The optical design of a soft X-ray (90-1100~eV) emission spectrometer for the Resonant Elastic and Inelastic X-ray Scattering (REIXS) beamline to be implemented at the CLS is presented. An overview of soft X-ray optical theory as it relates to diffraction gratings is given. The initial constraints and the process that led to this design are outlined. Techniques and software tools that were developed, using ray-tracing and diffraction grating efficiency calculations, are discussed. The analysis completed with these tools to compare existing soft X-ray emission spectrometer designs is presented. Based on this analysis, a new design with superior performance for this application is proposed and reviewed. This design employs Rowland circle geometry to achieve a resolving power in excess of 2,500 in the range of interest. In addition, a novel design is proposed for a larger extremely high resolution spectrometer which will provide resolving powers exceeding 10,000 throughout the higher end of this range. A review is given of research into the components, manufacturing techniques and tolerances that will be required to produce this spectrometer.

The optical design of a soft X-ray (90-1100~eV) emission spectrometer for the Resonant Elastic and Inelastic X-ray Scattering (REIXS) beamline to be implemented at the CLS is presented. An overview of soft X-ray optical theory as it relates to diffraction gratings is given. The initial constraints and the process that led to this design are outlined. Techniques and software tools that were developed, using ray-tracing and diffraction grating efficiency calculations, are discussed. The analysis completed with these tools to compare existing soft X-ray emission spectrometer designs is presented. Based on this analysis, a new design with superior performance for this application is proposed and reviewed. This design employs Rowland circle geometry to achieve a resolving power in excess of 2,500 in the range of interest. In addition, a novel design is proposed for a larger extremely high resolution spectrometer which will provide resolving powers exceeding 10,000 throughout the higher end of this range. A review is given of research into the components, manufacturing techniques and tolerances that will be required to produce this spectrometer.

Andrea Damascelli is looking to usher in a new era of quantum computing with a groundbreaking technique that defies all nanotechnology research to date.

Based on a previously completed design for a soft X-ray (50-1100 eV) emission spectrometer, an endstation was constructed for the Resonant Elastic and Inelastic X-ray Scattering (REIXS) beamline at the CLS. The optical design employed techniques and software tools developed in-house using ray-tracing and diffraction grating efficiency calculations to analyze and compare existing designs and to propose a new design with superior performance. This design employs Rowland circle geometry to achieve a theoretical resolving power in excess of 2,500 in our range of interest. In addition, a novel optical design for a larger extremely high resolution spectrometer has been completed to provide theoretical resolving powers exceeding 10,000 throughout the higher end of the spectrum. To accommodate this optical design a completely new mechanical design was required, involving significant mechanical, electrical, vacuum and software engineering. Countless custom fabricated parts were required along with numerous o -the-shelf secondary instruments and systems. All told, this entirely student-managed project has cost over $1.5M and taken over 5 years. Construction is finally complete and the endstation is currently being commissioned. Necessary design changes made during the mechanical design process resulting in the selection of a more suitable, but lower resolution, detector. This reduced the theoretical maximum resolving power to 1,800 for the first order gratings and roughly 5,000 for the third order gratings. Commissioning is still underway, but first order resolutions in the range of 1,000 - 2,000 have been recorded as have third order resolutions exceeding 4,000. Publication quality data has been collecting by members of this research group and invited external users have successfully grown and measured samples here. Two of the optical elements required rework and upon their delivery the system commissioning will be completed and peer-reviewed access will begin.

Recently, the high radiance of synchrotron sources was used to enhance FTIR spectrometer performance. However, excessive channel spectra when synchrotron sources are used degrade the quality of retrieved spectral parameters. In the research reported in this thesis, seven different techniques for handling channel spectra were investigated. These techniques were used to reduce channel spectra for a test group of seven samples of CO2 mixed with air recorded using the synchrotron source at the Canadian Light Source. The increases in signal to noise ratio (SNR) of spectra handled with each technique were calculated. SNR results showed that transmission spectra, produced using synthetic background spectra with simulated channel spectra, achieved the highest SNR improvement. However, when the spectra groups were fitted using nonlinear least square fit algorithm, the technique using channel spectra fitting produced the smallest fitting residual. Moreover, the retrieved intensities and air broadening coefficients of 21 spectral lines showed that the spectral fitting technique produced the most accurate values as compared to the HITRAN 2008 database. Although the spectral fitting technique was accurate in retrieving spectral line parameters, applying the technique at wider spectral ranges was less accurate. A modification to the channel spectra fitting technique by performing iterations of channel fitting was introduced to process wider spectral ranges. Carbon dioxide laser band I centred at 961 wavenumber was analyzed using 24 spectra recorded under different experimental conditions. The intensity and air-and self-broadening coefficients were retrieved for 48 spectral lines with average deviations from HITRAN database values of 2.11%, 1.25% and 4.14%, respectively, using the Voigt profile. These average deviations lie within the uncertainty limits listed by the database. The deviation between our results and other results reported in the literature were also examined and it is found to be also within the range of HITRAN uncertainties. The effect of errors in fitting channel spectra parameters was examined and found to be mitigated by the inclusion of channel-free spectra in the multispectral fit. / xiv, 134 leaves : ill. ; 29 cm

Organic semiconductors show promise to yield a novel class of bendable electronic devices, and much research efforts have focused on the optimization of these films for device performance. It is well known that the structure of organic films has a large influence over the electronic properties. In particular, the carrier mobility is often highly anisotropic, and domain boundaries have a detrimental effect on charge transport. Therefore the domain structure and lattice orientation are of particular interest. However, little is known about the domain structure of organic films, and techniques to study these properties have only begun to emerge in recent years. In this thesis, we apply two experimental techniques, Grazing-Incidence X-ray Diffraction (GIXD) and Lateral Force Microscopy (LFM), toward studying the lattice and domain structure of tetracene films grown on the silicon(001)-monohydride surface. We describe the necessary steps toward optimizing the sensitivity of these techniques to the domain structure. Results show that the crystalline tetracene films form a layered morphology in which the a-b plane lies parallel to the substrate surface. The film lattice structure is similar to bulk tetracene, and the lattice is confined to two orthogonal orientations, forming a partially-commensurate relationship with the substrate surface lattice along the film 'a' axis. LFM images reveal two types of polycrystalline domains. The first type ("major domains") are tens of microns in size, and are classified by their lattice orientation. They are subdivided into the second type ("sub-domains"), which range from 0.1 to 5um in size, and are argued to represent regions of uniform molecular tilt direction. The GIXD data show that the single-crystal domains which comprise these two larger domain types are anisotropic in size, being up to two times longer along the film 'b' axis than along 'a'. The single-crystal domains range from 0.05 to 0.2um in size, depending on lattice orientation and film thickness. The mathematical basis for these single-crystal domain size calculations is presented. The single-crystal domain sizes are thickness-dependent, and are two orders of magnitude smaller than a typical surface island observed in atomic-force microscopy (AFM) topographs. Substrate steps can also significantly influence the film structure by inducing boundaries in the single-crystal domains and sub-domains, but not in the major domains. This detailed knowledge of the domain structure of organic thin-films may assist in our understanding of the factors which affect charge transport in thin films, and may help to direct research efforts in optimizing the film structure for device performance. / Natural Sciences and Engineering Research Council (NSERC), Canadian Foundation for Innovation (CFI), Ontario Innovation Trust (OIT).