The carrier capture and relaxation of Type II ZnTe/ZnSe quantum dots(QDs) were investigated with ultrafast photoluminescence upconversion. We found that carrier relaxation of QDs under Volmer-Weber(VW) growth mode exhibits faster decay and rise than that of QDs under Stranski-Krastanow(SK) growth mode due to the wetting layer in SK growth mode provides as a pathway for carriers to diffuse and migrate from large(small) to small (larger) QDs. The wetting layer level was found by analyze the decay time of PL with different wavelength and temperature. The PL of VW mode and SK mode by using 532nm Nd-YAG laser also prove the existence of wetting layer. We interpret our results of VW mode in terms of Auger process with large carrier density.

Carrier dynamics of mullti-stacked quantum dots (MSQDs) have been studied by means of time-integrated and time-resolved photoluminescence (PL). The MSQD with different spacer thickness of 10, 15, 20 and 30 nm were grown by molecular beam epitaxy. Time-integrated PL exhibit red shift as spacer thickness increases. The red shift originated from the vertical coupling relaxes the strain in the MSQDs, leading to a decrease in the PL peak energy. From time-resolved PL, the MSQD with spacer thickness increased reveals the shorter lifetime of PL peak among samples studies. We attribute the maximum of lifetime to a better vertical alignment. We report on a measurement of the rise and decay of luminescence intensity in the MSQDs excited at 1.54 eV (808 nm) and 3.09 eV (404 nm). The results show a slow rise time of electrons from the L to the £F valley for high photoexcitation energies. The decay in luminescence is longest with photoexcitation at 3.09 eV, we demonstrate the importance of the penetration depth and carriers tunneling. In addition, the MSQDs strongly depends of on the carrier injection. The rise times decrease with increasing excitation density. The properties are characteristic features of Auger processes.