Thesis advisor: John C. Hepburn / The bedrock geology of the Maynard quadrangle of east-central Massachusetts was examined through field and petrographic studies and mapped at a scale of 1:24,000. The quadrangle spans much of the Nashoba terrane and a small area of the Avalon terrane. Two stratigraphic units were defined in the Nashoba terrane: the Cambrian to Ordovician Marlboro Formation and the Ordovician Nashoba Formation. In addition, four igneous units were defined in the Nashoba terrane: the Silurian to Ordovician phases of the Andover Granite, the Silurian to Devonian Assabet Quartz Diorite, the Silurian to Devonian White Pond Diorites (new name), and the Mississippian Indian Head Hill Igneous Complex. In the Avalon terrane, one stratigraphic unit was defined as the Proterozoic Z Westboro Formation Mylonites, and one igneous unit was defined as the Proterozoic Z to Devonian Sudbury Valley Igneous Complex. Two major faults were identified: the intra-terrane Assabet River fault zone in the central part of the quadrangle, and the south-east Nashoba terrane bounding Bloody Bluff fault zone. Petrofabric studies on fault rocks in two areas indicated final motion in those areas: the sheared Marlboro Formation amphibolites indicated dextral transpressive NW over SE motion, and the Westboro Formation Mylonites indicated sinistral strike-slip motion. Fracture characterization of entire quadrangle where attributes (orientation, trace length, spacing, and termination) of fractures and joints were used to identify dominant sets of fractures that affect the transmissivity and storage of groundwater. Orientations of SW - NE are dominant throughout the quadrangle and consistent with regional trend. / Thesis (MS) — Boston College, 2010. / Submitted to: Boston College. Graduate School of Arts and Sciences. / Discipline: Geology and Geophysics.

Estimation of reservoir fracture parameters, fracture orientation and density, from seismic data is often difficult because of one important question: Is observed anisotropy caused by the reservoir interval or by the effect of the lithologic unit or multiple units above the reservoir? Often hydrocarbon reservoirs represent a small portion of the seismic section, and reservoir anisotropic parameter inversion can be easily obscured by the presence of an anisotropic overburden. In this study, I show examples where we can clearly observe imprints of overburden anisotropic layers on the seismic response of the target zone. Then I present a simple method to remove the effect of anisotropic overburden to recover reservoir fracture parameters. It involves analyzing amplitude variation with offset and azimuth (AVOA) for the top of reservoir reflector and for a reflector below the reservoir. Seismic CMP gathers are transformed to delay-time vs. slowness (tau-p) domain. We then calculate the ratio of the amplitudes of reflections at the reservoir top and from the reflector beneath the reservoir. The ratios of these amplitudes are then used to isolate the effect of the reservoir interval and remove the transmission effect of the overburden. The methodology is tested on two sets of models - one containing a fractured reservoir with isotropic overburden and the other containing a fractured reservoir with anisotropic overburden. Conventional analysis in the x-t domain indicates that the anisotropic overburden has completely obscured the anisotropic signature of the reservoir zone. When the new methodology is applied, the overburden effect is significantly reduced. The methodology is also applied to an actual PP surface reflection (Rpp) 3D dataset over a reservoir in the Arabian Peninsula. Ellipse-fitting technique was applied to invert for two Fracture parameters: (1) Fracture density and (2) fracture direction. Fracture density inversion results indicate increased fracturing in the anticline structure hinge zone. Fracture orientation inversion results agree with Formation MicroImaging (FMI) borehole logs showing a WNW-ESE trend. This newly developed amplitude ratio method is suitable for quantitative estimation of fracture parameters including normal and tangential “weaknesses” (ΔN and ΔT respectively). Initially, inversion of conventional AVOA for ΔN and ΔT parameters indicates that the ΔN parameter is reliably estimated given an accurate background isotropic parameter estimation derived from borehole logging data. While ΔN parameter inversion is successful, inversion for ΔT parameter from Rpp information is not, presumably due to the dependence of ΔT estimation on many medium parameters for accurate prediction. The ΔN parameter is then successfully recovered when applied to the amplitude ratio values derived from synthetic data. It is important to recognize that ΔN parameter is directly proportional to fracture density and high ΔN values can be attributed to high crack density values. The ΔN parameter inversion is also applied to the amplitude ratios derived from real seismic data. This inversion requires fracture azimuth data input that is obtained from the fracture direction inversion using ellipse-fitting technique. The background Vp/Vs ratio. / text

The New Albany Shale is an Upper Devonian organic-rich gas shale located in the Illinois Basin. A factor influencing gas production from the shale is the natural fracture system. I test the hypothesis that a combination of outcrop and core observations, rock property tests, and geomechanical modeling can yield an accurate representation of essential natural fracture attributes that cannot be obtained from any of the methods alone. Field study shows that New Albany Shale outcrops contain barren (free of cement) joints, commonly oriented in orthogonal sets. The dominant set strikes NE-SW, with a secondary set oriented NNW-SSE. I conclude that the joints were likely created by near-surface processes, and thus are unreliable for use as analogs for fractures in the reservoir. However, the height, spacing, and abundance of the joints may still be useful as guides to the fracture stratigraphy of the New Albany Shale at depth. The Clegg Creek and Blocher members contain the highest fracture abundance. Fractures observed in four New Albany Shale cores are narrow, steeply-dipping, commonly completely sealed with calcite and are oriented ENE-WSW. The Clegg Creek and Blocher members contain the highest fracture abundance, which is consistent with outcrop observations. Fractures commonly split apart along the wall rock-cement interface, indicating they may be weak planes in the rock mass, making them susceptible to reactivation during hydraulic fracturing. Geomechanical testing of six core samples was performed to provide values of Young’s modulus, subcritical index, and fracture toughness as input parameters for a fracture growth simulator. Of these inputs, subcritical index is shown to be the most influential on the spatial organization of fractures. The models predict the Camp Run and Blocher members to have the most clustered fractures, the Selmier to have more evenly-spaced fractures, and the Morgan Trail and Clegg Creek to have a mixture of even spacing and clustering. The multi-faceted approach of field study, core work, and geomechanical modeling I used to address the problem of fracture characterization in the New Albany Shale was effective. Field study in the New Albany presents an opportunity to gather a large amount of data on the characteristics and spatial organization of fractures quickly and at relatively low cost, but with questionable reliability. Core study allows accurate observation of fracture attributes, but has limited coverage. Geomechanical modeling is a good tool for analysis of fracture patterns over a larger area than core, but results are difficult to corroborate and require input from outcrop and core studies. / text

With continued feature size reduction in microelectronics and with more than a billion transistors on a single integrated circuit (IC), on-chip interconnection has become a challenge in terms of processing-, electrical-, thermal-, and mechanical perspective. Today’s high-performance ICs have on-chip back-end-of-line (BEOL) layers that consist of copper traces and vias interspersed with low-k dielectric materials. These layers have thicknesses in the range of 100 nm near the transistors and 1000 nm away from the transistors close to the solder bumps. In such BEOL layered stacks, cracking and/or delamination is a common failure mode due to the low mechanical and adhesive strength of the dielectric materials as well as due to high thermally-induced stresses. However, there are no available cohesive zone models and parameters to study such interfacial cracks in sub-micron thick microelectronic layers. This work focuses on developing framework based on cohesive zone modeling approach to study interfacial delamination in sub-micron thick layers. Such a framework is then successfully applied to predict microelectronic device reliability. As intentionally creating pre-fabricated cracks in such interfaces is difficult, this work examines a combination of four-point bend and double-cantilever beam tests to create initial cracks and to develop cohesive zone parameters over a range of mode-mixity. Similarly, a combination of four-point bend and end-notch flexure tests is used to cover additional range of mode-mixity. In these tests, silicon wafers obtained from wafer foundry are used for experimental characterization. The developed parameters are then used in actual microelectronic device to predict the onset and propagation of crack, and the results from such predictions are successfully validated with experimental data. In addition, nanoindenter-based shear test technique designed specifically for this study is demonstrated. The new test technique can address different mode mixities compared to the other interfacial fracture characterization tests, is sensitive to capture the change in fracture parameter due to changes in local trace pattern variations around the vicinity of bump and the test mimics the forces experienced by the bump during flip-chip assembly reflow process. Through this experimental and theoretical modeling research, guidelines are also developed for the reliable design of BEOL stacks for current and next-generation microelectronic devices.