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Submitted by Gabriela Lopes (gmachadolopesufpel@gmail.com) on 2018-07-10T18:02:49Z No. of bitstreams: 1 DISSERTAÇÃO Alexsandro Martins da Silva.pdf: 297395 bytes, checksum: 65d3b63d699f4425cb634f0012fb96c4 (MD5) / Approved for entry into archive by Aline Batista (alinehb.ufpel@gmail.com) on 2018-07-16T17:08:22Z (GMT) No. of bitstreams: 1 DISSERTAÇÃO Alexsandro Martins da Silva.pdf: 297395 bytes, checksum: 65d3b63d699f4425cb634f0012fb96c4 (MD5) / Approved for entry into archive by Aline Batista (alinehb.ufpel@gmail.com) on 2018-07-16T17:17:52Z (GMT) No. of bitstreams: 1 DISSERTAÇÃO Alexsandro Martins da Silva.pdf: 297395 bytes, checksum: 65d3b63d699f4425cb634f0012fb96c4 (MD5) / Made available in DSpace on 2018-07-16T17:18:03Z (GMT). No. of bitstreams: 1 DISSERTAÇÃO Alexsandro Martins da Silva.pdf: 297395 bytes, checksum: 65d3b63d699f4425cb634f0012fb96c4 (MD5) Previous issue date: 2016-06-03 / Para oferecer aos agricultores sementes de soja com qualidade e na quantidade demandada, as empresas sementeiras devem implementar eficientes processos de controle interno de qualidade, visando aferir a constantemente a germinação e o vigor das sementes. A presente pesquisa teve como objetivo averiguar o processo de controle de qualidade interno na Sementes São Francisco Rio Verde, Goiás. O trabalho foi realizado em laboratório de empresa sementeira na cidade de Rio Verde - GO. Foram utilizados 272 lotes de sementes de soja da cultivar NA 5909 RG, categoria S1, da safra 2014/2015. Os testes avaliados foram: tetrazólio précondicionado por 16 horas, envelhecimento acelerado por 72 horas, teste de germinação, teste de solo e emergência em areia. Os resultados demonstraram que os testes de envelhecimento acelerado e tetrazólio são confiáveis no controle de qualidade de lotes de soja. Conclui-se que os lotes apresentaram vigor e viabilidade satisfatórios, porém, o teste de germinação 180 dias após a colheita, demonstrou queda da viabilidade. / To provide soybean farmers with quality and quantity demanded, the seed companies should implement efficient internal quality control processes to assess the constantly germination and seed vigor. This study aimed to verify the internal quality control process in soybean seed company, in Rio Verde, Goiás. The essay was carried out in laboratory of a seed company in the Rio Verde-GO city. Were used 271 soybean seeds lots of the cultivar IN 5909 RG, category S1 cultivated in the agricultural year of 2014/2015. The tests evaluated were tetrazolium test with preconditioned for 16 hours, accelerated aging test for 72 hours, standard germination test, soil test and emergence in sand. The results showed that the accelerated aging test and tetrazolium test are reliable for use in intern quality control of soybean seeds lots. It has concluded that the lots had satisfactory vigor and viability, however, the germination test 180 days after harvested decreased in viability.

Made available in DSpace on 2014-08-20T13:44:29Z (GMT). No. of bitstreams: 1 dissertacao_alexandro_de_paula.pdf: 1347086 bytes, checksum: 5f7aa723fd96d4d6ee7beb8f49b68039 (MD5) Previous issue date: 2012-11-01 / The main goal of this study was to determine the best harvesting time of seed capsule so that the tobacco seed (Nicotiana tabacum L.) presents the best germination percentage and vigor, seeking a combination of maturity, vigor and germination. The study was conducted in the 2010/2011 crop season, at the Agronomic Center of Universal Leaf Tobacco Company, in Rio Pardo, RS, using the hybrid seed of Virginia type ULT 163,. Five sampling periods were established as treatment in a field of commercial production of tobacco seeds (T1 - 30% dry capsules and green sepals, T2 - 90% dry capsules and green sepals; T3 - dried capsules and dried sepals; T4 - 50 % dry stalk; T5 - 100% dry stalk) with eight replicates each treatment. There were germination and vigor, first germination and accelerated aging. It was found that the tobacco harvest seeds from hybrid cultivar ULT 163 may be performed without significant changes in germination and vigor among treatments T3 to T5 consisting of sepals and capsule brown in color until the total drying peduncle. / O objetivo deste trabalho foi verificar qual o melhor momento de colheita da cápsula de sementes de modo que a semente de tabaco (Nicotiana tabacum L.) apresente o maior vigor e a maior porcentagem de germinação, buscando uma combinação entre maturidade, vigor e germinação. O trabalho foi desenvolvido no Centro Agronômico da empresa Universal Leaf Tabacos LTDA., em Rio Pardo, RS, utilizando o híbrido de semente tipo Virgínia ULT 163, na safra 2010/2011. Estabeleceram-se cinco momentos de colheita como tratamentos em uma lavoura para produção comercial de sementes de tabaco (T1 30% das capsulas secas e sépalas verdes; T2 90% das capsulas secas e sépalas verdes; T3 capsulas secas e sépalas secas; T4 50% pedúnculo seco; T5 100% pedúnculo seco), com oito repetições cada. Realizaram-se testes de germinação e de vigor - primeira contagem de germinação e envelhecimento acelerado. Verificou-se que a colheita das sementes de tabaco da cultivar híbrida ULT 163 pode ser realizada sem alterações significativas na germinação e no vigor entre os tratamentos T3 a T5 que consiste da cápsula e sépalas na cor marrom até a secagem total do pedúnculo.

Ces travaux de thèses présentent un protocole expérimental d’évaluation de la fiabilité des transistors bipolaire à double hétéro-jonction submicroniques sur substrat InP. Les mécanismes de défaillances observés ont été mis en évidence grâce à ce protocole qui présente trois étapes : activation, détection et localisation des mécanismes de défaillance. Les tests de vieillissement accéléré ont été réalisés sur les TBH de structure hexagonale avec une base en InGaAs ou en GaAsSb ainsi que les structures TLM. Grâce à l’analyse électrique via la modélisation compacte, nous établissons les premières hypothèses sur l’origine physique des mécanismes de dégradation. Pour les transistors avec une base InGaAs, par exemple, les mécanismes de défaillance mis en évidence sont localisés:- A la périphérie d’émetteur entrainant ainsi une augmentation du courant de base pour VBE<0,6 V pour les tests sous contrainte thermique ainsi que sous contraintes thermique et électrique.- A la jonction base-émetteur, provoquant l’augmentation du courant de base et de collecteur respectivement pour VBE>0,6 V et 0.2<VBE<0,8 V.- Au niveau du contact ohmique d’émetteur, entrainant une dégradation des courants pour VBE>0,8 V. Cette diminution du courant est plus visible sur le courant de collecteur.Ces hypothèses ont été validées avec l’analyse physique 2D avec le logiciel TCAD Sentaurus. Des signatures électriques similaires ont été observées dans la bibliographie par de plusieurs auteurs. / This work presents the implementation of an experimental procedure to evaluate the failure mechanisms of submicron Heterojunction Bipolar Transistor on InP substrate. This procedure presents 3 steps: activation, detection and localization of the failure mechanisms. The accelerated aging tests have been used to active the failure mechanisms on hexagonal shape HBTs with InGaAs or GaAsSb base together with TLM. Due to the electrical analysis through the compact modelling, we established the first hypothesis about the origin of the failure mechanisms. For example, on InGaAs HBT, the failure mechanisms observed are located:- At the emitter sidewall. This mechanism leads to the increase of the base current for VBE<0.6 V- At the base-emitter junction leading to the increase of base and collector current for VBE>0,6 V and 0.2<VBE<0,8 V respectively.- And the ohmic contact layer leading to the collector current decrease for VBE>0.8 V.These hypotheses were validated by 2D physical simulation using TCAD Sentaurus. The same electrical signatures of the failure mechanisms are observed in literature.

The dissertation thesis with the topic „Simulation Modelling of Electrical Drives for Selected Critical Applications“ focuses on the area of given applications in civil aviation. The selected application that the thesis deals with is an electrically driven and electronically controlled fuel pump supplying fuel to an aviation motor of the APU type. The thesis gives a comprehensive description of the design cycle of the unit and demonstrates implementing all the required critical functions. In the course of the design of the unit modern techniques in mathematical modelling, simulation, verification, monitoring and prediction of the operation status of airborne equipment were uses to the utmost extent. The purpose of these was to show the suitability of their application with regard to decreasing design time and cost, increasing lifetime and servicing intervals, as well as increasing user comfort and decreasing price. At the same time the required reliability was to be kept. The thesis also aims to prove and verify the suitability of using electronically commutated dc motors in critical applications in civil aviation. To reach this goal, it is necessary to design a robust drive control which would meet the given reliability requirements.

The dissertation thesis with the topic „Simulation Modelling of Electrical Drives for Selected Critical Applications“ focuses on the area of given applications in civil aviation. The selected application that the thesis deals with is an electrically driven and electronically controlled fuel pump supplying fuel to an aviation motor of the APU type. The thesis gives a comprehensive description of the design cycle of the unit and demonstrates implementing all the required critical functions. In the course of the design of the unit modern techniques in mathematical modelling, simulation, verification, monitoring and prediction of the operation status of airborne equipment were uses to the utmost extent. The purpose of these was to show the suitability of their application with regard to decreasing design time and cost, increasing lifetime and servicing intervals, as well as increasing user comfort and decreasing price. At the same time the required reliability was to be kept. The thesis also aims to prove and verify the suitability of using electronically commutated dc motors in critical applications in civil aviation. To reach this goal, it is necessary to design a robust drive control which would meet the given reliability requirements.

Les technologies de transistors bipolaires à hétérojonctions (HBT) ont montré leur efficacité pour permettre aux circuits de traiter les grands signaux au delà de 100Gbit/s pour les réseaux optiques Ethernet. Pour assurer ce résultat, une bonne fiabilité doit être garantie. Des tests de vieillissements accélérés sous contraintes thermiques et électrothermiques sont réalisés et analysés avec les outils de simulation physique Sentaurus TCAD afin d’obtenir les lois de vieillissement physiques. Le modèle compact HICUM niveau 2, basé sur la physique, est utilisé pour modéliser précisément le composant avant vieillissement, puis pour ajuster les caractéristiques intermédiaires pendant le vieillissement. L’évolution des paramètres du modèle est décrit avec des équations appropriées pour obtenir un modèle électrique compact du vieillissement basé sur la physique. Les lois de vieillissement et les équations d’évolutions des paramètres avec le temps de contrainte sont implantées dans le modèle électrique de vieillissement en langage Verilog-A, ce qui permet de simuler l’impact des mécanismes de défaillances sur le circuit en conditions opérationnelles. / Modern InP Heterojunction Bipolar Transistors (HBT) technology has shown its efficiency for making large signal ICs working above 100 Gbits/s for Ethernet optical transport network. To full-fill this expectation, a good reliability has to be assured. Accelerated aging tests under thermal and electro-thermal stress conditions are performed and analyzed with Sentaurus TCAD device simulation tools to achieve the physical aging laws. The physics based advanced bipolar compact model HICUM Level 2 is used for precise modeling of the devices before aging. The HICUM parameters are extracted to fit the intermediate characterizations during aging. The evolution of the model parameters is described with suitable equations to achieve a physics based compact electrical aging model. The aging laws and the parameter evolution equations with stress time are implemented in compact electrical aging model in Verilog-A languages which allows us to simulate the impact of device failure mechanisms on the circuit in operating conditions.