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A three-beam lateral shearing interferometer has been developed. The three-beam shearing interferograms consist of two sets of fringes, one of which acts as a carrier whose intensity is modulated by the second set. The depth of modulation is directly proportional to the phase difference between the middle beam and the outer beams. Phase errors on the order of π/2 cause every other fringe to go from complete dark to complete bright. Therefore, phase errors much smaller than π/2 can be detected. The three-beam interferometer is implemented in three ways: (1) thin film thickness measurement, (2) surface roughness measurement, and (3) surface figure measurement. The three-beam interferometer implemented to measure thin film thickness and surface roughness is accurate to 25 Å. Surfaces with different microstructure are characterized. We have found that each of those surfaces may have one or more of the following: (1) random roughness, (2) slow waviness, and/or (3) periodic structure. The three-beam interferometer is also implemented for testing optical surfaces. The three-beam interferometer is more capable in detecting small zonal errors than the two-beam interferometer. Three-beam interferograms of different surfaces are produced and analyzed. The three-beam interferometer has many advantages: (1) it is a stable, common path interferometer, (2) white light can be instead of coherent light to get rid of the effects of speckle and dust particles, and (3) it is a very low cost interferometer.

Energy distribution measurements of sputtered neutral particles contribute to the general knowledge of sputtering, a common technique for surface analysis. In this work emphasis was placed on the measurement of energy distribution of sputtered neutral atoms from different depths. The liquid Ga-In eutectic alloy as a sample target for this study was ideal due to an extreme concentration ratio gradient between the top two monolayers. In pursuing this study, the method of sputter-initiated resonance ionization spectroscopy (SIRIS) was utilized. SIRIS employs a pulsed ion beam to initiate sputtering and tunable dye lasers for resonance ionization. Observation of the energy distribution was achieved with a position-sensitive detector. The principle behind the detector's energy resolution is time of flight (TOF) spectroscopy. For this specific detector, programmed time intervals between the sputtering pulse at the target and the ionizing laser pulse provided information leading to the energy distribution of the secondary neutral particles. This experiment contributes data for energy distributions of sputtered neutral particles to the experimental database, required by theoretical models and computer simulations for the sputtering phenomenon.

Shortened periods of inundation due to water management have led to the encroachment and expansion of Carolina willow (Salix caroliniana) in sawgrass (Cladium jamaicense) marsh communities. Morphologic and physiologic differences between sawgrass and willow have potential consequences for microhabitat conditions and ecosystem function such as a reduction in temperatures and light availability and changes in primary productivity. Since it is a woody shrub, willow is often assumed to exhibit higher rates of transpiration than non woody plants, which in turn can affect photosynthesis and carbon exchange and ultimately wetland water management. In this study willow was found to have higher rates of stomatal conductance (gs) and photosynthesis (Anet) than sawgrass. However, sawgrass had greater intrinsic water use efficiency (WUE) than willow. This suggests that willow is capable of greater gas exchange and carbon assimilation than sawgrass but requires more water. Understanding the implications of willow expansion will improve landscape models of wetland water and carbon exchange and inform water management decisions. / Includes bibliography. / Thesis (M.S.)--Florida Atlantic University, 2015. / FAU Electronic Theses and Dissertations Collection

by Ka-wai Wong. / Thesis (M.Phil.)--Chinese University of Hong Kong, 1995. / Includes bibliographical references (leaves 106-109). / TABLE OF CONTENTS --- p.i / ABSTRACT --- p.v / LIST OF FIGURES --- p.vi / LIST OF TABLES --- p.xi / LIST OF ABBREVIATIONS --- p.x / Chapter Chapter 1 --- Research Background --- p.1 / Chapter 1.1 --- Introduction --- p.1 / Chapter 1.2 --- The effect of solid acceptance angle --- p.2 / Chapter 1.3 --- Research goals --- p.4 / Chapter 1.3.1 --- Determination of the electron spectrometer transmission function --- p.4 / Chapter 1.3.2 --- Novel depth profiling technique by adjusting the solid acceptance angle --- p.6 / Chapter 1.3.3 --- Correction to conventional ARXPS --- p.8 / Chapter 1.4 --- Thesis Structure --- p.8 / Chapter Chapter 2 --- Fundamentals of X-ray Photoelectron Spectroscopy --- p.9 / Chapter 2.1 --- Introduction --- p.9 / Chapter 2.2 --- X-ray Photoelectron Spectroscopy (XPS) --- p.9 / Chapter 2.2.1 --- Basic principles --- p.9 / Chapter 2.2.2 --- Surface sensitivity --- p.11 / Chapter 2.2.3 --- A typical XPS spectrum --- p.13 / Chapter 2.3 --- Qualitative analysis --- p.16 / Chapter 2.3.1 --- Binding energy --- p.16 / Chapter 2.3.2 --- Chemical state information --- p.17 / Chapter 2.4 --- Quantitative analysis --- p.20 / Chapter 2.4.1 --- Factors affecting intensity --- p.20 / Chapter 2.4.2 --- Homogeneous materials --- p.22 / Chapter 2.4.3 --- Layer structure --- p.23 / Chapter Chapter 3 --- Instrumentation --- p.26 / Chapter 3.1 --- XPS spectrometer --- p.26 / Chapter 3.1.1 --- Magnetic immersion lens system --- p.26 / Chapter 3.1.2 --- Tunable iris --- p.29 / Chapter 3.1.3 --- Scan plates --- p.29 / Chapter 3.1.4 --- Input lens aperture --- p.32 / Chapter 3.2 --- Calibration of the iris --- p.32 / Chapter 3.3 --- Applications --- p.35 / Chapter 3.3.1 --- Two dimensional XPS imaging --- p.35 / Chapter 3.3.2 --- ARXPS --- p.37 / Chapter 3.4 --- Summary --- p.37 / Chapter Chapter 4 --- Determination of electron spectrometer transmission function --- p.38 / Chapter 4.1 --- Introduction --- p.38 / Chapter 4.2 --- Traditional method of determination --- p.39 / Chapter 4.3 --- Methodology of the novel approach --- p.40 / Chapter 4.4 --- Calculation Procedures and Results --- p.48 / Chapter 4.5 --- Results and Discussions --- p.50 / Chapter 4.6 --- Conclusions --- p.57 / Chapter Chapter 5 --- "Depth Profiling by Adjusting the Solid Acceptance Angle: a Starting Point to “ Three-Dimensional Imaging""" --- p.59 / Chapter 5.1 --- Introduction --- p.59 / Chapter 5.2 --- Theoretical Background --- p.60 / Chapter 5.2.1 --- Quantification of Intensity --- p.60 / Chapter 5.3 --- Experimental --- p.69 / Chapter 5.3.1 --- Operation --- p.69 / Chapter 5.3.2 --- Calibration of iris --- p.70 / Chapter 5.3.3 --- Novel depth profile by adjusting the solid acceptance angle --- p.71 / Chapter 5.4 --- Results and Discussions --- p.71 / Chapter 5.4.1 --- Depth Profiles --- p.71 / Chapter 5.4.2 --- "Concept of ""Three-Dimensional XPS Imaging""" --- p.72 / Chapter 5.5 --- Conclusions --- p.76 / Chapter Chapter 6 --- Correction to Quantitative X-ray Photoelectron Spectroscopy with Consideration of the Solid Acceptance Angle --- p.79 / Chapter 6.1 --- Introduction --- p.79 / Chapter 6.2 --- The effect of the solid acceptance angle --- p.80 / Chapter 6.3 --- Theoretical Background --- p.83 / Chapter 6.4 --- Results and Discussions --- p.87 / Chapter 6.4.1 --- Homogeneous Sample --- p.87 / Chapter 6.4.2 --- Layer structure --- p.90 / Chapter 6.4.3 --- Simulation plots and further investigation --- p.92 / Chapter 6.5 --- Conclusions --- p.101 / Chapter Chapter 7 --- Conclusion --- p.103 / Acknowledgment --- p.105 / References --- p.106

Photovoltaic (PV) devices based on PbS quantum dot (QD) solids demonstrate high photon-to-electron conversion yields. However, record power conversion efficiencies remain limited mainly due to bulk and interfacial defects in the light absorbing material (QD solids). Interfacial defects can be formed when a semiconductor, such as QD solid, is contacted by another material and may predetermine the semiconductor/metal or semiconductor/metal-oxide junction properties. The objective of the work described in this dissertation was set to explore whether electrochemical contacting using liquid electrolytes can provide sufficient means of contacting the QD solids to investigate their PV performance without introducing the unwanted interfacial defects. I have initially focused on optimizing processing conditions for efficient QD solids deposition and studied their photovoltaic properties in a standardized solid-state, depleted heterojunction solar cell configuration. Further, a liquid contacting method was developed to study the relationship between photovoltages of QD solids and the energetics (e.g. reduction potentials) of the liquid contacting media. This electrochemical contacting of PbS QD solids was achieved by using anhydrous liquid electrolytes containing fast, non-coordinating, outer-sphere redox couples. Depending on the energetics of a redox couple, both rectifying and non-rectifying (Ohmic) PbS QD solid/electrolyte junctions were successfully formed with both p- and n-type QD solids. Furthermore, application of the liquid solution contacting method in studies of the PbS QD solids has unprecedentedly demonstrated that an ideal behavior of the photovoltage changes with respect to the changes in the energetics of the contacting media can be achieved. This fact supports the initially proposed hypothesis that such liquid contacting method will not introduce surface defects to the studied QD materials, allowing for their intrinsic properties to be better understood. The applicability of this method to both p- and n- type QD solids was demonstrated. Finally, a better understanding of the relationships between the surface and ligand chemistries of both p- and n-type QD solids and their photovoltaic properties was possible via applications of such method in conjunction with XPS and UPS studies.

The thermal contact conductance (TCC) between two machined pieces of stainless steel was studied. A guarded hot plate thermal conductivity test fixture was designed and built for the experiment. Factors investigated included the contact pressure, surface roughness, interface material and average test temperature. The contact pressure at the interface ranged from 80 to 800 psi. The mean surface roughness of the opposing surfaces was 2.8 ��in (.0708 ��m) parallel to the sanding direction and 1.9 ��in (.0482 ��m) perpendicular to the sanding direction. Interface materials included air, indium foil, copper foil, Teflon tape, silver filled paint and thermal grease. Average test temperatures ranged from 0��C to 100��C, in 20��C increments. With air alone in the interface gap the TCC was nearly insensitive to contact pressure. The thermal grease and silver filled paint most increased the TCC over air alone while being nearly insensitive to pressure. With indium foil the TCC was similar to air, but improved somewhat with increasing pressure. With copper foil the TCC was lower than air alone, but increased with increasing pressure. The Teflon tape had a lower TCC than air at low contact pressure, but a higher TCC than air at higher pressures. In general the TCC improved somewhat at higher temperatures. The ability of an interface material to improve the TCC is more a function of its flow stress and wetting ability than its thermal conductivity. An existing mathematical model was used to predict the TCC with air as the interface material, and was found to over-estimate the TCC by an order of magnitude. It was found that the model did not accurately predict the effective surface spacing for very smooth surfaces as used in this work. When a modification for smooth contact surfaces was incorporated into the model it yielded results that were consistent with experimental results. / Graduation date: 1999

Thesis (Ph. D.)--Institute of Paper Chemistry, 1969. / Includes bibliographical references (p. 90-92).