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  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.
1

Interface circuit designs for extreme environments using SiGe BiCMOS technology

Finn, Steven Ernest 31 March 2008 (has links)
SiGe BiCMOS technology has many advantageous properties that, when leveraged, enable circuit design for extreme environments. This work will focus on designs targeted for space system avioinics platforms under the NASA ETDP program. The program specifications include operation under temperatures ranging from -180 C to +125 C and with radiation tolerance up to total ionizing dose of 100 krad with built-in single-event latch-up tolerance. To the author's knowledge, this work presents the first design and measurement of a wide temperature range enabled, radiation tolerant as built, RS-485 wireline transceiver in SiGe BiCMOS technology. This work also includes design and testing of a charge amplification channel front-end intended to act as the interface between a piezoelectric sensor and an ADC. An additional feature is the design and testing of a 50 Ohm output buffer utilized for testing of components in a lab setting.
2

<b>Development of an Electronics Testbed for Radiation Testing in Gamma and Neutron Environments</b>

Matthew M Niichel (20715647) 12 February 2025 (has links)
<p dir="ltr">This work focuses on creating a cost-effective and accessible radiation testbed within Purdue University’s sub-critical pile. The testbed is designed to assess the resilience of electronic systems exposed to gamma and neutron radiation, addressing challenges faced in nuclear, aerospace, and defense industries where electronics must function reliably in high-radiation environments. Traditional radiation testing facilities often pose limitations such as high costs, limited accessibility, and excessive neutron flux levels, making them unsuitable for low-to-medium flux testing. This research introduces a controlled and well-characterized radiation exposure environment that simulates real-world conditions for radiation-sensitive electronics, including the Defense Threat Reduction Agency’s (DTRA) Scatterable Radiation Monitor (SCRAM). The methodology includes mechanical and electronic testbed construction, radiation flux characterization using gold foil activation experiments, and real-time electronic performance assessments under radiation exposure. By leveraging Purdue’s sub-critical pile and PUR-1 reactor, the testbed offers a versatile platform for radiation hardness testing, filling a crucial gap in existing testing infrastructure. The findings validate the effectiveness of the testbed in providing moderate neutron and gamma flux environments, ensuring more reliable performance testing of radiation-hardened electronics. The study contributes to the development of standardized radiation testing methodologies and highlights the potential for broader applications in nuclear safety, environmental monitoring, and space electronics.</p>

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