Spelling suggestions: "subject:"electrical fault location""
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Performance analysis of augmented shuffle exchange networksRamachandran, Viswanathan 06 October 2009 (has links)
This research presents an analysis of the improvement in the performance of a class of fault tolerant multistage interconnection networks. In the network discussed here, fault tolerance is achieved by providing multiple redundant paths between the source and destination. The extra paths are obtained by providing redundant links between switching elements within a stave (intra-stage links), thereby increasing the switching element complexity. The techniques used in the construction of this network, its properties, advantages, and disadvantages are discussed. While early studies focused their effort in analyzing the fault tolerant characteristics of the network and the performance in a circuit switched environment, this investigation complements the previous work by examining fie performance of a packet switched network. The reasons for the choice of the architecture that include factors like hardware complexity, cost and simplicity of control algorithm are analyzed. The study concentrates on improving the run-time performance of the fault tolerant network. by using these multiple paths not only in the presence of a fault, but also in a fault-free environment. The throughput of the packet switched network in the presence of a fault, congestion and when fault free are analyzed. A description of the investigation, assumptions and factors used for the study, a cost analysis, and the results of the simulation analyses is included. / Master of Science
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Transient fault detection using a watchdog processorBecker, Brian Alan 10 November 2009 (has links)
Microprocessors are used in many applications where a high degree of reliability is required. For instance, satellite based systems operating in space have no way being serviced if something were goes wrong. Often these systems, operating in radiation environments, are subject to random high energy particles that pass through the device and upset the operation of the microprocessor for a short period but leave no permanent damage. These transient faults are difficult to predict, prevent, or detect but can lead to a system failure if not discovered. / Master of Science
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Distributed reconfiguration and fault diagnosis in cellular processing arraysLawson, Shannon Edward 30 June 2009 (has links)
An overview of an existing hierarchical reconfiguration scheme for a fault-tolerant two-dimensional cellular architecture is presented, wherein an array of finite state machine cells controls the processing and switching elements. This allows the array to either reconfigure in the presence of faults, or to perform different processing functions. Since the control mechanism is distributed, the system is not subject to single-point "hard core" failures, as in the case of a global control mechanism. Unlike other fault-tolerant systems, the proposed method does not assume the existence of components which never fail.
The processing elements in the array are logically connected in a mesh pattern, and are provided with additional physical connections to other cells. A local reconfiguration scheme allows faulty cells to be bypassed via these additional connections, so that the logical mesh can be restored. This technique allows the array to quickly reconfigure in the presence of up to triple faults.
When local reconfiguration fails, the array can still reconfigure by using a global reconfiguration scheme, in which the functional part of the array relocates itself to a faultfree area. The process is "global" in the sense that the entire functional part of the array is involved in the process, but the mechanism to accomplish this is still distributed in nature.
With the framework of the system established, the results of this research are presented. The hardware complexities of the existing global reconfiguration scheme are analyzed, and compared with the complexities of previous work in this area. A distributed diagnosis algorithm is also developed, which works in conjunction with the local reconfiguration mechanism to quickly detect and isolate faults in the array. Using these results, the foundations are laid for a totally self-checking implementation of the control cells, which allows online concurrent fault detection in the array. / Master of Science
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On the generation of test patterns for combinational circuitsThakar, Sarita 07 April 2009 (has links)
In this thesis, methods of identification of redundant faults and test pattern compaction are presented. The aim of the research is to improve an existing test pattern generator ATALANTA by incorporating methods for identification of redundant faults and test compaction. The faults are modeled as stuck-at faults for combinational circuits.
To guarantee the completeness of the generated test set all redundant faults should be identified. For this purpose, the process of dynamic unique sensitization is implemented. This process studies the circuit for the existing state of value assignments and determines the dynamic dominators to identify redundant faults. The test set size is compacted to reduce the test storage space and test application time. The process of compaction is done by shuffling the test set and simulating the re-arranged test set to drop unnecessary test patterns. Experimental results show that the methods lead to a smaller test set size and identification of all redundant faults. / Master of Science
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Distributed intelligent system for on-line fault section estimation oflarge-scale power networks畢天姝, Bi, Tianshu. January 2002 (has links)
published_or_final_version / Electrical and Electronic Engineering / Doctoral / Doctor of Philosophy
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Design-for-testability techniques for deep submicron technology /Das, Debaleena. January 2000 (has links)
Thesis (Ph. D.)--University of Texas at Austin, 2000. / Vita. Includes bibliographical references (leaves 81-85). Available also in a digital version from Dissertation Abstracts.
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AN HEURISTIC SEARCH APPROACH TO TEST SEQUENCE GENERATION FOR AHPL (A HARDWARE PROGRAMMING LANGUAGE) DESCRIBED SYNCHRONOUS SEQUENTIAL CIRCUITSBelt, John Edward, 1933- January 1973 (has links)
No description available.
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Ultra fast fault feature extraction and diagnosos in power transmission linesYusuff, Adedayo Ademola. January 2012 (has links)
D. Tech. Electrical Engineering. / Discusses how to mitigate unnecessary and expensive damage to a power transmission grid, the purpose of this work are therefore: to identify the unique signature of various types of short circuit faults on electric power transmission lines. To formulate mathematical techniques for the characterisation of faults on the electric power transmission grid.To evaluate algorithms that can classify various types of short circuit faults on electric power transmission lines. To develop an ultra fast fault diagnosis system. In addition, this work would make a contribution in the following areas: filtering of decaying DC offset in post fault measurement, formulation of a features extraction algorithm for all short circuit faults on electric transmission lines, evaluation of efficient classiers and regression algorithms, and formulation of faults diagnostic scheme for electric power transmission lines.
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SEARCH DIRECTING HEURISTICS FOR THE SEQUENTIAL CIRCUIT TEST SEARCH SYSTEM (SCIRTSS)Huey, Ben Milton, 1945- January 1975 (has links)
No description available.
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An interactive program for determination of fault detecting sequencesLin, Liang-Tsai, 1944- January 1970 (has links)
No description available.
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