The advent of deep submicron technology coupled with ever increasing demands from the customer for more functionality on a compact silicon real estate has led to a proliferation of highly complex integrated RF system-on-chip (SoC) and system-on-insulator (SoI) solutions. The use of scaled CMOS technologies for high frequency wireless applications is posing daunting technological challenges both in design and manufacturing test.
To ensure market success, manufacturers need to ensure the quality of these advanced RF devices by subjecting them to a conventional set of production test routines that are both time consuming and expensive. Typically the devices are tested for parametric specifications such as gain, linearity metrics, quadrature mismatches, phase noise, noise figure (NF) and end-to-end system level specifications such as EVM (error vector magnitude), BER (bit-error-rate) etc. Due to the reduced visibility imposed by high levels of integration, testing for parametric specifications are becoming more and more complex.
To offset the yield loss resulting from process variability effects and reliability issues in RF circuits, the use of self-healing/self-tuning mechanisms will be imperative. Such self-healing is typically implemented as a test/self-test and self-tune procedure and is applied post-manufacture. To enable this, simple test routines that can accurately diagnose complex performance parameters of the RF circuits need to be developed first. After diagnosing the performance of a complex RF system appropriate compensation techniques need to be developed to increase or restore the system performance. Moreover, the test, diagnosis and compensation approach should be low-cost with minimal hardware and software overhead to ensure that the final product is economically viable for the manufacturer.
The main components of the thesis are as follows:
1) Low-cost specification testing of advanced radio frequency front-ends:
Methodologies are developed to address the issue of test cost and test time associated with conventional production testing of advanced RF front-ends. The developed methodologies are amenable for performing self healing of RF SoCs. Test generation algorithms are developed to perform alternate test stimulus generation that includes the artifacts of test signal path such as response capture accuracy, load-board DfT etc. A novel cross loop-back methodology is developed to perform low cost system level specification testing of multi-band RF transceivers. A novel low-cost EVM testing approach is developed for production testing of wireless 802.11 OFDM front-ends. A signal transformation based model extraction technique is developed to compute multiple RF system level specifications of wireless front-ends from a single data capture. The developed techniques are low-cost and facilitate a reduction in the overall contribution of test cost towards the manufacturing cost of advanced wireless products.
2)Analog tuning methodologies for compensating wireless RF front ends:
Methodologies for performing low-cost self tuning of multiple impairments of wireless RF devices are developed. This research considers for the first time, multiple analog tuning parameters of a complete RF transceiver system (transmitter and receiver) for tuning purposes. The developed techniques are demonstrated on hardware components and behavioral models to improve the overall yield of integrated RF SoCs.
| Identifer | oai:union.ndltd.org:GATECH/oai:smartech.gatech.edu:1853/37165 |
| Date | 13 October 2010 |
| Creators | Natarajan, Vishwanath |
| Publisher | Georgia Institute of Technology |
| Source Sets | Georgia Tech Electronic Thesis and Dissertation Archive |
| Detected Language | English |
| Type | Dissertation |
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