- About
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The Global ETD Search service is a free service for researchers
to find electronic theses and dissertations. This service is
provided by the
Networked Digital Library of Theses and Dissertations.
Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.
Search results
Showing 21 to 30 of 96 (0.08 seconds)| 21 |
A performance based, multi-process cost model for solid oxide fuel cellsWoodward, Heather Kathleen. January 2003 (has links)
Thesis (M.S.)--Worcester Polytechnic Institute. / Keywords: Solid oxide fuel cell; SOFC; cost model; sputtering; tape casting; screen printing; performance model; process yield model. Includes bibliographical references (p. 93).
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Tolerance investigation at medial spatial frequenciesShafer, John Harold, 1939- January 1972 (has links)
No description available.
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A method for integrating form errors into tolerance analysisPierce, Robert Scott 08 1900 (has links)
No description available.
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Fault tolerance control of complex dynamical systemsClements, N. Scott 05 1900 (has links)
No description available.
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Statistical tolerance limits for a Pearson type III distributionFontane, Darrell Glenn 05 1900 (has links)
No description available.
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Modeling and simulation of fault tolerant properties of quantum-dot cellular automata devicesPadgett, Benjamin David. January 2010 (has links)
I present a theoretical study of fault tolerant properties in Quantum-dot Cellular Automata (QCA) devices. The study consists of modeling and simulation of various possible manufacturing, fabrication and operational defects. My focus is to explore the effects of temperature and dot displacement defects at the cell level of various QCA devices. Results of simple devices such as binary wire, logical gates, inverter, cross-over and XOR will be presented. A Hubbard-type Hamiltonian and the inter-cellular Hartree approximation have been used for modeling the QCA devices. Random distribution has been used for defect simulations. In order to show the operational limit of a device, defect parameters have been defined and calculated. Results show fault tolerance of a device is strongly dependent on the temperature as well as on the manufacturing defects. / Cell design -- Basic logic gates -- The exclusive or gate. / Department of Physics and Astronomy
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Designing orthogonal Gough-Stewart platforms with robust fault toleranceAphale, Sumeet S. January 2005 (has links)
Thesis (Ph. D.)--University of Wyoming, 2005. / Title from PDF title page (viewed on March 4, 2008). Includes bibliographical references (p. 95-102).
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Fault tolerant N-DOF Gough-Stewart platforms kinematics, dynamics, and design /Yi, Yong. January 2005 (has links)
Thesis (Ph. D.)--University of Wyoming, 2005. / Title from PDF title page (viewed on Nov. 2, 2007). Includes bibliographical references (p. 94-99).
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Cost tolerance optimization for piecewise continuous cost tolerance functionsShehabi, Murtaza Kaium. January 2002 (has links)
Thesis (M.S.)--Ohio University, 2002. / Title from PDF t.p.
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Integrated quality control planning in computer-aided manufacturing planningYang, Yihong. January 2007 (has links)
Thesis (Ph. D.)--Worcester Polytechnic Institute. / Keywords: In-process inspection; tolerance assignment; tolerance stack-up analysis; quality control planning. Includes bibliographical references (leaves 136-148).
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