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Improved Signal Integrity in IEEE 1149.1 Boundary Scan Designs

This work is an analysis of solutions to problems derived from inherent timing and signal integrity issues in the use and application of the IEEE 1149.1 Standard at the board level in conjunction with its test system. Setup or hold times violations may occur in a boundary scan chain using IEEE 1149.1 compliant devices. A practical study of the TDI-TDO scan data path has been conducted to show where problems may arise in relationship to a particular board topology and test system. This work points to differences between passing and failing scan path tests for problem characterization. Serial data flow is then analyzed and suitability is discussed. Within certain conditions, a solution is proposed. This work has been shown to work on the test system. Recommendations are made based on this experimental approach.

Identiferoai:union.ndltd.org:BGMYU2/oai:scholarsarchive.byu.edu:etd-1667
Date04 November 2004
CreatorsTaboada, Efren De Jesus Rangel
PublisherBYU ScholarsArchive
Source SetsBrigham Young University
Detected LanguageEnglish
Typetext
Formatapplication/pdf
SourceTheses and Dissertations
Rightshttp://lib.byu.edu/about/copyright/

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