Neste trabalho o teste de dispositivos analógicos programáveis é abordado. Diversas metodologias de teste analógico existentes são estudadas e algumas delas são utilizadas nas estratégias desenvolvidas. Dois FPAAs (Field Programmable Analog Arrays) comerciais de fabricantes e modelos distintos são utilizados para validar as estratégias de teste propostas. O primeiro dispositivo estudado é um FPAA de tempo contínuo (capaz de implementar circuitos contínuos no tempo) da Lattice Semiconductors. Tal dispositivo é marcado pela característica estrutural de sua programabilidade. Por esta razão, a estratégia a ele aplicada é baseada em um método de teste também estrutural, conhecido como OBT (Oscillation-Based Test). Neste método o circuito é dividido em blocos simples que são transformados em osciladores. Os parâmetros do sinal obtido, tais como a freqüência de oscilação e a amplitude, têm relação direta com os componentes utilizados na implementação do oscilador. Desta maneira, é possível detectar falhas no FPAA observando os parâmetros do sinal gerado. Esta estratégia é estudada inicialmente considerando uma análise externa dos parâmetros do sinal. Como uma alternativa de redução de custos e melhoria na cobertura de falhas, um analisador de resposta baseado em um duplo integrador é adotado, permitindo que a avaliação do sinal gerado pelo oscilador seja feita internamente, utilizando-se os recursos programáveis do próprio FPAA. Os resultados obtidos para as análises interna e externa são então comparados. O segundo FPAA estudado, da Anadigm Company, é um dispositivo a capacitores chaveados que tem como característica a programabilidade funcional. Por esta razão o desenvolvimento de uma técnica de teste estrutural é dificultado, pois não se conhece detalhes da arquitetura do componente. Por esta razão, uma técnica de teste funcional, conhecida como Transient Response Analysis Method, é aplicada ao teste deste FPAA. Neste método o circuito sob teste é dividido em blocos funcionais de primeira e segunda ordem e a resposta transiente destes blocos para um dado estímulo de entrada é analisada. O bloco sob teste é então duplicado e um esquema de auto-teste integrado baseado em redundância é desenvolvido, com o intuito de se obter um sinal de erro. Este sinal de erro representa a diferença das respostas transientes dos blocos duplicados. Como proposta para se aumentar a observabilidade do sinal de erro o mesmo é integrado ao longo tempo, aumentando a capacidade de detecção de falhas quando utilizado este método. Em ambas estratégias o objetivo principal do trabalho é testar os blocos analógicos programáveis dos FPAAs explorando ao máximo a programabilidade dos dispositivos e utilizando recursos pré-existentes para auxiliar no teste. Os resultados obtidos mostram que as estratégias desenvolvidas configuram boas alternativas para o auto-teste integrado deste tipo de componente. / This work addresses the test of programmable analog devices. Several analog test methodologies are studied and some of them are applied in the developed strategies. In order to validate these strategies, two commercial FPAAs (Field Programmable Analog Arrays), of different vendors and distinct models, are considered as devices under test. The first studied device is a continuous-time FPAA from Lattice Semiconductors. One important characteristic of such device is the structural programmability. For this reason the test strategy applied to this FPAA is based in a structural method known as OBT (Oscillation-Based Test). In this method, blocks of the circuit under test are individually converted into oscillators. The parameters of the generated signal, such as the frequency and amplitude, can be expressed as function of the components used in the oscillator implementation. This way, it is possible to detect faults in the FPAA simply observing such parameters. This method is firstly studied considering an external analysis of the signal parameters. However, in a second moment, an internal response analyzer, based on a double integrator, is built with the available programmable resources of the FPAA. This way, overall test cost is reduced, while the fault coverage is increased with no area overhead. The obtained results considering the external analysis and the built-in response evaluation are compared. The second considered FPAA, from Anadigm Company, is a switched capacitor device whose programming characteristic is strictly functional. Thus, a structural test method cannot be easily developed and applied without the previous knowledge of he device architectural details. For this reason, a functional test method known as TRAM (Transient Response Analysis Method) is adopted. In this method the Circuit Under Test (CUT) is programmed to implement first and second order blocks and the transient response of these blocks for a given input stimuli is analyzed. Taking advantage of the inherent programmability of the FPAAs, a BIST-based scheme is used in order to obtain an error signal representing the difference between the fault-free and faulty Configurable Analog Blocks (CABs). As a proposal to augmenting the observability, the error signal is integrated, enhancing de fault detection capability when using this method. In both developed strategies the main objective is to test the CABs of the FPAAs exploiting the device programmability, using the existing resources in order to aid the test. The obtained results show that the developed strategies represent good alternatives to the built-in self-test of such type of device.

Floating-gate transistors similar to those used in FLASH and EEPROM can be used to build reconfigurable analog arrays. The charge on the floating gate can be modified to pass or block a signal in a cross-bar switch matrix, or it can be finely tuned to eliminate a threshold difference across a chip or set a bias. By using such a compact and versatile reconfigurable analog memory element, the number of analog circuit components included on an integrated circuit that is field-programmable is significantly higher. As a result, large-scale FPAAs can be built with the same impact on analog design that FPGAs have had on digital design. In my research, I investigate the areas floating-gate transistors can be used to impact FPAA design and implementation. An FPAA can be broken up into two basic components, elements of connection and elements of computation. With respect to connection, I show that a floating-gate switch can be used in a cross-bar matrix in place of a transmission gate resulting in less parasitic capacitance and a more linear resistance for the same size transistor. I illuminate the programming issues relating to injecting a floating-gate for use as a switch, including the drain selection circuitry and rogue injection due to gate induced drain leakage. With respect to computation, I explain how a Multiple-Input Translinear Element, or MITE, can be augmented to fit in an FPAA framework. I also discuss two different MITE implementations compatible with CMOS technology, a subthreshold MOS design and a BJT MITE that uses a lateral BJT. Beyond FPAA components, I present two alternative FPAA systems. The first is a general purpose reconfigurable analog system that uses standard analog design components that have been augmented with floating-gates. The second FPAA is built upon MITE circuits, and is focused on supporting direct system synthesis. I conclude with a discussion of a future large-scale MITE FPAA.

The purpose of this research is to present a low-power wireless communication receiver with an enhanced performance by relieving the system complexity and performance degradation imposed by a quantization process. With an overwhelming demand for more reliable communication systems, the complexity required for modern communication systems has been increased accordingly. A byproduct of this increase in complexity is a commensurate increase in power consumption of the systems. Since the Shannon's era, the main stream of the methodologies for promising the high reliability of communication systems has been based on the principle that the information signals flowing through the system are represented in digits. Consequently, the system itself has been heavily driven to be implemented with digital circuits, which is generally beneficial over analog implementations when digitally stored information is locally accessible, such as in memory systems. However, in communication systems, a receiver does not have a direct access to the originally transmitted information. Since the received signals from a noisy channel are already continuous values with continuous probability distributions, we suggest a mixed-signal system in which the received continuous signals are directly fed into the analog demodulator and the subsequent soft-decision Viterbi decoder without any quantization involved. In this way, we claim that redundant system complexity caused by the quantization process is eliminated, thus gives better power efficiency in wireless communication systems, especially for battery-powered mobile devices. This is also beneficial from a performance perspective, as it takes full advantage of the soft information flowing through the system.