This thesis documents the findings of an intrinsic case study examining the impacts of a digital or e-classroom environment on the social, affective, and cognitive development of a group of 33 year 5 and 6 students, in an urban primary school in Northland, New Zealand.It examines the manner in which the e-classroom concept was developed and implemented, the rationale behind its development, and the role of key players in this process. It further examines the impact of this environment on student work processes and practices, and identifies the unique blend of teacher philosophy, curriculum design and organisation, and computer application that comprised the learning environment for these students.Results of this study indicate particular issues associated with the successful operation of this e-classroom. These issues relate to such aspects as difficulties in managing and monitoring student progress when engaged in the multiplicity of learning tasks enabled by such an environment, the importance of student group composition and selection, the limitations of computers in supporting important knowledge development, and the manner in which students interact with and manipulate the features of software.The thesis concludes by presenting an analysis of the impact that these, and other vital areas of student engagement with computers, have on the effectiveness of utilising technological resources in this manner. It presents a series of recommendations for changes to improve the effectiveness of the learning environment in this e-classroom, and identifies a series of considerations for other schools considering undertaking similar initiatives.

This thesis aims to explicate the claim that in Heidegger&#039 / s thinking techn

Die Arbeit beschäftigt sich mit der Erweiterung der für dicke Proben schon mit Erfolg eingesetzten Werkstoffanalytischen Methode Elektronenstrahl-Mikroanalyse (ESMA) mittels Peak/Untergrund-Verhältnissen auf die Analyse von dünnen Schichten (unter 1 μm) zur qualitative und quantitativen Elementanalyse sowie zur Ermittlung von Schichtdicken. Weiterhin wird auf der Basis von einer ESMA-Methode für zwei dünne Schichten auf einem Substrat wird ein Modell zur Ermittlung des Phasenwachstumskoeffizienten für eine intermetallische Phase die sich bei der Diffusion zwischen einer dünnen Schicht und einem Substrat bildet, mittels ESMA-Messungen bei gleichzeitiger Erwärmung der Probe dargestellt. / The paper deals with the application of the materials analysis method EPMA by peak-to-background ratios, which is currently being used for the analysis of thick samples successfully, to thin layers (less than 1 μm) for the quantitative element analysis as well as for thickness prediction. In addition a model has been established on the Basis of an EPMA method for two films on a substrate for deriving the phase growth coefficient of an inter-metallic phase which grows during the diffusion between a thin layer and a substrate from EPMA measurements while simultaneously heating the sample.

Die Arbeit beschäftigt sich mit der Erweiterung der für dicke Proben schon mit Erfolg eingesetzten Werkstoffanalytischen Methode Elektronenstrahl-Mikroanalyse (ESMA) mittels Peak/Untergrund-Verhältnissen auf die Analyse von dünnen Schichten (unter 1 μm) zur qualitative und quantitativen Elementanalyse sowie zur Ermittlung von Schichtdicken. Weiterhin wird auf der Basis von einer ESMA-Methode für zwei dünne Schichten auf einem Substrat wird ein Modell zur Ermittlung des Phasenwachstumskoeffizienten für eine intermetallische Phase die sich bei der Diffusion zwischen einer dünnen Schicht und einem Substrat bildet, mittels ESMA-Messungen bei gleichzeitiger Erwärmung der Probe dargestellt. / The paper deals with the application of the materials analysis method EPMA by peak-to-background ratios, which is currently being used for the analysis of thick samples successfully, to thin layers (less than 1 μm) for the quantitative element analysis as well as for thickness prediction. In addition a model has been established on the Basis of an EPMA method for two films on a substrate for deriving the phase growth coefficient of an inter-metallic phase which grows during the diffusion between a thin layer and a substrate from EPMA measurements while simultaneously heating the sample.