AlGaN/GaN high electron mobility transistors (HEMTs) have appeared as attractive candidates for high power, high frequency, and high temperature operation at microwave frequencies. In particular, these devices are being considered for use in the area of high RF power for microwave and millimeter wave communications transmitter applications at frequencies greater than 100 GHz and at temperatures greater than about 150 °C. However, there are concerns regarding the reliability of AlGaN/GaN HEMTs. First of all, thermal reliability is the chief concern since high channel temperatures significantly affect the lifetime of the devices. Therefore, it is necessary to find the solutions to decrease the temperature of AlGaN/GaN HEMTs. In this study, we explored the methods to reduce the channel temperature via high thermal conductivity diamond as substrates of GaN. Experimental verification of AlGaN/GaN HEMTs on diamond substrates was performed using micro-Raman spectroscopy, and investigation of the design space for devices was conducted using finite element analysis as well. In addition to the thermal impact on reliability, environmental effects can also play a role in device degradation. Using high density and pinhole free films deposited using atomic layer deposition, we also explore the use of ultra-thin barrier films for the protection of AlGaN/GaN HEMTs in high humidity and high temperature environments. The results show that it is possible to protect the devices from the effects of moisture under high negative gate bias stress testing, whereas devices, which were unprotected, failed under the same bias stress conditions. Thus, the use of the atomic layer deposition (ALD) coatings may provide added benefits in the protection and packaging of AlGaN/GaN HEMTs.

In this thesis, novel designs for adaptive power amplifiers, capable of maintaining excellent performance at dissimilar signal parameters, are presented. These designs result in electronically reconfigurable, single-ended and Doherty power amplifiers (DPA) that efficiently sustain functionality at different driving signal levels, highly varying time domain characteristics and wide-spread frequency bands. The foregoing three contexts represent those dictated by the diverse standards of modern communication systems. Firstly, two prototypes for a harmonically-tuned reconfigurable matching network using discrete radio frequency (RF) microelectromechanical systems (MEMS) switches and semiconductor varactors will be introduced. Following that is an explanation of how the varactor-based matching network was used to develop a high performance reconfigurable Class F-1 power amplifier. Afterwards, a systematic design procedure for realizing an electronically reconfigurable DPA capable of operating at arbitrary centre frequencies, average power levels and back-off efficiency enhancement power ranges is presented. Complete sets of closed-form equations are outlined which were used to build tunable matching networks that compensate for the deviation of the Doherty distributed elements under the desired deployment scenarios. Off-the-shelf RF MEMS switches are used to realize the reconfigurability of the adaptive Doherty amplifiers. Finally, based on the derived closed-form equations, a tri-band, monolithically integrated DPA was realized using the Canadian Photonics Fabrication Centre (CPFC??) GaN500 monolithic microwave integrated circuit (MMIC) process. Successful integration of high power, high performance RF MEMS switches within the MMIC process paved the way for the realization of the frequency-agile, integrated version of the adaptive Doherty amplifier.

Possessing a wide band gap and large break down field, gallium nitride (GaN) is of interest for a host of high power, high frequency applications including next generation cellular base stations, advanced military radar, and WiMAX networks. Much of this interest stems from the continued development of the AlGaN/GaN high electron mobility transistor (HEMT) that is capable of operating at sizable power densities and switching speeds. The same fields responsible for this performance, however, also elicit acute device heating and elastic loads. These induced thermomechanical loads limit both performance and reliability thus necessitating continued improvement in the management and characterization of the coupled environments. In response, this study establishes a new implementation of Raman spectroscopy capable of simultaneously measuring the operational temperature and stress in a HEMT using only the Stokes response. First, the linewidth (FWHM) of the Stokes signal is utilized to quantify the operating temperature of a HEMT independent to the influences of stress. Second, a new method, incorporating the use of the linewidth and peak position in tandem, is developed to estimate the biaxial thermoelastic stress that arises during device operation. With this capability, the HEMT's resultant load is assessed, highlighting the large role of the residual stress on the total mechanical state of the device. Subsequently, this same linewidth is leveraged to identify the distinct effect that electrical carriers have on the thermally relevant decay of longitudinal optical phonon modes. Further investigation of the lattice transport then concludes the study by way of an analytical treatment describing the significant influence of interfacial disorder on the energy transport at GaN/substrate boundaries.

Main objective of the present work is to develop wide-band gap InGaN solar cells in the 2.4 - 2.9 eV range that can be an integral component of photovoltaic devices to achieve efficiencies greater than 50%. In the present work, various challenges in the novel III-nitride technology are identified and overcome individually to build basic design blocks, and later, optimized comprehensively to develop high-performance InGaN solar cells. Due to the unavailability of a suitable modeling program for InGaN solar cells, PC1D is modified up to a source-code level to incorporate spontaneous and piezoelectric polarization in order to accurately model III-nitride solar cells. On the technological front, InGaN with indium compositions up to 30% (2.5 eV band gap) are developed for photovoltaic applications by controlling defects and phase separation using metal-organic chemical vapor deposition. InGaN with band gap of 2.5 eV is also successfully doped to achieve acceptor carrier concentration of 1e18 cm-3. A robust fabrication scheme for III-nitride solar cells is established to increase reliability and yield; various schemes including interdigitated grid contact and current spreading contacts are developed to yield low-resistance Ohmic contacts for InGaN solar cells. Preliminary solar cells are developed using a standard design to optimize the InGaN material, where the band gap of InGaN is progressively lowered. Subsequent generations of solar cell designs involve an evolutionary approach to enhance the open-circuit voltage and internal quantum efficiency of the solar cell. The suitability of p-type InGaN with band gaps as low as 2.5 eV is established by incorporating in a solar cell and measuring an open-circuit voltage of 2.1 V. Second generation InGaN solar cell design involving a 2.9 eV InGaN p-n junction sandwiched between p- and n-GaN layers yields internal quantum efficiencies as high as 50%; while sixth generation devices utilizing the novel n-GaN strained window-layer enhance the open circuit voltage of a 2.9 eV InGaN solar cell to 2 V. Finally, key aspects to further InGaN solar cell research, including integration of various designs, are recommended to improve the efficiency of InGaN solar cells. These results establish the potential of III-nitrides in ultra-high efficiency photovoltaics.

Since Shuji Nakamura, Hiroshi Amano, and Isamu Akasaki won the 2014 Nobel prize in Physics owing to theircontributions on the invention of efficient blue GaN light emitting diodes, GaN became an even more appealingmaterial system in the research field of optoelectronics. On the other hand, quantum structures or low-dimensionalstructures with properties derived from quantum physics demonstrate superior and unique electrical and opticalproperties, providing a significant potential on novel optoelectronic applications based on the employment of quantumconfinement.   In 2012, our research team at Linköping University utilized pyramid templates, which is an established approach toform quantum structures, to successfully grow GaN pyramids with InGaN hybrid quantum structures, includingquantum wells, quantum wires, and quantum dots. This growth enabled site-controlled pyramids based on selectivearea growth (SAG). After numerous studies on the photoluminescence properties, the mature and controlled growthtechnique was proposed to be adapted for fabrication of AlGaN pyramids on which GaN hybrid quantum structurescan be hosted.   This thesis is dedicated to the subsequent problems of the growth of AlGaN pyramids. It was found that there wasan undesired deposition of a considerable thickness on top the desired AlGaN pyramid with GaN multiple quantumwells. In this thesis, two different directions are explored to find the key solution with a potential of furtheroptimization. On one hand, the growth parameters such as precursors cut-off, carrier gas during cooling, temperatureholding, cooling pressure, III/V ratio, and the possible effect of GaN surfaces are investigated. However, due to theactual inherent properties of the metal-organic chemical vapor deposition reactor used, no promising parameter tuningcan been identified. On the other hand, from post-growth point of view, a KOH aqueous etching solution exhibits apositive result toward removing the undesired deposition. This etching process is suggested to be further optimized toachieve the final goal of eliminating the undesired deposition.

8-band k.p theory was applied to bulk GaN and InN. The optical transitionintensity was computed and results show > 80-90% degree of polarization inthe direction of compression. Polarization switching is observed when strainwas reversed from compressive to tensile. 6 band k.p theory was used tostudy InGaN quantum dot/GaN elliptical pyramid structures. The opticaltransition intensity was calculated for different elongations of the pyramid.Elongation of the pyramid gives rise to a small polarization in the directionof the pyramid elongation. The optical transition intensity was calculatedfor elongated quantum dots and was strongly in uencing the polarization inthe direction of the quantum dot elongation, with a degree of polarization of >90%.

Afin de répondre à l’exigence croissante de densité de puissance aux hautes fréquences, les chercheurs se sont intéressés aux matériaux à large bande interdite tels que le nitrure de gallium GaN. Les HEMTs (transistors à haute mobilité électronique) AlGaN/GaN ne sont pas stabilisées et donc l’analyse de défaillance de ces composants est difficile (défauts multiples).Les mécanismes de défaillance des HEMTs GaAs sont difficilement transposables sur les HEMTs GaN et nécessitent donc une étude approfondie. De plus que les données actuelles sur les effets de pièges ne permettent pas d’expliquer facilement des effet parasites comme l’effet de coude. Ce qui nécessité de développer de nouvelles procédures d’analyse de défaillance adaptées aux composant GaN. Les dégradations induites par les électrons chauds sont difficilement détectables par la technique d ‘émission de lumière standard ce qui a nécessité le développement de la microscopie à émission de lumière dans le domaine de l’UV. L’objectif principal de ce travail est la mise au point d'une méthodologie d'analyse de défaillance pour les filières GaN et l’optimisation des techniques electro-optiques non destructives de localisation de défauts. En vue de l’amélioration des procédés technologiques, et de la fiabilité des HEMT GaN. / There are several economic and technological stakes, which require the development of suitable techniques for failure analysis on microwave devices, the HEMT (High Electron Mobility Transistor) AlGaN/GaN play a key role for power and RF low noise applications.The technologies are not completely stabilized and the failure analysis is difficult. Which need the development of a non destructive investigation techniques such as electroluminescence technics. To improve the GaN HEMT performance and reliability, understanding the failure mechanisms is critical. The standard emission light is not sufficient for hot-elctron detection in GaN material. And the development of UV light emission become necessary in the AlGaN/GaN HEMT.

In this thesis, I will present and discuss research performed on InGaN/GaN multiple quantum well (QW) structures. The results of which were taken using photoluminescence (PL) spectroscopy and PL time decay spectroscopy. In the first two experimental chapters, I report on the effects of QW growth methodology on the optical properties of c-plane InGaN/GaN QWs. I compare structures grown using the single temperature (1T), quasi-two temperature (Q2T), temperature bounced (T-bounced) and two temperature (2T) QW growth methodologies. The T-bounced and 2T structures are observed to have gross well width fluctuations (GWWF), where the QW width varies from 0 to 100 % created when the QWs are exposed to a temperature ramp. Whereas, the 1T and Q2T structures have continuous QWs with only one or two monolayer well width fluctuations. The structures with GWWFs are observed to have a larger room temperature internal quantum efficiency (RT-IQE) at low excitation conditions i.e. below efficiency droop compared to those without. The larger RT-IQE is ascribed to several factors which include an increased radiative recombination rate, increased thermal activation energy of non-radiative recombination and reduced defect density of the QWs. The effect of barrier growth temperature is also investigated. No clear trend is observed between barrier growth temperature and RT-IQE.In the last experimental chapter I report on studies of carrier localisation in InGaN/GaN QWs using resonant PL spectroscopy. The effect of carrier localisation on the independently localised electrons and holes are investigated and the resonant PL spectrum is studied in detail. The InGaN/GaN QW structure is observed to exhibit an effective mobility edge at 12 K where delocalised carriers are created above a particular excitation energy. The emission from the resonantly excited localised states which are accompanied by the emission of a longitudinal optical phonon (resonant LO feature) is investigated as a function of temperature and excitation energy. The integrated PL intensity of the resonant LO feature is observed to quench rapidly with temperature up to around 45 K, independent of excitation energy. The integrated PL intensity of the resonant LO feature is fitted to an Arrhenius model and a thermal activation energy of ∼ 1(±1) meV is extracted. This activation energy is speculated to be consistent with the localisation energy of electrons.

Gallium Nitride (GaN) high electron mobility transistors (HEMT) have superior performance characteristics compared to Silicon (Si) and Gallium Arsenide (GaAs) based transistors. GaN is a wide bandgap semiconductor which allows it to operate at higher breakdown voltages and power. Unlike traditional semiconductor devices, the GaN HEMT channel region is undoped and relies on the piezoelectric effect created at the GaN and Aluminum Gallium Nitride (AlGaN) heterojunction to create a conduction channel in the form of a quantum well known as the two dimensional electron gas (2DEG). Because the GaN HEMTs are undoped, these devices have higher electron mobility crucial for high frequency operation. However, over time and use these devices degrade in a manner that is not well understood. This research utilizes low frequency noise (LFN) as a method for analyzing changes and degradation mechanisms in GaN-on-Si devices due to gate stress. LFN is a useful tool for probing different regions of the device that cannot be measured through direct means. LFN generation in GaN HEMTs is based on the carrier fluctuation theory of 1/f noise generation which states fluctuations in the number of charge carriers results in conductance fluctuations that produce a Lorentzian noise spectrum. The summing Lorentzian noise spectra from multiple traps leads to 1/f and random telegraph signal (RTS) noise. The primary cause of carrier fluctuations are electron traps near the 2DEG and in the AlGaN bulk. These traps occur naturally due to dislocations and impurities in the manufacturing process, but new traps can be generated by the inverse-piezoelectric effect during gate stress. This thesis introduces noise and presents a circuit to bias the devices and measure gate and drain LFN simultaneously. Three measurements are performed before and after gate DC stress at three different temperatures: DC characterization, capacitance-voltage (C-V) measurements, and LFN measurements. The DC characteristics show an increase in gate leakage after stress caused by an increase in traps after degradation consistent with trap assisted tunneling. However, the leakage current on the drain and source side differ before and after stress leading to the conclusion that the source side of the gate is more sensitive to gate stress. Gate leakage current on the drain side is also sensitive to temperature due to thermionic trap assisted tunneling. Hooge parameter calculations agree with previous research. The LFN results show an increase in gate and drain noise power, SIg(f) and SId(f), in accordance with increased gate leakage current under cutoff bias. RTS noise is also observed to increase in frequency with increased temperature. Activation energies for RTS noise are extracted and qualitatively linked to trap depth based on the McWhorter trap model.

Hlboké neurónové siete sa bežne používajú v oblasti odstraňovania šumu. Trénovací proces neurónovej siete je možné rožšíriť využitím druhej neurónovej siete, ktorej cieľom je vložiť šum do čistej rečovej nahrávky. Tieto dve siete sa môžu spolu využiť k rekonštrukcii pôvodných čistých a zašumených nahrávok. Táto práca skúma efektivitu tejto techniky, zvanej cyklická konzistencia. Cyklická konzistencia zlepšuje robustnosť neurónovej siete bez toho, aby sa daná sieť akokoľvek modifikovala, nakoľko vystavuje sieť na odstraňovanie šumu rôznorodejšiemu množstvu zašumených dát. Avšak, táto technika vyžaduje trénovacie dáta skladajúce sa z párov vstupných a referenčných nahrávok. Tieto dáta niesu vždy dostupné. Na trénovanie modelov s nepárovanými dátami využívame generatívne neurónové siete s cyklickou konzistenciou. V tejto práci sme vykonali veľké množstvo experimentov s modelmi trénovanými na párovaných a nepárovaných dátach. Naše výsledky ukazujú, že využitie cyklickej konzistencie výrazne zlepšuje výkonnosť modelov.