rapid growth of digital systems, low power high speed analog-to-digital converters with great accuracy are in demand. To achieve high effective number of bits Analog-to-Digital Converter(ADC) calibration as a time consuming process is a potential bottleneck for designs. This dissertation presentsa fully digital background calibration algorithm for a 7-bit redundant flash ADC using split structure and look-up table based correction. Redundant comparators are used in the flash ADC design of this work in order to tolerate large offset voltages while minimizing signal input capacitance. The split ADC structure helps by eliminating the unknown input signal from the calibration path. The flash ADC has been designed in 180nm IBM CMOS technology and fabricated through MOSIS. This work was supported by Analog Devices, Wilmington,MA. While much research on ADC design has concentrated on increasing resolution and sample rate, there are many applications (e.g. biomedical devices and sensor networks) that do not require high performance but do require low power energy efficient ADCs. This dissertation also explores on design of a low quiescent current 100kSps Successive Approximation (SAR) ADC that has been used as an error detection ADC for an automotive application in 350nm CD (CMOS-DMOS) technology. This work was supported by ON Semiconductor Corp, East Greenwich,RI.
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Post-Correction of Analog to Digital ConvertersGong, Pu, Guo, Hua January 2008 (has links)
<p>As the rapid development of the wireless communication system and mobile video devices, the integrated chip with low power consuming and high conversion efficiency is widely needed. ADC and DAC are playing an important role in these applications.</p><p>The aim of this thesis is to verify a post-correction method which is used for improving the performance of ADC. First of all, this report introduces the development and present status of ADC, and expatiate its important parameters from two different classes (static performance and dynamic performance). Based on the fundamental principle, the report then focuses on the dynamic integral non-linearity modeling of ADC. Refer to this model, one post-correction method is described and verified.</p><p>Upon the face of post-correction, this method is to modify the output signals which have been converted from analog to digital format by adding a correction term. Improvement made by the post-correction needs to be checked out. Thus the performance analysis mainly relay on the measures of total harmonic distortion and signal to noise and distortion ratio is also included in this thesis.</p>
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A stochastic time-to-digital converter for digital phase-locked loopsOk, Kerem 28 September 2005 (has links)
Graduation date: 2006 / Digital phase-locked loops (PLLs) have been receiving increasing attention recently due to their ease of integration, scalability and performance comparable to their analog counterparts. In digital PLLs, increased resolution in time-to-digital conversion is desirable for improved noise performance. This work describes the design and simulation of a stochastic time-to-digital converter (STDC) for a digital PLL to attain high resolution. The converter is intended to comprise the fine loop of the phase-frequency detector, whose coarse loop would be comprised of a time-to-digital converter designed using the conventional delay-chain approach. The STDC is designed, simulated and sent for fabrication in a 0.35μm SOI CMOS process. System level simulations in MATLAB are verified by device level simulations in Spectre on circuits extracted from layout. The results support the viability of using the proposed circuit for high resolution time-to-digital conversion.
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Pipeline Analog-Digital Converters Dynamic Error Modeling for Calibration : Integral Nonlinearity Modeling, Pipeline ADC Calibration, Wireless Channel K-Factor EstimationMedawar, Samer January 2012 (has links)
This thesis deals with the characterization, modeling and calibration of pipeline analog-digital converters (ADC)s. The integral nonlinearity (INL) is characterized, modeled and the model is used to design a post-correction block in order to compensate the imperfections of the ADC. The INL model is divided into: a dynamic term designed by the low code frequency (LCF) component depending on the output code k and the frequency under test m, and a static term known as high code frequency (HCF) component depending solely on the output code k. The HCF is related to the pipeline ADC circuitry. A set of adjacent piecewise linear segments is used to model the HCF. The LCF is the dynamic term depending on the input signal characteristics, and is modeled using a polynomial with frequency dependent coefficients. Two dynamic calibration methodologies are developed to compensate the imperfections of the pipeline ADC. In the first approach, the INL model at hand is transformed into a post-correction scheme. Regarding the HCF model, a set of gains and offsets is used to reconstruct the HCF segments structure. The LCF polynomial frequency dependent coefficients are used to design a bank of FIR filters which reconstructs the LCF model. A calibration block made by the combination of static gains/offsets and a bank of FIR filters is built to create the correction term to calibrate the ADC. In the second approach, the calibration (and modeling) process is extended to the upper Nyquist bands of the ADC. The HCF is used directly in calibration as a look-up-table (LUT). The LCF part is still represented by a frequency dependent polynomial of which the coefficients are used to develop a filter bank, implemented in the frequency domain with an overlap-and-add structure. In brief the calibration process is done by the combination of a static LUT and a bank of frequency domain filters. The maximum likelihood (ML) method is used to estimate the K-factor of a wireless Ricean channel. The K-factor is one of the main characteristics of a telecommunication channel. However, a closed-form ML estimator of the Kfactor is unfeasible due to the complexity of the Ricean pdf. In order to overcome this limitation, an approximation (for high K-factor values) is induced to the Ricean pdf. A closed-form approximate ML (AML) for the Ricean K-factor is computed. A bias study is performed on the AML and the bias derived value is used to improve the AML estimation, leading to a closed-form bias compensated estimator (BCE). The BCE performance (in terms of variance, bias and mean square error (MSE)) is simulated and compared to the best known closed-form moment-based estimator found in the literature. The BCE turns to have a superior performance for low number of samples and/or high K-factor values. Finally, the BCE is applied on real site wireless channel measurements in an urban macro cell area, using a 4-antenna transmit/receive MIMO system. / QC 20120528
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