This thesis treats about semiconducting silicon structures. It describes the characteristics of the element and creation of P and N type of semiconductor and discusses about different types of faults in the crystal lattice. It deals with the description of methods for monitoring faults in semiconductor ie. determining the properties of semiconductors via EBIC, EBIV and CC methods, which are used for analysis of semiconductor devices and materials. Determining the properties of silicon components is being done by generation of charge carriers in the sample loaded in chamber of the scanning electron microscope by high energy electrons. Bellow the sample surface is being generated an electric charge which is being collected by probes. Using this data obtained by EBIC and CC were evaluated diffusion length and lifetime of electrons.

This dissertation solves the problems with management of capital goods in the company FORMIRA, s.r.o. The dissertation is elaborated from the analysis of present situation in the plant, whereas the heed is oriented to the most important areas, especially the organization and service activity and maintenance of assets. The result of performed analysis is the identification weak points. Proposals are submitted in the second part of the dissertation, in order to solve the problems found by presented analysis. The economical evaluation of the proposals and determinations of assumptions for the application of extended results to the company use is performed at the end of the dissertation.

This thesis solves issues of management with long term material property in the company H&P plast, limited liability Company, which is engaged in the manufacturing plastic products and forms. The first part of thesis contains theoretical basis and total analysis of the company. It is focused on long term material property, its care and maintenance. On the basis of analysis weaknesses are identified in the company. In the second part of thesis solutions are suggested, which is lead to improvement and optimization current situation. Finally proposals are evaluated in economic terms.

This master’s thesis focuses on analysis of time consumption of machining process, the basic units of operating costs of production,optimization and subsequen tapplication to specific part. It is a turning shaft in two operations, named roughing and finishing turning. The aim is to find the optimum combination of life time of cutting tool and cutting speed, which is the main criterion for optimization in terms of minimum production cost or a maximum of productivity.

This work deals with operating production costs in machining process and further optimalization. In the first chapter, individual costs items which are related to machining process are specified. These cost items are quantified and total production costs are acquired. Optimalization of operation production costs are described for criterion of minimal production costs and criterion of maximal productivity are described in next chapter. Practical part of this work is focused to apply each individual criterion in practical example. There is CD with programs attached to this work. The goal is to find optimal combination of cutting speed, sufficient life time of cutting tool and suitable cutting technology so that chosen criterion can be acceptable.

This dissertation examines life-time management of process and energetic devices in industrial practice, mainly in the area of steam power plants. Furthermore, it focuses on frequent damage mechanisms occurring in this area. It summarizes basics of damaging mechanisms occurring in the process industry area, their monitoring, evaluation and prediction. In the area of steam power plants, the main emphasize was placed on cumulative damage mechanisms. Within the dissertation, mechanisms of creep, fatigue, and their combinations were assessed. Major European standards were examined in order to discuss the amount of contained conservatism and their usability. Subsequently, attention was paid to the methods applicable for creep and fatigue combination evaluation. In the next step life-time monitoring and evaluation standard was discussed. The diagnostic software was created which includes creep, fatigue and creep-fatigue combination evaluation according to valid standards. For online life-time evaluation was proposed refined analytical solution for stress and strain calculation. To further extend the life-time management, the dissertation describes oxide scale damaging together with its evaluation and implementation into diagnostic software. The proposed software is extended by the material module which on the basis of defined materials allows easy and effective usage of material characteristics. For the purpose of refining life-time prediction accuracy, experimental device was schematically described. In addition, the device should be also able to verify used equations. Furthermore, the dissertation includes solution to industrially oriented cases. Firstly, a steam generator with damaged pipes was analyzed, afterwards damaged transferring pipeline. Further analyses deal with U-tube heat exchanger and its damaging. The causes of damage were discovered and corrective measures were proposed. The dissertation concludes with the summarization of potential activities for subsequent research in examined area.

This paper aims to define methods for measuring CLV in the segment of internal customers of companies operating in the financial market. It's about finding such a method to determine the value of internal customers to predict and measure whether an internal customer pays off to the company. The standalone task is to quantify the internal customer's contributions to the overall value of the company. The area of CLV determination for internal customers of the company is not described in the literature. From this point of view, the determination of CLV internal customers in the strategic management system will be a major scientific achievement. Similarly to external customers (markets), as well as internal customers express greater or lesser affinities with their behavior and performance, in the first case the brand and in the latter case the employer. Therefore, CLV modeling for internal customers requires qualified predictions and expressions of a whole range of both hard (eg, cash flow indicators) and Soft (indicators of qualitative research such as loyalty) of indicators and their use in the calculation of CLV internal customers. An important prerequisite for CLV for both internal customers is their segmentation.

No description available.

La conception en vue de la fiabilité (DFR, Design for Reliability) consiste à simuler le vieillissement électrique des composants élémentaires pour évaluer la dégradation d'un circuit complet. C'est dans ce contexte de fiabilité et de simulation de cette dernière, qu'une stratégie de conception en vue de la fiabilité a été développée au cours de ses travaux. Cette stratégie, intégrant une approche « système » de la simulation, s'appuie sur l'ajout de deux étapes intermédiaires dans la phase de conception. La première étape est une étape de construction de modèles comportementaux compacts à l'aide d'une méthodologie basée sur une approche de modélisation multi niveaux (du niveau transistor au niveau circuit) des dégradations d'un circuit. La seconde étape consiste alors l'analyse descendante de la fiabilité de ce circuit, à l'aide de simulations électriques utilisant ses modèles comportementaux dits « dégradables », afin de déterminer les blocs fonctionnels et/ou les composants élémentaires critiques de l'architecture de ce dernier, vis-à-vis d'un mécanisme de défaillance et un profil de mission donnés. Cette analyse descendante permet aussi d'évaluer l'instant de défaillance de ce circuit. Les dispersions statiques, lies au procédé de fabrication utilisé, sur les performances d'un lot de CIs ont aussi été prises en compte afin d'évaluer leur impact sur la dispersion des instants de défaillance des circuits intégrés. Ces méthodes ont été appliquées à deux mécanismes de dégradation : les porteurs chauds et les radiations. / Design for reliability (DFR) consists in assessing the impact of electrical ageing of each elementary component, using electrical simulations, on performance degradations of a full device. According to DFR concept and reliability simulation, theses works present a new DFR strategy. This strategy based on the integration of two intermediate phases in the ICs and SoC design flow. The first phase is a bottom-up ageing behavioural modelling phase of a circuit (from transistor level to circuit level). The second phase is a « top-down reliability analyses » phase of this circuit, performing electrical simulations using its ageing behavioural models, in order to determine critical functional blocks and / or elementary components of its architecture according to a failure mechanism and a given mission profile. Theses analyses also allow determining the failure time of this circuit. Statistical dispersions on ICs performances, due to the used manufacturing process, have been taking into account in order to assess their impact on failure time dispersions of a ICs lot. The method has been applied on two degradation mechanisms: hot carriers and radiations.

Dans la première partie de cette thèse, nous tirons parti du concept de nano-antenne optique afind'apporter une solution innovante au problème d'interprétation de la microscopie champ procheoptique (SNOM). En effet, il est connu que certaines nano-antennes développent des réponsesoptiques dipolaires. Dans cette thèse nous démontrons comment l’utilisation d’une nano-ouverturepapillon (nano-antenne dipolaire), à l’extrémité d’une pointe SNOM, permet de détecter et collecteruniquement une seule composante du champ proche électrique. Ce résultat est démontré d’unpoint de vue théorique par l’utilisation de simulation FDTD (Finite Difference Time Domain) et d’unpoint de vue expérimental par la caractérisation, par cette pointe innovante, d´échantillonsdiélectriques (réseaux, cristaux photoniques) et métalliques (milieux désordonnés plasmoniques).Dans une deuxième partie, nous démontrons comment la sonde développée dans la premièrepartie, peut être utilisée comme détecteur du signal émis par un nano-émetteurs (NE) unique. Il estétudié dans cette partie l’effet de couplage entre ces deux objets. Dans un premier temps, après ladescription complète des grandeurs caractéristiques d’un NE, nous démontrons théoriquementl’effet de la pointe sur la réduction du temps de vie de l’état excité et l’augmentation de lafluorescence d’un NE, en régime saturé et non saturé. Puis dans un deuxième temps nousdémontrons expérimentalement comment cette sonde réduit le temps de vie de l’état excité deboites quantiques placées à son extrémité, en comparaison de pointes SNOM plus conventionnellestelle que la pointe diélectrique et la pointe à ouverture circulaire. / In the first part of this manuscript, we use in our advantage the concept of optical nano-antennas, toget new solutions on the interpretation problems of scanning near-field optical microscope (SNOM)images. Indeed, it is known that some of the developed nano-antennas can express dipolarbehaviours. In this manuscript, we show how a bowtie nano-aperture (dipolar nano-antenna)embedded at the apex of a SNOM probe, can be used to detect and collect only one component ofthe electric near-field. This result is demonstrated as well theoretically, by the use of FDTD (FiniteDifference Time Domain) codes, as experimentally, by the characterisation with this tip, of dielectricsamples (diffraction grating and photonic crystals) and metallic ones (random plasmonic medium).In a second part, we show how the tip previously described, can be used as a detector of the signalfrom single emitter (SE). We study in this part the coupling and interactions between those twoobjects. After a full description of a two level system characteristics, we show theoretically the effectof our probe on the reduction of the excited state life time and the enhancement of thefluorescence of the SE, in both regime, saturated and non-saturated. Then we describeexperimentally how our special tip reduces the excited state life time of quantum dots placed at theapex of it, respect to more conventional SNOM probes as the dielectric and the circular apertureones.