This dissertation will investigate electron beam induced current (EBIC) for determining semiconductor material and device parameters. While previous experimental work on PN junction delineation using EBIC with the scanning electron microscope has resulted in resolution to approximately 10 nm, theoretical study shows the potential use of EBIC for higher resolution (nanometer) PN junction and FET channel length delineation using the transmission electron microscope. Theoretical arguments using computer simulations of electron beam generation volume, collection probability and EBIC were performed and are presented for the purpose of determining EBIC use in a 300 keV transmission electron microscope (TEM) for PN junction depth determination. Measured results indicate that by measuring thin semiconductor samples with high surface recombination velocity and by using a narrow, high-energy electron beam in the STEM mode of a transmission electron microscope, nanometer resolution may be possible. The practical and experimental limits of beam energy and semiconducting material thermal damage will be discussed.

Current simulations of atmospheric entry into both Mars and Earth atmospheres for the design of thermal protections systems (TPS) typically invoke conservative assumptions regarding surface-catalyzed recombination and the amount of energy deposited on the surface. The need to invoke such assumptions derives in part from lack of adequate experimental data on gas-surface interactions at trajectory relevant conditions. Addressing this issue, the University of Vermont's Plasma Test and Diagnostics Laboratory has done extensive work to measure atomic specie consumption by measuring the concentration gradient over various material surfaces. This thesis extends this work by attempting to directly diagnose molecular species production in air plasmas. A series of spectral models for the A-X and B-X systems of nitric oxide (NO), and the B-X system of boron monoxide (BO) have been developed. These models aim to predict line positions and strengths for the respective molecules in a way that is best suited for the diagnostic needs of the UVM facility. From the NO models, laser induced fluorescence strategies have been adapted with the intent of characterizing the relative quantity and thermodynamic state of NO produced bysurface-catalyzed recombination, while the BO model adds a diagnostic tool for the testing of diboride-based TPS materials. Boundary layer surveys of atomic nitrogen and NO have been carried out over water-cooled copper and nickel surfaces in air/argon plasmas. Translation temperatures and relative number densities throughout the boundary layer are reported. Additional tests were also conducted over a water-cooled copper surface to detect evidence of highly non-equilibrium effects in the form of excess population in elevated vibrational levels of the A-X system of NO. The tests showed that near the sample surface there is a much greater population in the v'' = 1ground state than is predicted by a Boltzmann distribution.

Mercuric Iodide is the most promising of all semiconductor materials currently under investigation for use as radiation detectors at room temperature. While substantial studies have been conducted on single crystal HgI2, polycrystalline HgI2 remains a comparatively less studied form. The HgI2 films are deposited on TEC-15 LOF glass with a Tin Oxide (SnO2) coating which acts as the growth surface and front contact. The back contact, Palladium (Pd), is deposited by sputtering through a shadow mask. The films are circular in shape with an approximate diameter of 2.5 cm and thicknesses ranging from 50-600 micro m. The film has seven contact points defined by Pd electrodes for spectral response(SR) and I-V measurements. Measurements were done on the film with a visible light source. Numerical modeling helps us understand device properties and processes that take place in operation of the device. The focus of this work was to identify loss mechanisms in photoresponse, reveal fundamental device properties, and develop a quantitative device model for MSM HgI2 thin films using the DC Device modeling simulation tool MEDICI ™. The values for input parameters were chosen from literatutheory and reasonable estimates. Comprehensive studies were performed to investigate the sensitivity of SR and light I-V characteristics to each input parameter. Surface&Bulk recombinations have been investigated in this thesis. A Single, homogeneous region with all possible combinations of carrier mobilities, surface and bulk recombination parameters was not able to explain completely the measured SR. A Two-region model with the first region (0-0.5) μ m being surface&bulk recombination dominated, and the second (0.5-300) μ m bulk recombination dominated, was able to match the complete measured SR of current devices. The key parameters determined from the simulations are the mobilities, bulk lifetimes and surface-recombination velocities at the front contact for both carriers. These are consistent with expectations based upon known single crystal properties

Mercuric Iodide in its tetragonal form has received a lot of attention for many years as a prospective room temperature X-ray and y-ray detector. Its basic properties are well suited for this purpose. Its wide band gap of 2.1eV contributes to a high dark resistivity of 1012ohm-cm or higher. A high atomic number of its constituent atoms (Hg-80, I -53) and a density of 6.3g/cm3 result in its efficient interaction with incident X-ray or y-ray radiation. Single crystalline mercuric iodide has been thoroughly studied and successfully utilized in commercial radiation detectors. But with the urgent need for large area ,low cost efficient X-ray detectors, focus has now shifted towards the development and understanding of the properties of thin film Polycrystalline Mercuric iodide detectors. Such detectors also have the advantage of being most suited for direct X-ray detection i.e. a direct conversion of incident X rays into electric signals which are then used to obtain an equivalent image in digital X-ray imaging. They also can be used in applications where a scintillator intermediate is used to generate visible light from incident high energy photons.Therefore it is important to study their optical response in order to understand and evaluate their Optical Properties. The present work focuses on obtaining the Optical response of the thin film Mercuric iodide photoconductive detectors .These films were grown on TEC-15 LOF glass with a Tin Oxide (SnO2) coating on it, which acts as a growth surface for the films and also functions as the front contact of the detector.Palladium which is sputtered on top of this film acts as the back contact. There are a total of seven contacted devices on each film sample and each device has been tested for its optical response in terms of Spectral Response and I-V characteristics in both light and dark conditions.

The picosecond optical response of five thin germanium samples was measured following intense optical excitation using two variations of the excitation and probe technique. Seven-picosecond laser pulses of wavelength 1.054 um were used to measure the optical transmission of the samples for a variety of probe delays, excitation fluences, and sample temperatures. These parametric experiments were performed in an effort to determine if carrier cooling, carrier diffusion, or carrier recombination dominates the carrier dynamics immediately following excitation. The studies of a 5.7 um thick sample indicated that Auger recombination does not dominate the carrier dynamics, but that the carriers most likely cool immediately to within a few optical phonons of the lattice temperature. Lattice heating may also occur depending on excitation level. Neither cooling nor diffusion was ruled out as a major contributor to the transient optical response. A numerical analysis indicated that, although diffusion may be minimized in the thinner samples, the importance of surface recombination increases as the sample thickness decreases. The lattice temperature dependence of the optical transmission was found not to be in disagreement with the known temperature dependence of the low-density diffusion coefficient. Finally, new structure was observed in the data which is consistent with an increased intervalence band absorption at the highest excitation levels.

Measurements of DC photocurrent-voltage characteristic, photocurrents spectral response and laser induced transient current technique enable investigation of surface recombination centers, bulk trap levels and distribution of the inner electric field. In the presented work, the n- type planar CdZnTe detectors with quasi Ohmic contacts were studied by above mentioned methods. It has been shown that in the case of strongly absorbed light under the DC regime of illumination not only surface recombination influences the detector's transport properties. The effect of the space charge, created as a consequence of carriers trapped by the impurity levels, must be taken into account. Therefore some new theoretical models were created in order to describe measured photocurrent-voltage dependencies. Obtained data were fitted with the new theory and the mobility and surface recombination velocity for electrons were determined.

Advances in space and nuclear technologies are limited by the capabilities of the conventional silicon (Si) electronics. Hence, there is a need to explore materials beyond Si with enhanced properties to operate in extreme environments. In this regards, silicon carbide (4H-SiC), a wide bandgap semiconductor, provides suitable solutions. In this thesis, radiation effects of 4H-SiC bipolar devices, circuits and dielectrics for SiC are investigated under various radiation types. We have demonstrated for the first time the radiation hardness of 4H-SiC logic circuits exposed to extremely high doses (332 Mrad) of gamma radiation and protons. Comparisons with previously available literature show that our 4H-SiC bipolar junction transistor (BJT) is 2 orders of magnitude more tolerant under gamma radiation to existing Si-technology. 4H-SiC devices and circuits irradiated with 3 MeV protons show about one order of magnitude higher tolerance in comparison to Si. Numerical simulations of the device showed that the ionization is most influential in the degradation process by introducing interface states and oxide charges that lower the current gain. Due to the gain reduction of the BJT, the voltage reference of the logic circuit has been affected and this, in turn, degrades the voltage transfer characteristics of the OR-NOR gates. One of the key advantages of 4H-SiC over other wide bandgap materials is the possibility to thermally grow silicon oxide (SiO2) and process device in line with advanced silicon technology. However, there are still questions about the reliability of SiC/SiO2 interface under high power, high temperature and radiation rich environments. In this regard, aluminium oxide (Al2O3), a chemically and thermally stable dielectric, has been investigated. It has been shown that the surface cleaning treatment prior to deposition of a dielectric layer together with the post dielectric annealing has a crucial effect on interface and oxide quality. We have demonstrated a new method to evaluate the interface between dielectric/4H-SiC utilizing an optical free carrier absorption technique to quantitative measure the charge carrier trapping dynamics. The radiation hardness of Al2O3/4H-SiC is demonstrated and the data suggests that Al2O3 is better choice of dielectric for devices in radiation rich applications. / <p>QC 20170119</p>

The demand for wide bandgap semiconductors for radiation detector applications has significantly increased in recent years due to an ever-growing need for safeguard measures and medical imaging systems amongst other applications. The need for these devices to be portable and efficient, and to operate at room temperature is important for practical applications. For radiation detectors, the semiconductor materials are mainly required to have an optimal energy gap, high average atomic number, good electrical resistivity and charge transport properties as well as purity and homogeneity. Cadmium zinc telluride (CZT) distinctly stands out among the other choices of semiconductor materials for radiation detector applications, due to its attractive material properties and the room temperature operation possibility. A tremendous amount of research is being conducted to improve CZT technology and its implementation into more commercial systems. Applications of CZT detector technology in national security, high energy physics, nuclear spectroscopy, and medical imaging systems are of special interests. However, CZT devices still face challenges that need to be understood and overcome in order to have more efficient radiation detector systems. One such challenge lies in the understanding of the surfaces of CZT detectors and surface recombination effects on charge transport, charge collection efficiency, and detector performance. Another common issue is the degradation of CZT detectors due to the presence of defects which can act as traps for the charge carriers and cause incomplete charge collection from the detectors. Thus, a major challenge is that, the commercial CZT crystals have large concentrations of defects and impurities that need to be characterized, and their effects on the detector performance should be studied. Photoluminescence (PL) spectroscopy is a sensitive, non-contact and non-destructive method, suitable to characterize lower concentrations of point defects, such as substitutional impurities (donors, acceptors) and native defects in CZT crystals. A PL spectrum provides information regarding the defect nature of the crystal by determining the presence and the type of vacancies, interstitials, and impurities in the lattice. The main objective of this thesis is to address the presence of the defects in CZT crystals, identify their types, and study their roles in the performance of x-ray radiation detectors using PL spectroscopy. Additionally, using PL method and different excitation sources including UV excitation, this thesis studies the surface of CZT samples and investigates the PL signature of the surface oxide of the samples, in an effort to optimize the surface processing and thereby improve CZT detector performance. / Graduate

Detection of mid-wavelength infrared radiation is crucial for many industrial, military and biomedical applications. Photon detectors in the market can operate at only low temperature which increases weight, power consumption and total cost. Type-II InAs/GaSb superlattice infrared detectors are expected to have a major role in the infrared detector market with providing high quality detection characteristics at higher temperatures. Therefore, in the past decade, there has been an increasing interest in infrared detectors based on type-II InAs/GaSb superlattice technology due to their long range adjustable bandgap, low tunneling current and Auger recombination rates which bring potential of high temperature operation. Characterization of this photodiodes requires detailed investigations on different aspects. This study focuses on various optical and electrical characterization techniques for single pixel infrared detectors: responsivity characterization using FTIR and blackbody source, dark I-V and R-V characterizations, response time measurement. Characterizations of detector noise with respect to frequency and bias voltage are studied in detail. These characterization techniques are carried out in order to observe the effects of design with three different &ldquo / standard&rdquo / and a new &ldquo / N&rdquo / structure designs and also to understand the effects of surface passivation with atomic layer deposited Al2O3 layer and ordinary PECVD deposited Si3N4 and SiO2 layers. When standard photodiodes are compared, we observed that the one with the thickest active absorber region has the highest response and dark current density values. &ldquo / N&rdquo / structure design photodiode has very low dark current density while its optical performance is not as high as the standard designs. Si3N4 passivation degrades both optical and electrical performances. SiO2 and Al2O3 passivation layers improve optical and electrical characteristics of photodiodes. Theoretical and experimental dark current noise values of SiO2 passivated sample in agreement up to 0.18V reverse bias while those values of unpassivated and Si3N4 passivated samples agree only at zero bias. Temperature dependent R-V characteristics of photodiodes are analyzed and the surface limited activation energy is calculated in order to investigate the additional noise. At the end, surface recombination noise is proposed to cover the deficit on the noise calculation.

abstract: A modeling platform for predicting total ionizing dose (TID) and dose rate response of commercial commercial-off-the-shelf (COTS) linear bipolar circuits and technologies is introduced. Tasks associated with the modeling platform involve the development of model to predict the excess current response in a bipolar transistor given inputs of interface (NIT) and oxide defects (NOT) which are caused by ionizing radiation exposure. Existing models that attempt to predict this excess base current response are derived and discussed in detail. An improved model is proposed which modifies the existing model and incorporates the impact of charged interface trap defects on radiation-induced excess base current. The improved accuracy of the new model in predicting excess base current response in lateral PNP (LPNP) is then verified with Technology Computer Aided Design (TCAD) simulations. Finally, experimental data and compared with the improved and existing model calculations. / Dissertation/Thesis / Masters Thesis Electrical Engineering 2017