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Distance Estimation of Two Distance SensorsVamsi Bhargav, Kamuju, Aditya Pavan Kumar, Yenuga January 2022 (has links)
In modern world sensors play important role where they help to acquire information about the procecess, such as temperature, velocity,distance, etc. Based on this information acquired from the sensorsdecisions can be made, for example to increase heating in the buildingor accelerate the car.In many cases, a single sensor type cannot provide enough information for complex decision making, for example, when the physicalproperties of the process are outside of the measurement range of thesensor. As a result, in order to achieve desired performance levels, acombination of sensors should be used in an integrated manner.Sensor generated data need to be processed into information throughthe use of appropriate decision making models in order to improveoverall performance. Here we compare two sensors which are shortrange and long-range sensor. We use a short-range and long-rangesensor, and calculates the distance from both sensors to the same object by using Arduino UNO microcontroller. The sensors that we usein our work have overlapping or common interval in their measurementranges. Therefore we investigated how we can make a decision aboutthe distance to an object when the acquired data from both sensors isin that common range.
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DEVELOPING AN APPROACH TO IMPROVE BETA-PHASE PROPERTIES IN FERROELECTRIC PVDF-HFP THIN FILMSAshley S Dale (8771429) 02 May 2020 (has links)
Improved fabrication of poly(vinylindenefluoride)-hexafluoropropylene (PVDF-HFP) thin films is of particular interest due to the high electric coercivity found in the beta-phase structure of the thin film. We show that it is possible to obtain high-quality, beta-phase dominant PVDF-HFP thin films using a direct approach to Langmuir-Blodgett deposition without the use of annealing or additives. To improve sample quality, an automated Langmuir-Blodgett thin film deposition system was developed; a custom dipping trough was fabricated, a sample dipping mechanism was designed and constructed, and the system was automated using custom LabVIEW software. Samples were fabricated in the form of ferroelectric capacitors on substrates of glass and silicon, and implement a unique step design with a bottom electrode of copper with an aluminum wetting layer and a top electrode of gold with an aluminum wetting layer. Samples were then characterized using a custom ferroelectric measurement program implemented in LabVIEW with a Keithley picoammeter/voltage supply to confirm electric coercivity properties. Further characterization using scanning electron microscopy and atomic force microscopy confirmed the improvement in thin film fabrication over previous methods.
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Developing an approach to improve beta-phase properties in ferroelectric pvd-hfp thin filmsDale, Ashley S. 05 1900 (has links)
Indiana University-Purdue University Indianapolis (IUPUI) / Improved fabrication of poly(vinylindenefluoride)-hexafluoropropylene (PVDF-HFP) thin films is of particular interest due to the high electric coercivity found in the beta-phase structure of the thin film. We show that it is possible to obtain high-quality, beta-phase dominant PVDF-HFP thin films using a direct approach to Langmuir-Blodgett deposition without the use of annealing or additives. To improve sample quality, an automated Langmuir-Blodgett thin film deposition system was developed; a custom dipping trough was fabricated, a sample dipping mechanism was designed and constructed, and the system was automated using custom LabVIEW software. Samples were fabricated in the form of ferroelectric capacitors on substrates of glass and silicon, and implement a unique step design with a bottom electrode of copper with an aluminum wetting layer and a top electrode of gold with an aluminum wetting layer. Samples were then characterized using a custom ferroelectric measurement program implemented in LabVIEW with a Keithley picoammeter/voltage supply to confirm electric coercivity properties. Further characterization using scanning electron microscopy and atomic force microscopy confirmed the improvement in thin film fabrication over previous methods.
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