Nesta pesquisa, objetivou-se entender os efeitos da possível melhoria da infraestrutura laboratorial dos laboratórios da Rede de metrologia de defesa e segurança (RDS) do Programa Sibratec e da atuação da gestão em rede na oferta de apoio e de serviços metrológicos às empresas do setor de defesa e segurança, dentro dos propósitos do projeto. Procurou-se também identificar a existência de lacunas na oferta de serviços de calibração/ensaio para suprir a demanda das indústrias de defesa e segurança, bem como analisar a adequação do projeto RDS a essas demandas das indústrias de defesa e segurança, tendo como propósito contribuir com informações para ações futuras. A pesquisa desenvolvida é do tipo qualitativo, com características de pesquisa exploratória, fundamentada em estudo de caso. Foi estruturada em duas partes, envolvendo coleta de dados primários e de dados secundários. Para a coleta dos dados primários foram elaborados dois questionários, sendo um (Questionário A) destinado aos cinco representantes dos laboratórios na RDS e outro (Questionário B) aos contatos das 63 empresas do setor de defesa e segurança que necessitam de serviços de calibração e de ensaios pertinentes às áreas de atuação dos laboratórios da RDS. Foram obtidas respostas de quatro representantes dos laboratórios da RDS e de 26 empresas do setor de defesa e segurança. Os dados secundários resultaram de pesquisa documental. A análise dos resultados foi feita tendo por base cinco dimensões definidas com o objetivo de organizar e melhorar o entendimento do cenário da pesquisa. São elas, abrangência do projeto, regionalidade, gestão em rede, rastreabilidade metrológica e importância e visibilidade da RDS. Os resultados indicaram que a atuação da RDS não interferiu, até então, na rastreabilidade metrológica dos produtos das empresas do setor de defesa e segurança participantes da pesquisa. / This study is focused on understanding the effects of the infrastructure improvement of these laboratories and the role of network management in offering support and metrological services to the defense and security sector enterprises, within the project purposes. It is also aimed identify gaps on offering calibration and, or testing services to supply demands of the defense and security industries, and analyze adequacy of RDS project to demands of defense and security industries, with the purpose to contribute with information for future actions. The experimental research is qualitative type, with exploratory research characteristics, based on case study. It was structured in two parts, involving primary data collection and secondary data. In order to collect the primary data two questionnaires were prepared, one (Questionnaire A) to the five RDS laboratories representatives and other (Questionnaire B) to the contacts of 63 defense and security enterprises which need calibration and test services, possible customers of RDS laboratories. Answers from four representatives of RDS laboratories and from 26 defense and security enterprises were obtained. The collection of secondary data was obtained from documentary research. The analysis was made based on five dimensions defined in order to organize and improve the understanding of the research setting. They are RDS project coverage, regional, network management, metrological traceability and importance and visibility of RDS. The results indicated that the performance of RDS does not interfere, by that time, in the metrological traceability of the products of the defense and security enterprises that participated in the research.

Nesta pesquisa, objetivou-se entender os efeitos da possível melhoria da infraestrutura laboratorial dos laboratórios da Rede de metrologia de defesa e segurança (RDS) do Programa Sibratec e da atuação da gestão em rede na oferta de apoio e de serviços metrológicos às empresas do setor de defesa e segurança, dentro dos propósitos do projeto. Procurou-se também identificar a existência de lacunas na oferta de serviços de calibração/ensaio para suprir a demanda das indústrias de defesa e segurança, bem como analisar a adequação do projeto RDS a essas demandas das indústrias de defesa e segurança, tendo como propósito contribuir com informações para ações futuras. A pesquisa desenvolvida é do tipo qualitativo, com características de pesquisa exploratória, fundamentada em estudo de caso. Foi estruturada em duas partes, envolvendo coleta de dados primários e de dados secundários. Para a coleta dos dados primários foram elaborados dois questionários, sendo um (Questionário A) destinado aos cinco representantes dos laboratórios na RDS e outro (Questionário B) aos contatos das 63 empresas do setor de defesa e segurança que necessitam de serviços de calibração e de ensaios pertinentes às áreas de atuação dos laboratórios da RDS. Foram obtidas respostas de quatro representantes dos laboratórios da RDS e de 26 empresas do setor de defesa e segurança. Os dados secundários resultaram de pesquisa documental. A análise dos resultados foi feita tendo por base cinco dimensões definidas com o objetivo de organizar e melhorar o entendimento do cenário da pesquisa. São elas, abrangência do projeto, regionalidade, gestão em rede, rastreabilidade metrológica e importância e visibilidade da RDS. Os resultados indicaram que a atuação da RDS não interferiu, até então, na rastreabilidade metrológica dos produtos das empresas do setor de defesa e segurança participantes da pesquisa. / This study is focused on understanding the effects of the infrastructure improvement of these laboratories and the role of network management in offering support and metrological services to the defense and security sector enterprises, within the project purposes. It is also aimed identify gaps on offering calibration and, or testing services to supply demands of the defense and security industries, and analyze adequacy of RDS project to demands of defense and security industries, with the purpose to contribute with information for future actions. The experimental research is qualitative type, with exploratory research characteristics, based on case study. It was structured in two parts, involving primary data collection and secondary data. In order to collect the primary data two questionnaires were prepared, one (Questionnaire A) to the five RDS laboratories representatives and other (Questionnaire B) to the contacts of 63 defense and security enterprises which need calibration and test services, possible customers of RDS laboratories. Answers from four representatives of RDS laboratories and from 26 defense and security enterprises were obtained. The collection of secondary data was obtained from documentary research. The analysis was made based on five dimensions defined in order to organize and improve the understanding of the research setting. They are RDS project coverage, regional, network management, metrological traceability and importance and visibility of RDS. The results indicated that the performance of RDS does not interfere, by that time, in the metrological traceability of the products of the defense and security enterprises that participated in the research.

With increase in the number of three dimensional (3-D) nanometer-scale objects that are being either fabricated or studied, there is a need to accurately characterize their geometry. While the Atomic force microscope (AFM) is a versatile tool for performing nano-metrology, it suffers from issues of poor accessibility of 3-D features and inability to measure 3-D forces that limit its applicability in 3-D nano-metrology. This thesis investigates the design and development of a novel probing system based on AFM that improves accessibility and enables direct measurement of 3-D forces acting on the AFM tip. Two approaches are investigated to address the issue of poor accessibility. The first is to develop a novel system that enables in-situ replacement and reuse of specialized AFM tips that improve accessibility, and the second is to design a special AFM tip that can actively re-orient about two independent axes. In order to perform in-situ tip replacement, a liquid meniscus based micro-gripper is developed and integrated on to a conventional AFM probe. The stiffness of the gripper is analyzed and shown to be adequately high along all three axes for AFM imaging to be performed. Tip replacement and re-use are both experimentally demonstrated by employing a novel tip-exchange station. The replaced tips are employed to show artifact-free AFM imaging of a standard calibration grating in both tapping-mode and contact-mode. To actively re-orient a conventional tip, a novel magnetically-actuated micro-scale ball-and-socket joint is integrated onto an AFM probe. The quasi-static behavior of the joint is experimentally characterized, and the ability of the tip to independently re-orient about two axes is demonstrated. The achieved range is about +/- 90 degrees about both X- and Y-axes. In order to realize the potential of the proposed probes for 3-D nano-metrology, an AFM is developed in-house that possesses the capability to make direct measurement of 3-D forces. Optimization of the measurement system to achieve identical sensitivities and resolution along all three axes is studied. Subsequently, the necessary electronics for measurement, actuation and control are developed. All the subsystems are experimentally calibrated and integrated. The overall AFM is shown to have a resolution of about 0.2 nm when operated in tapping-mode. The developed AFM is employed to showcase the following applications: characterization of the coefficient of kinetic friction of Muscovite mica, force controlled nano-scribing on polymethyl methacrylate (PMMA) and tapping-mode imaging of a calibration grating with the developed re-orientable AFM probe. Finally, the unique ability of the re-orientable AFM probe to control its tip-orientation is employed to develop a nanometer-scale coordinate measurement machine (CMM). The developed nano-CMM is shown to access the vertical wall of a sample and obtain its topography.

No description available.

<p dir="ltr"><i>The high heat fluxes generated in electronic devices must be effectively diffused through </i><i>the semiconductor substrate and packaging layers to avoid local, high-temperature “hotspots” </i><i>that govern long-term device reliability. In particular, advanced semiconductor packaging </i><i>trends toward thin form factor products increase the need for understanding and improving </i><i>in-plane conduction heat spreading in anisotropic materials. Furthermore, predicting thermal </i><i>transport in vertical stacks of thinned and bonded die hinges on accurately characterizing </i><i>unknown buried interfacial thermal resistances. The design of semiconductor thermal packaging </i><i>solutions is hence limited by the functionality and accuracy of metrology available </i><i>for thermal properties characterization of engineered anisotropic heat spreading materials </i><i>and buried interfaces. This work focuses on the development of two separate innovative </i><i>metrology techniques for characterizing in-plane thermal properties of both isotropic and </i><i>anisotropic materials, and the measurement of low thermal interfacial resistances embedded </i><i>in stacks of semiconductor substrates.</i></p><p dir="ltr"><i>In the first portion of this thesis, a new measurement technique is developed for characterizing </i><i>the isotropic and anisotropic in-plane thermal properties of thin films and sheets, </i><i>as an extension of the traditional Ångstrom method and other lock-in thermography techniques. </i><i>The measurement leverages non-contact infrared temperature mapping to quantify </i><i>the thermal response to laser-based periodic heating at the center of a suspended thin film </i><i>sample. This novel data extraction method does not require precise knowledge of the boundary </i><i>conditions. To validate the accuracy of this technique, numerical models are developed </i><i>to generate transient temperature profiles for hypothetical anisotropic materials with known </i><i>properties. The resultant temperature profiles are processed through a fitting algorithm to </i><i>extract the in-plane thermal conductivities, without the knowledge of the input properties </i><i>to the forward model. Across a wide range of in-plane thermal conductivities, these results </i><i>agree well with the input values. The limits of accuracy of this technique are identified based </i><i>on the experimental and sample parameters. Further, numerical simulations demonstrate </i><i>the accuracy of this technique for materials with thermal conductivities from 0.1 to 1000 W </i><i>m</i><i>−1 </i><i>K</i><i>−1</i><i>, and material thicknesses ranging from 0.1 to 10 mm. This technique effectively</i> <i>measures anisotropy ratios up to 1000:1. Data from multiple heating frequencies can be </i><i>combined to fit for a single set of thermal properties (independent of frequency), which improves </i><i>measurement sensitivity as the thermal penetration depth varies across frequencies. </i><i>The post-processing algorithm filters out regions within the laser absorber and heat sink to </i><i>eliminate regions in the sample domain with boundary effects. Based on these guidelines, </i><i>experiments demonstrate the accuracy of this measurement technique for a wide range of </i><i>known isotropic and anisotropic heat spreading materials across a thermal conductivity range </i><i>of 0.3 to 700 W m</i><i>−1 </i><i>K</i><i>−1</i><i>, and in-plane anisotropy ratios of 30:1. These steps contribute </i><i>towards standardization of this measurement technique, enabling the development and characterization </i><i>of engineered heat spreading materials with desired anisotropic properties for </i><i>various applications.</i></p><p dir="ltr"><i>The second portion of this thesis focuses on characterization of thermal resistances across </i><i>“buried” interfaces that are challenging to characterize in situ due to their low relative magnitude </i><i>and embedded depth within a material stack. In particular, we target characterization </i><i>of interfaces that are buried deeper than the thermal penetration depth of available transient </i><i>measurement techniques, such as thermoreflectance, but have low thermal resistances </i><i>that prohibit the use of steady-state techniques, such as the reference bar method, due to </i><i>the very high temperature gradients that would be necessary resolve the resistances, among </i><i>other sample preparation challenges. This work develops a technique for the non-destructive </i><i>characterization of such deeply buried interfaces having thermal contact resistances of the </i><i>order of 0.001 cm</i><i>2</i><i>K/W. Two different embodiments of the measurement approach are first </i><i>assessed before down-selecting to a single experimental implementation. The working principle </i><i>for both embodiments includes a combination of non-contact periodic heating and </i><i>thermal sensing to measure the transient temperature response of a two-layer stack of materials </i><i>with a bonded interface of unknown thermal resistance. The approaches aim to </i><i>eliminate the preparation requirement of cutting samples to investigate their temperature in </i><i>cross-section. In the first embodiment, the sample stack is heated periodically at the center </i><i>of the sample, and cooled at the periphery, to create a radial temperature gradient. The </i><i>second embodiment involves generating a one-dimensional temperature gradient across the </i><i>stack by periodic heating of one face and steady cooling of the other face. The corresponding </i><i>ing amplitude and phase delay of the temperature responses are used to fit for the thermal </i><i>interfacial resistance, assuming a time-periodic solution for the heat diffusion equation for </i><i>a system with periodic heating. Numerical models developed for both approaches simulate </i><i>the transient temperature profiles across a two-layer bonded silicon stack of known thermal </i><i>properties, and enable an assessment of both approaches. The one-dimensional (1D) gradient </i><i>approach is found to have higher sensitivity and measurable signal compared to the </i><i>radial spreading approach, at the same mean temperature of the sample. </i></p><p dir="ltr"><i>Based on this 1D gradient concept, an experimental facility is developed, which includes </i><i>a IR-transparent heat sink, laser-based heating, and two IR temperature sensors for noncontact </i><i>temperature measurement of both sides of the sample. The unique IR transparent </i><i>heat sink design allows for simultaneous cooling and non-contact temperature measurement </i><i>of the bottom surface of the sample. An inverse fitting method is developed to extract </i><i>the thermal resistances using the steady periodic temperature amplitude and phase delay </i><i>across the thickness of the material. Thermal data generated using numerical simulations, </i><i>along with the data fitting method, is first leveraged to validate the extracted thermal resistance </i><i>values for two-layer material systems with an bonded interface, as well as for the </i><i>thermal conductivity measurement of bulk materials without an interface. The data extraction </i><i>process is shown to accurately extract thermal contact resistances on the order of </i><i>0.0001 cm</i><i>2</i><i>K/W in silicon-based packages for interfaces that are a few millimeters from the </i><i>exposed surface. For bulk materials, this technique demonstrates accuracy in extracting </i><i>the thermal conductivity of a wide range of materials ranging from thermal insulators to </i><i>highly conductive materials, spanning a range of 0.1 to 2000 W m</i><i>−1 </i><i>K</i><i>−1</i><i>. Physical measurements </i><i>of thermal conductivity of bulk silicon nitride and zinc oxide agree well with expected </i><i>reference values, and these measurements also align well with data from independently performed </i><i>experiments on the same materials using an established ASTM D5470 standard, </i><i>thereby validating this new measurement technique experimentally. Two-layer dry-contact </i><i>stacks of these two materials demonstrate the extraction of the thermal resistance across </i><i>interfaces buried up to 2 mm from the exposed surface. This work contributes toward standardization </i><i>of this technique for measurement of thermal resistances with low magnitudes </i><i>and buried depths, which are commonly found in modern electronic packages, ranging from </i><i>near-junction epitaxial semiconductor films to interconnect layers in emerging die-to-die and </i><i>wafer hybrid bonding technologies.</i></p><p dir="ltr"><i>Ultimately, these measurement techniques of in-plane thermal conductivity measurement </i><i>of anisotropic materials and the interfacial contact resistance measurements across buried </i><i>interfaces offer an important contribution to the area of thermal metrology, and advance the </i><i>field of next-generation semiconductor packaging.</i></p>

On-machine inspection (OMI) via on-machine probing (OMP) is a technology that has the potential to provide a step change in the manufacturing of high precision products. Bringing product inspection closer to the machining process is very attractive proposition for many manufacturers who demand ever better quality, process control and efficiency from their manufacturing systems. However, there is a shortness of understanding, experience, and knowledge with regards to efficiently implementing OMI on industrially-based multi-axis machine tools. Coupled with the risks associated to this disruptive technology, these are major obstacles preventing OMI from being confidently adopted in many high precision manufacturing environments. The research pursued in this thesis investigates the concept of enabling high precision machine tools as measurement devices and focuses upon the question of: “How can traceable on-machine inspection be enabled and sustained in an industrial environment?” As highlighted by the literature and state-of-the-art review, much research and development focuses on the technology surrounding particular aspects of machine tool metrology and measurement whether this is theory, hardware, software, or simulation. Little research has been performed in terms of confirming the viability of industrial OMI and the systematic and holistic application of existing and new technology to enable optimal intervention. This EngD research has contributed towards the use of industrial machine tools as traceable measurement systems. Through the test cases performed, the novel concepts proposed, and solutions tested, a series of fundamental questions have been addressed. Thus, providing new knowledge and use to future researchers, engineers, consultants and manufacturing professionals.

[pt] Tendo como motivação a consolidação futura de um sistema integrado de metrologia para o Ministério da Defesa, a presente dissertação de mestrado diagnostica e propõe uma re-estruturação do sistema normativo do Sistema de Metrologia Aeroespacial (SISMETRA) pertencente ao Comando da Aeronáutica (COMAER). O sistema normativo em metrologia do SISMETRA, foco deste trabalho, tem como atribuição emitir normas técnicas (NTS) que padronizem a execução das atividades relacionadas com a metrologia no âmbito do COMAER. Fundamentado em ampla pesquisa bibliográfica e no diagnóstico do acervo normativo de Normas Técnicas do SISMETRA (NTS), foi possível mapear os principais sub-processos existentes no desenvolvimento de uma NTS e propor uma sistemática alternativa mais ágil e mais eficiente. Dois projetos de normas, elaborados segundo a nova filosofia proposta e com o objetivo de sistematizar os sub-processos existentes na criação de uma NTS, foram desenvolvidos como estudos de caso para comprovar a eficiência e eficácia do método proposto. O trabalho analisou, também, a conformidade do acervo normativo do SISMETRA a procedimentos internos e preceitos estabelecidos em normas nacionais e internacionais. Como fundamentos básicos do diagnóstico, a análise tomou como substrato os princípios internacionais da normalização e o Standard Code, conforme caracterizado no Anexo 3 do Acordo de Barreiras Técnicas ao Comércio da Organização Mundial do Comércio. A análise investigou a aderência das NTS ao ABNT Guia 2 (Normalização e atividades relacionadas - vocabulário geral) e a ABNT ISO/IEC Diretiva Parte 3 (Redação e apresentação de Normas Brasileiras) e a lógica processual relacionada ao desenvolvimento, adoção e aplicação de normas no âmbito do SISMETRA. No âmbito de uma pesquisa de demanda por normas em metrologia realizada junto aos quarenta e três (43) laboratórios de calibração que integram o SISMETRA em todo o território nacional, o trabalho identificou lacunas e deficiências no sistema vigente. Como resultado foram identificados 69 novos títulos de normas/procedimentos necessários para suprir vulnerabilidades e/ou atribuir maior racionalidade a sua operação. O desenvolvimento da pesquisa de demanda por normalização em metrologia, conduzida no âmbito do SISMETRA, de per se, já estimulou ampla reflexão sobre a relevância da atividade de normalização nos laboratórios do SISMETRA sediados em todo o território nacional. Este sistema é tomado como modelo para proposição de ações futuras visando a implementação de um sistema normativo integrado. Entendido como estratégico subsídio para planejamento futuro, acredita-se que o trabalho possa colaborar para o desenvolvimento de um sistema de metrologia integrado para o atual Ministério da Defesa. / [en] Motivated by the future consolidation of an integrated metrology system for the Brazilian Defense Department, the present master s degree dissertation diagnoses and proposes the restructuring of SISMETR s (Aerospace Metrology System) standardization system, which is part of the Brazilian Air Force (COMAER). SISMETRA s standardization system, focus of this master s degree research, issues technical standards to govern the activities related to metrology within the Brazilian Air Force s scope. Based on a wide bibliographic research and on the diagnosis of SISMETRA s technical standards (NTS) collection, it was possible to map the main processes underlaid in an NTS and proposed more agile and efficient procedure. Two sets of standards were prepared, according to the new proposed philosophy, as case study to prove the efficiency of the proposed method. This master s degree research also analyzed the conformity of SISMETRA s technical standards (NTS) in conformity with internal features and precepts established on national and international standards. As a basis to the diagnosis, the study took as substratum the international principles and the Standard Code, as characterized in Annex 3 of the Agreement on Technical Barriers to Trade, of the World Trade Organization (WTO). The study contemplated the adherence of SISMETRA s Technical Standards (NTS) to the Brazilian Standards (ABNT) Guide 2 and ABNT ISO/IEC Directive - Part 3 as well as the logic that lays underneath the development, the adoption and the application of norms within the scope of the Brazilian Air Force system s metrology. As a result of a survey on demand for metrology standards performed at the 43 calibrations laboratories which integrate SISMETRA nationwide, this master s degree research carried out a thorough review of the pros and cons of the existing system, and 69 titles of standards/procedures needed to reduce (or overcome) vulnerabilities and/or to improve its operation. The development of the undertaken survey on demand for standards in metrology, by itself, have stimulated a wide reflection and awareness on the importance of the standardization within SISMETRA s laboratories nationwide. This system is considered a model for future actions to erect an integrated standardization system. Seen as strategic subsidy, this master s degree research work may contribute to a future development of an integrated metrology system to meet the Ministry of Defense s needs.

L'accès à Internet des îles de la Zone Océan Indien a la particularité d’utiliser deux longs câbles sous-marins. Les routes ont en commun de passer par un de ces liens et d’introduire une composante de délai qui peut être significative. La performance de TCP est liée à l’état des routes et au délai. Dans la situation de l'île de la Réunion, comment se comporte un protocole ayant une dépendance au délai tel que TCP ? Dans cette thèse, nous proposons une étude de l'Internet à La Réunion. Les travaux visent à pouvoir dresser un bilan de la connectivité Internet. Ils s'orientent d'une part à caractériser la connectivité au niveau du réseau et d'autre part à traduire ses caractéristiques au niveau de la couche de transport. Ainsi, les travaux présentés reposent sur deux études de métrologie sur le réseau réunionnais. Le premier examen a pour objectif la caractérisation des délais et des routes empruntées depuis et en direction de l'île. Ces travaux reposent sur une plate-forme de mesures mise en place à cet effet. Un outil d'identification des routes a été développé afin d'analyser les chemins depuis et vers la Réunion. Cet outil utilise une base de données de géolocalisation construite à partir des adresses IP rencontrées, des délais associés et d'informations provenant des Registres Internet Régionaux. L’analyse des résultats montre des caractéristiques propres à la région Réunion. La seconde étude de métrologie vise l'analyse des flux TCP. Des métriques associées à l'observation des captures de trafic sont identifiées afin d’établir les performances de TCP mais également les types de trafic entrant et sortant de l'île. Le volume des écoutes étant important, un outil d'analyse pour des traitements efficaces et rapides a également été développé. Les contributions de cette thèse sont d'abord rattachées au contexte réunionnais et sont extrapolées vers l'internet de la Zone Océan Indien. Cette thèse se veut être un élément pour une réflexion avec l'ensemble des acteurs de l'Internet à La Réunion. / The access to the Internet of the Islands of the Indian Ocean Area has the particularity of using two long submarines cables. The routes have in common to go through one of these links and introduce a delay component that can be significant. The performance of TCP is linked to the state of the route and the delay. In the situation of Reunion Island, how does a protocol having a dependence on delay such as TCP behaves? In this thesis, we propose a study of the Internet in Reunion Island. The work aims to be able to take stock of Internet connectivity. They are oriented on the one hand to characterize the connectivity at the level of the network and on the other hand to translate these characteristics at the level of the transport layer. Thus, the works presented are based on two metrology studies on the Reunion network. The first review aims to characterize the delays and the routes taken from and to the island. This work is based on a platform of measures put in place for this purpose. A road identification tool has been developed to analyze roads to and from Reunion Island. This tool uses a geolocation database built from IP addresses encountered, associated delays and information from the Regional Internet Registries. The analysis of the results shows characteristics specific to the Réunion region. The second metrology study aims to analyze TCP flows. Metrics associated with the observation of the catches of traffic are identified in order to establish the performances of TCP but also the types of traffic entering and leaving the island. Since the volume of the intercepts is important, an analysis tool for efficient and rapid treatments has been developed. The contributions of this thesis are first of all related to the Reunionese context and are extrapolated to the Internet of the Indian Ocean Zone. This thesis is meant to be an element for a reflection with all the actors of the Internet in Reunion Island.

[pt] Detectores de fótons únicos baseados em fotodiodos de avalanche (SPADs) são essenciais em aplicações que requerem alta resolução, como comunicações quânticas e metrologia quântica. O efeito da largura de janela de detecção temporal de fótons é pouco explorado, e não há estudos para a faixa de comprimentos de onda de interesse em telecomunicações em torno de: 1550 nm. Neste trabalho, apresenta-se uma proposta para análise de impacto da largura de janela de detecção de um SPAD de InGaAs/InP, realizando uma análise da estatística entre detecções consecutivas e da probabilidade de detecção de 0 ou 1 evento em função da atenuação óptica. Variou-se o número médio de fótons por janela medido pelo SPAD, e os resultados foram avaliados para os valores de 4 ns, 8 ns, 12 ns, 16 ns e 20 ns de largura de janela de detecção, sendo estimada a Incerteza de Medição Expandida para cada ensaio. Os resultados obtidos indicam uma faixa adequada de potência óptica para calibração de um SPAD com eficiência de detecção de 15 porcento e um tempo morto de 1 microssegundo, no intervalo de 10 nW a 0,15 nW. Nesta faixa de potência, os respectivos produtos associados ao efetivo número médio de fótons por janela de detecção correspondem aos valores de 190 x 10-(4) a 0,32 x 10(-4) (para 4 ns) e 140 x 10(-4) a 2,9 x 10(-4) (para 8 ns). Foram obtidos comportamentos lineares para os ajustes das curvas de calibração para larguras de janela de 4 ns e 8 ns. / [en] Single photon detectors based on avalanche photodiodes (SPADs) are essential in applications that require high resolution, such as quantum communications and quantum metrology. The effect of the width of photon detection gate is little explored, and there are no studies for the wavelength range of interest in telecommunications around 1550 nm. In this work, a proposal is presented for analyzing the impact of the detection gate width of an InGaAs/InP SPAD, performing a statistical analysis of consecutive detections and the probability detection of 0 or 1 events depending on the optical attenuation. The average number of photons per gate measured by the SPAD was varied, and the results were evaluated for the values of 4 ns, 8 ns, 12 ns, 16 ns and 20 ns of detection gate widths, and Expanded Measurement Uncertainty was estimated for each test. The results obtained indicate an adequate optical power range for calibrating a SPAD with a detection efficiency of 15 percent and dead – time of 1 microssecond, in the range of 10 nW to 0,15 nW. In this power range, the respective products, which are associated with an effective average number of photons per gate window, correspond to the values of 190 x 10(-4) to 0,32 x 10(-4) (for 4 ns) e 140 x 10(-4) to 2,9 x 10(-4) (for 8 ns). Linear behaviors were obtained for the adjustment of the calibration curves for gate widths of 4 ns and 8 ns.

A method for measuring the thickness and surface profiles of soft contact lenses while submerged in a saline solution has been implemented utilizing a low coherence Twyman-Green Interferometer. Although the original measurements demonstrated that features on the contact lens surfaces could be accurately determined, it was believed that the layout of the system also induced surface profile distortions. A new opto-mechanical layout has been implemented which eliminates many of these low frequency distortions. Improvements to the original phase unwrapping algorithms have also been developed to overcome the low visibility output inherent to the measurement allowing for a more complete analysis of the two surfaces of a contact lens.