The test of digital integrated circuits compares the test pattern results for the device under test (DUT) to the expected test pattern results of a standard reference. The standard response is typically obtained from simulations. The test pattern and response are created and evaluated assuming ideal test conditions. The standard response is normally stored within automated test equipment (ATE). However the use of ATE is the major contributor to the test cost. This thesis explores an alternative strategy to the standard response. As an alternative to the stored standard response, the response is estimated by fault tolerant technique. The purpose of the fault tolerant technique is to eliminate the need of standard response and enable online/real-time testing. Fault tolerant techniques use redundancy and majority voting to estimate the standard response. Redundancy in the circuit leads to fault aliasing. Fault aliasing misleads the majority voter in estimating the standard response. The statistics and phenomenon of aliasing are analyzed for benchmark circuits. The impact of fault aliasing on test with respect to coverage, test escape and over-kill is analyzed. The results show that aliasing can be detected with additional test vectors and get 100% fault coverage.

Este trabalho aborda um sistema de aquisição de dados (SAD) analógico-digital, baseado em um esquema redundante com diversidade de projeto, que é testado em dois ambientes diferentes de radiação. O primeiro experimento considera um teste de dose total ionizante (Total Ioninzig Dose - TID) sob irradiação gama, e o segundo experimento considera os efeitos de eventos singulares (Single Event Effects - SEE) sob irradiação por íons pesados. O SAD é composto, principalmente, por três conversores analógicos-digitais (ADCs) e dois votadores. A técnica usada é a Redundância Modular Tripla (Triple Modular Redundancy - TMR), com implementação em diferentes níveis de diversidade (temporal e arquitetural). O sistema é construído em um System-on-Chip programável (PSoC 5LP) da Cypress Semiconductor, fabricado em tecnologia CMOS de 130nm. Para a irradiação com TID, se utiliza o PSoC de part number CY8CKIT-050 sob uma fonte de radiação gama de 60Co (cobalto-60), com uma taxa de dose efetiva de 1 krad(Si)/h por 10 dias, atingindo uma dose total de 242 krad(Si) Para SEE se utiliza o protótipo PSoC de part number CY8CKIT-059 (sem encapsulamento) em um acelerador de partículas 8UD Pelletron usando 16O (oxigeno-16) ao vácuo, com energia de 36 MeV em um LET aproximado de 5.5 MeV/mg/cm2 e uma penetração no silício de 25 mm, resultando em um fluxo de 354 p/cm2.s, e uma fluência de 5077915 p/cm2 depois de 14755 segundos (4h 09min). Observou-se com o resultado do primeiro estudo que um (1) dos módulos do sistema apresentou uma degradação significativa na sua linearidade durante a irradiação, enquanto os outros tiveram uma degradação menos grave, mantendo assim a funcionalidade e confiabilidade do sistema. Durante o tempo de irradiação do segundo estudo, foram observadas 139 falhas: 53 SEFIs (Single Events Funtional Interrupt), 29 falhas críticas e 57 falhas SDC (Silent Data Corruption), atingindo as diferentes copias do sistema e um dos votadores do mesmo, mas sempre mantendo a saída esperada. Nos dois experimentos se evidencia a vantagem de usar a diversidade de projeto, além do TMR, para melhorar a resiliência e confiabilidade em sistemas críticos redundantes que trabalham com sinais mistos. / This work presents an analog-to-digital data acquisition system (DAS) based on a redundant scheme with design diversity, being tested in two different radiation environments. The first experiment is a Total Ionizing Dose (TID) essay and the second one considers Single Event Effects (SEE) under heavy ion irradiation. The DAS is mainly composed of three analog-todigital converters (ADCs) and two voters. The used technique was the Triple Modular Redundancy (TMR) implementing different levels of diversity (temporal and architectural). The circuit was built in a programmable System-on-Chip (PSoC 5LP) from Cypress Semiconductor, fabricated in a 130nm CMOS technology process. For the irradiation with TID the part number CY8CKIT-050 PSoC was used under a 60Co (cobalt-60) gamma radiation source, with an effective dose rate of 1 krad(Si)/h during 10 days, reaching a total dose of 242 krad(Si). For SEE experiments the part number CY8CKIT-059 (without encapsulation) PSoC prototype under a 8UD Pelletron particle accelerator using 16O (oxigen-16) under vacuum, with an energy of 36 MeV, resulting in a flux of 354p/cm2.s and a fluence of 5077915p/cm2 after 14755 seconds (4h 09min). As result of the first study it was observed that one of the system’s modules presented a significant degradation in its linearity during the irradiation, while degradations in the other modules were not as deep, maintaining the system’s functionality and reliability. During the period of the radiation of the second study, 139 faults were observed, 82 of them were critical and 57 were SDC (Silent Data Corruption), reaching the different system copies and one of the voters, while always maintaining the correct output. The advantage of using diversity, besides TMR, to improve resilience and reliability in redundant systems working with mixed signals was demonstrated in both experiments.

This dissertation studies the effects of radiation-induced single-event upsets (SEUs) on digital signal processing (DSP) systems designed for field-programmable gate arrays (FPGAs). It presents a novel method for evaluating the effects of radiation on DSP and digital communication systems. By using an application-specific measurement of performance in the presence of SEUs, this dissertation demonstrates that only 5-15% of SEUs affecting a communications receiver (i.e. 5-15% of sensitive SEUs) cause critical performance loss. It also reports that the most critical SEUs are those that affect the clock, global reset, and most significant bits (MSBs) of computation. This dissertation also demonstrates reduced-precision redundancy (RPR) as an effective and efficient alternative to the popular triple modular redundancy (TMR) for FPGA-based communications systems. Fault injection experiments show that RPR can improve the failure rate of a communications system by over 20 times over the unmitigated system at a cost less than half that of TMR by focusing on the critical SEUs. This dissertation contrasts the cost and performance of three different variations of RPR, one of which is a novel variation developed here, and concludes that the variation referred to as "Threshold RPR" is superior to the others for FPGA systems. Finally, this dissertation presents several methods for applying Threshold RPR to a system with the goal of reducing mitigation cost and increasing the system performance in the presence of SEUs. Additional fault injection experiments show that optimizing the application of RPR can result in a decrease in critical SEUs by as much 65% at no additional hardware cost.

Este trabalho aborda um sistema de aquisição de dados (SAD) analógico-digital, baseado em um esquema redundante com diversidade de projeto, que é testado em dois ambientes diferentes de radiação. O primeiro experimento considera um teste de dose total ionizante (Total Ioninzig Dose - TID) sob irradiação gama, e o segundo experimento considera os efeitos de eventos singulares (Single Event Effects - SEE) sob irradiação por íons pesados. O SAD é composto, principalmente, por três conversores analógicos-digitais (ADCs) e dois votadores. A técnica usada é a Redundância Modular Tripla (Triple Modular Redundancy - TMR), com implementação em diferentes níveis de diversidade (temporal e arquitetural). O sistema é construído em um System-on-Chip programável (PSoC 5LP) da Cypress Semiconductor, fabricado em tecnologia CMOS de 130nm. Para a irradiação com TID, se utiliza o PSoC de part number CY8CKIT-050 sob uma fonte de radiação gama de 60Co (cobalto-60), com uma taxa de dose efetiva de 1 krad(Si)/h por 10 dias, atingindo uma dose total de 242 krad(Si) Para SEE se utiliza o protótipo PSoC de part number CY8CKIT-059 (sem encapsulamento) em um acelerador de partículas 8UD Pelletron usando 16O (oxigeno-16) ao vácuo, com energia de 36 MeV em um LET aproximado de 5.5 MeV/mg/cm2 e uma penetração no silício de 25 mm, resultando em um fluxo de 354 p/cm2.s, e uma fluência de 5077915 p/cm2 depois de 14755 segundos (4h 09min). Observou-se com o resultado do primeiro estudo que um (1) dos módulos do sistema apresentou uma degradação significativa na sua linearidade durante a irradiação, enquanto os outros tiveram uma degradação menos grave, mantendo assim a funcionalidade e confiabilidade do sistema. Durante o tempo de irradiação do segundo estudo, foram observadas 139 falhas: 53 SEFIs (Single Events Funtional Interrupt), 29 falhas críticas e 57 falhas SDC (Silent Data Corruption), atingindo as diferentes copias do sistema e um dos votadores do mesmo, mas sempre mantendo a saída esperada. Nos dois experimentos se evidencia a vantagem de usar a diversidade de projeto, além do TMR, para melhorar a resiliência e confiabilidade em sistemas críticos redundantes que trabalham com sinais mistos. / This work presents an analog-to-digital data acquisition system (DAS) based on a redundant scheme with design diversity, being tested in two different radiation environments. The first experiment is a Total Ionizing Dose (TID) essay and the second one considers Single Event Effects (SEE) under heavy ion irradiation. The DAS is mainly composed of three analog-todigital converters (ADCs) and two voters. The used technique was the Triple Modular Redundancy (TMR) implementing different levels of diversity (temporal and architectural). The circuit was built in a programmable System-on-Chip (PSoC 5LP) from Cypress Semiconductor, fabricated in a 130nm CMOS technology process. For the irradiation with TID the part number CY8CKIT-050 PSoC was used under a 60Co (cobalt-60) gamma radiation source, with an effective dose rate of 1 krad(Si)/h during 10 days, reaching a total dose of 242 krad(Si). For SEE experiments the part number CY8CKIT-059 (without encapsulation) PSoC prototype under a 8UD Pelletron particle accelerator using 16O (oxigen-16) under vacuum, with an energy of 36 MeV, resulting in a flux of 354p/cm2.s and a fluence of 5077915p/cm2 after 14755 seconds (4h 09min). As result of the first study it was observed that one of the system’s modules presented a significant degradation in its linearity during the irradiation, while degradations in the other modules were not as deep, maintaining the system’s functionality and reliability. During the period of the radiation of the second study, 139 faults were observed, 82 of them were critical and 57 were SDC (Silent Data Corruption), reaching the different system copies and one of the voters, while always maintaining the correct output. The advantage of using diversity, besides TMR, to improve resilience and reliability in redundant systems working with mixed signals was demonstrated in both experiments.

Este trabalho aborda um sistema de aquisição de dados (SAD) analógico-digital, baseado em um esquema redundante com diversidade de projeto, que é testado em dois ambientes diferentes de radiação. O primeiro experimento considera um teste de dose total ionizante (Total Ioninzig Dose - TID) sob irradiação gama, e o segundo experimento considera os efeitos de eventos singulares (Single Event Effects - SEE) sob irradiação por íons pesados. O SAD é composto, principalmente, por três conversores analógicos-digitais (ADCs) e dois votadores. A técnica usada é a Redundância Modular Tripla (Triple Modular Redundancy - TMR), com implementação em diferentes níveis de diversidade (temporal e arquitetural). O sistema é construído em um System-on-Chip programável (PSoC 5LP) da Cypress Semiconductor, fabricado em tecnologia CMOS de 130nm. Para a irradiação com TID, se utiliza o PSoC de part number CY8CKIT-050 sob uma fonte de radiação gama de 60Co (cobalto-60), com uma taxa de dose efetiva de 1 krad(Si)/h por 10 dias, atingindo uma dose total de 242 krad(Si) Para SEE se utiliza o protótipo PSoC de part number CY8CKIT-059 (sem encapsulamento) em um acelerador de partículas 8UD Pelletron usando 16O (oxigeno-16) ao vácuo, com energia de 36 MeV em um LET aproximado de 5.5 MeV/mg/cm2 e uma penetração no silício de 25 mm, resultando em um fluxo de 354 p/cm2.s, e uma fluência de 5077915 p/cm2 depois de 14755 segundos (4h 09min). Observou-se com o resultado do primeiro estudo que um (1) dos módulos do sistema apresentou uma degradação significativa na sua linearidade durante a irradiação, enquanto os outros tiveram uma degradação menos grave, mantendo assim a funcionalidade e confiabilidade do sistema. Durante o tempo de irradiação do segundo estudo, foram observadas 139 falhas: 53 SEFIs (Single Events Funtional Interrupt), 29 falhas críticas e 57 falhas SDC (Silent Data Corruption), atingindo as diferentes copias do sistema e um dos votadores do mesmo, mas sempre mantendo a saída esperada. Nos dois experimentos se evidencia a vantagem de usar a diversidade de projeto, além do TMR, para melhorar a resiliência e confiabilidade em sistemas críticos redundantes que trabalham com sinais mistos. / This work presents an analog-to-digital data acquisition system (DAS) based on a redundant scheme with design diversity, being tested in two different radiation environments. The first experiment is a Total Ionizing Dose (TID) essay and the second one considers Single Event Effects (SEE) under heavy ion irradiation. The DAS is mainly composed of three analog-todigital converters (ADCs) and two voters. The used technique was the Triple Modular Redundancy (TMR) implementing different levels of diversity (temporal and architectural). The circuit was built in a programmable System-on-Chip (PSoC 5LP) from Cypress Semiconductor, fabricated in a 130nm CMOS technology process. For the irradiation with TID the part number CY8CKIT-050 PSoC was used under a 60Co (cobalt-60) gamma radiation source, with an effective dose rate of 1 krad(Si)/h during 10 days, reaching a total dose of 242 krad(Si). For SEE experiments the part number CY8CKIT-059 (without encapsulation) PSoC prototype under a 8UD Pelletron particle accelerator using 16O (oxigen-16) under vacuum, with an energy of 36 MeV, resulting in a flux of 354p/cm2.s and a fluence of 5077915p/cm2 after 14755 seconds (4h 09min). As result of the first study it was observed that one of the system’s modules presented a significant degradation in its linearity during the irradiation, while degradations in the other modules were not as deep, maintaining the system’s functionality and reliability. During the period of the radiation of the second study, 139 faults were observed, 82 of them were critical and 57 were SDC (Silent Data Corruption), reaching the different system copies and one of the voters, while always maintaining the correct output. The advantage of using diversity, besides TMR, to improve resilience and reliability in redundant systems working with mixed signals was demonstrated in both experiments.

FPGAs are frequently used in network systems to provide the performance and flexibility that is required of modern computer networks while allowing network vendors to bring products to market quickly. Like all electronic devices, FPGAs are vulnerable to ionizing radiation which can cause applications operating on an FPGA to fail. These low-level failures can have a wide range of negative effects on the performance of a network system. As computer networks play a larger role in modern society, it becomes increasingly important that these soft errors are addressed in the design of network systems.This work presents a framework for testing the soft-error reliability of FPGA-based networking systems. The framework consists of the NetFPGA development board, a custom traffic generator, and a custom high-speed JTAG configuration device. The NetFPGA development board is versatile and can be used to implement a wide range of network applications. The traffic generator is used to exercise the network system on the NetFPGA and to determine the health of that system. The JTAG configuration device is used to manage reliability experiments, to perform fault injection into the FPGA, and to monitor the NetFPGA during radiation tests.This thesis includes soft-error reliability tests that were performed on an Ethernet switch network system. Using both fault injection and accelerate radiation testing, the soft error sensitivity of the Ethernet switch was measured. The Ethernet switch design was then mitigated using triple module redundancy and duplication with compare. These mitigated designs were also tested and compared against the baseline design. Radiation testing shows that TMR provides a 5.05x improvement in reliability over the baseline design. DWC provides a 5.22x improvement in detectability over the baseline design without reducing the reliability of the system.

This dissertation studies the effects of radiation-induced single-event upsets (SEUs) on field-programmable gate array(FPGA)-based circuits. It analyzes and quantifies a special case in data communication, that is, the synchronization issue of signals when they are sent across clock domains in triple modular redundancy (TMR) circuits with the presence of SEUs. After demonstrating that synchronizing errors cannot be eliminated in such case, this dissertation continues to present novel synchronizer designs that can guarantee reliable synchronization of triplicated signals. Fault injection tests then show that the proposed synchronizers provide between 6 and 10 orders of magnitude longer mean time to failure (MTTF) than unmitigated synchronizers. This dissertation also studies the reliability of block random access memory (BRAM) on FPGAs. By investigating several previous reliability models for single-error correction/double-error detection (SEC/DED) memory with scrubbing, this dissertation proposes two novel MTTF models that are suitable for FPGA applications. The first one considers non-uniform write rates for probabilistic write scrubbing, and the second one combines deterministic scrubbing and probabilistic scrubbing into a single model. The proposed models reveal the impact of memory access patterns on the reliability of BRAMs. Monte Carlo simulations then demonstrate the correctness of the proposed models. At last, the memory access patterns of a type of FPGA application, digital signal processing (DSP) is studied, and mitigation mechanisms for DSP applications are discussed.

Objektdetektering har fått stort forskningsintresse de senaste åren, eftersom det är maskiners ögon och är en grundläggande uppgift inom datorseende som syftar till att identifiera och lokalisera föremål av intresse. Hårdvaruacceleratorer syftar vanligtvis till att öka genomströmningen för realtidskrav samtidigt som energiförbrukningen sänks. Studier av feltolerans säkerställer att algoritmen utförs korrekt även med felpresentation. Denna avhandling täcker dessa ämnen och tillhandahåller en Field-Programmable Gate Array (FPGA)-implementering av en objektdetekteringsalgoritm, You Only Look Once (YOLO), samtidigt som man undersöker implementeringens feltolerans. En baslinjeimplementering på FPGA tillhandahålls först och sedan tillämpas, implementeras och testas två feltoleranta implementeringar, en med trippelmodulär redundans och en med tidsredundans. Fastnade fel injiceras i implementeringarna för att studera feltoleransen. Vår FPGA-implementering av YOLO ger en höghastighets, låg strömförbrukning och mycket konfigurerbar hårdvaruaccelerator för objektdetektering. I detta examensarbete görs implementeringsdesignen med en kombination av egendesignade moduler med VHDL och Xilinx-försedd Intellectual Property (IP). Jämfört med andra forsknings- eller öppen källkodsversioner som använder High-Level Synthesis (HLS), är denna design mer konfigurerbar för framtida referenser och tar bort onödiga hårdvarusvarta lådor. Jämfört med andra studier om hårdvaruacceleratorer fokuserar denna avhandling på feltolerans. Detta examensarbete skapar utrymme för mer arbete med att utforska feltolerans, t.ex. skapa en mer feltolerant implementering eller undersöka hur vissa fel kan påverka resultatet. Det är också möjligt att använda implementeringen från denna avhandling som baslinje för andra forskningsändamål, eftersom implementeringen är fristående och mycket konfigurerbar. / Object detection gets great research interest in recent years, as it is the eyes of machines and is a fundamental task in computer vision that aims at identifying and locating objects of interest. Hardware accelerators usually aim at boosting the throughput for real-time requirements while lowering power consumption. Studies on fault tolerance ensure the algorithm to be performed correctly even with error presenting. This thesis covers these topics and provides a Field-Programmable Gate Array (FPGA) implementation of an object detection algorithm, You Only Look Once (YOLO), while investigating the fault tolerance of the implementation. A baseline implementation on FPGA is first provided and then two fault-tolerant implementations, one with triple-modular redundancy and one with time redundancy are applied, implemented, and tested. Stuck-at faults are injected into the implementations to study the fault tolerance. Our FPGA implementation of YOLO provides a high-speed, low-power-consumption, and highly-configurable hardware accelerator for object detection. In this thesis, the implementation design is done with a combination of self-designed modules with VHDL and Xilinx-provided Intellectual Property (IP). Compared to other research or open-source versions using High-Level Synthesis (HLS), this design is more configurable for future references and removes unnecessary hardware black boxes. Compared to other studies on hardware accelerators, this thesis focuses on fault tolerance. This thesis creates space for more work on exploring fault tolerance, e.g., creating a more fault-tolerant implementation or investigating how certain faults could affect the result. It is also possible to use the implementation from this thesis as a baseline for other research purposes, as the implementation is stand-alone and highly configurable.

Este trabalho aborda os soft errors em conversores de dados analógico-digitais e a mitigação usando redundância e diversidade. Nas tecnologias CMOS recentes, os efeitos singulares (SEEs, Single Event Effects) são um grupo de efeitos da radiação espacial que afetam a confiabilidade e disponibilidade dos sistemas. Os soft errors são SEEs que não danificam diretamente o sistema e podem ser posteriormente corrigidos. Seus principais subgrupos são o Single Event Upset (SEU), o Single Event Transient (SET) e o Single Event Functional Interrupt (SEFI). Uma das técnicas em nível de sistema amplamente usadas para proteger os circuitos eletrônicos desses efeitos é a Redundância Modular Tripla (TMR, Triple Modular Redundancy), que pode ainda ser melhorada com a adição da técnica de diversidade. Nesse contexto, esse trabalho adota um esquema baseado nessas duas técnicas para a implementação de um sistema de aquisição de dados (SAD) analógico-digital. Seus objetivos são observar o comportamento dos conversores de dados frente aos soft errors e avaliar a eficácia de um sistema baseado em TMR e diversidade espacial-temporal contra esses efeitos da radiação. A implementação desse SAD em um SoC (System-on-Chip) da Cypress Semiconductor, chamado PSoC 5LP e fabricado em tecnologia CMOS de 130 nm, propiciou a realização de dois estudos: no primeiro, é realizada a irradiação com nêutrons, caso de particular interesse para os equipamentos eletrônicos embarcados em aviões; e no segundo, são realizadas injeções de falhas por software e em tempo de execução nos registradores de controle dos periféricos e na SRAM do PSoC 5LP. O resultado da irradiação do primeiro estudo foi a não observância de erros, o que impediu cumprir os objetivos propostos para esse teste. Essa situação permitiu duas observações principais: primeiro, o fluxo de nêutrons do experimento é uma característica fundamental que impacta na capacidade de se observar os efeitos da radiação, principalmente quando a seção de choque do circuito em análise é baixa; e segundo, de que a probabilidade de ocorrerem mascaramentos de SETs nos circuitos combinacionais e analógicos é elevada, o que contribui significativamente para reduzir a sensibilidade desses circuitos. Para avaliar a eficácia do sistema baseado em TMR e diversidade espacial-temporal foi então realizada uma investigação teórica baseada em análise combinatória, e os resultados mostraram que a adição de diversidade temporal gera, em comparação ao TMR clássico, um ganho significativo na tolerância de falhas duplas e múltiplas, ao preço de um aumento do atraso do circuito. Os resultados das injeções de falhas por software e em tempo de execução nos registradores de controle dos periféricos e na SRAM mostraram que apenas um baixo percentual das falhas injetadas é detectado na forma de erros, convergindo para a justificativa de que os mascaramentos foram determinantes para a não observância de erros no primeiro estudo, de injeção de falhas por radiação. Também verificou-se que os registradores de controle dos periféricos são mais importantes no nível de aplicação do que os dados da memória SRAM. Considerações sobre a auto injeção de falhas e auto monitoramento sugerem que a utilização desses conceitos pode trazer diversas limitações e complicadores aos testes. / The present thesis addresses the soft errors in analog-to-digital data converters and mitigation of such errors using redundancy and diversity. In modern CMOS technologies, the Single Event Effects (SEEs) comprises an important group of space radiation effects that influence the reliability and availability of the systems. Soft errors are SEEs that do not directly damage the system and that can be further corrected. Their main subgroups are the Single Event Upset (SEU), the Single Event Transient (SET) and the Single Event Functional Interrupt (SEFI). One of the system level techniques broadly used to protect the electronic circuits against these effects is the Triple Modular Redundancy (TMR), which may be improved with the addition of the diversity technique. In this context, this work proposes a scheme based on these two techniques to implement a tolerant analog-to-digital data acquisition system (DAS). The main objectives are to observe the behavior of the data converters under soft errors, and evaluate the effectiveness of a system based on TMR and spatial-temporal diversity on mitigating these radiation effects. The implementation of this DAS in a Programmable SoC (System-on-Chip) from Cypress Semiconductor (PSoC 5LP) manufactured in 130 nm CMOS, allowed the development of two studies. In the first one, an irradiation with neutrons is performed, case of particular interest to electronic equipment embedded on planes. In the second study, runtime software fault injections are performed at the peripheral control registers and SRAM of the studied device. As a result from irradiation on the first study no errors were found, what does not allowed meet the objectives of this test. This situation allow two main observations: first, the neutron flux of the experiment is a key feature that influences the ability to observe the radiation effects, mainly when the cross section of the circuit in analysis is low; and second, the probability of occurring SETs masking in combinational and analog circuits is high, which contributes significantly to reduce the sensibility of these circuits. To evaluate the effectiveness of a system based on TMR and spatial-temporal diversity then was performed a theoretical investigation based on combinatorial analysis, and the results show that the addition of temporal diversity generates a significant gain in tolerating double and multiple faults, if compared to the classical TMR, at the price of an increase in the circuit delay. The results of the second study, performed by runtime software fault injections at the peripheral control registers and SRAM, showed that only a low percentage of injected faults is detected as errors, according to the justification that no errors were found on irradiation of neutrons due to masking. Also was verified that at the application level the peripheral control registers are more important than the data stored in the SRAM memory. Considerations for faults self-injection and self-monitoring were done, suggesting that the use of these concepts may bring numerous limitations to the test.

O desafio de implementar tolerância a falhas em sistemas embarcados advém das restrições físicas de ocupação de área, dissipação de potência e consumo de energia desses sistemas. A necessidade de otimizar essas três restrições de projeto concomitante à computação dentro dos requisitos de desempenho e de tempo-real cria um problema difícil de ser resolvido. Soluções clássicas de tolerância a falhas tais como redundância modular dupla e tripla não são factíveis devido ao alto custo em potência e a falta de um mecanismo para se recuperar erros. Apesar de algumas técnicas existentes reduzirem o overhead de potência e área, essas incorrem em alta degradação de desempenho e muitas vezes assumem um modelo de falhas que não é factível. Essa tese introduz a Pilha de HW/SW Transacional, ou simplesmente Pilha, para gerenciar de maneira eficiente as restrições de área, potência, cobertura de falhas e desempenho. A Pilha introduz uma nova estratégia de compilação que organiza os programas em Blocos Básicos Transacionais (BBT), juntamente com um novo processador, a Arquitetura de Blocos Básicos Transacionais (ABBT), a qual provê detecção e recuperação de erros de grão fino e determinística ao usar o BBT como um contâiner de erros e como unidade de checkpointing. Duas soluções para prover a semântica de execução do BBT em hardware são propostas, uma baseada em software e a outra em hardware. A área, potência, desempenho e cobertura de falhas foram avaliadas através do modelo de hardware do ABBT. A Pilha provê uma cobertura de falhas de 99,35%, com overhead de 2,05 em potência e 2,65 de área. A Pilha apresenta overhead de desempenho de 1,33 e 1,54, dependento do modelo de hardware usado para suportar a semântica de execução do BBT. / Fault tolerance implementation in embedded systems is challenging because the physical constraints of area occupation, power dissipation, and energy consumption of these systems. The need for optimizing these three physical constraints while doing computation within the available performance goals and real-time deadlines creates a conundrum that is hard to solve. Classical fault tolerance solutions such as triple and dual modular redundancy are not feasible due to their high power overhead or lack of efficient and deterministic error recovery. Existing techniques, although some of them reduce the power and area overhead, incur heavy perfor- mance penalties and most of the time do not assume a feasible fault model. This dissertation introduces the Transactional HW/SW Stack, or simply Stack, to effi- ciently manage the area, power, fault coverage, and performance conundrum. The Stack introduces a new compilation strategy that assembles programs into Transac- tional Basic Blocks, together with a novel microprocessor, the TransactiOnal Basic Block Architecture (ToBBA), which provides fine-grained error detection and deter- ministic error rollback and elimination using the Transactional Basic Blocks (TBBs) both as a container for errors and as a small unit of data checkpointing. Two so- lutions to sustain the TBB semantics in hardware are introduced: software- and hardware-based. Stack’s area, power, performance, and coverage were evaluated using ToBBA’s hardware implementation model. The Stack attains an error correc- tion coverage of 99.35% with 2.05 power overhead within an area overhead of 2.65. The Stack also presents a performance overhead of 1.33 or 1.54, depending on the hardware model adopted to support the TBB.