The exploitation of the soft x-ray/extreme ultra-violet (EUV) region of the electromagnetic spectrum is possible mainly due to the development of multilayer (ML) mirrors. This region of the electromagnetic spectrum offers great opportunities in both science and technology. The shorter wavelength allows one to see smaller features in microscopy and write finer features in lithography. High reflectivity with moderate spectral bandwidth at normal/near-normal incidence can be achieved in soft x-ray/ EUV spectral range using these ML mirrors, where natural crystals with the required large periodicity are not available. These MLs are generally artificial Bragg’s reflectors, which consist of alternative high and low density materials with periodicity in the nanometer range. The main advantages of ML optics stem from the tunability of layer thickness, composition, lateral gradient, and the gradient along the normal to the substrate; these can be tailored according to the desired wavelength regime. They have the great advantage of being adaptable to figured surfaces, enabling their use as reflective optics in these spectral regions, for focusing and imaging applications. Broadband reflectivity and wavelength tunability are also possible by using MLs with normal and lateral gradient, respectively. However, fabrication of these ML mirrors requires the capability to deposit uniform, ultra-thin (a few angstroms-thick) films of different materials with thickness control on the atomic scale. Thus, one requires a proper understanding of substrate surfaces, individual layers, chemical reactivity at interfaces and, finally, of the ML structures required for particular applications. The performance of these MLs is limited by (the lack of) contrast in optical constants of the two materials, interfacial roughness, the chemical reactivity of two materials and, finally, errors in the thickness of individual layers. Soft x-ray/extreme ultra-violet ML mirrors have found a wide range of applications in synchrotron radiation beam lines, materials science, astronomy, x-ray microscopy, x-ray laser, x-ray lithography, polarizers, and plasma diagnostics. The Indus–1 synchrotron radiation (SR) source is an operational 450 MeV machine, which produces radiation up to soft x-rays. Indus-2 is a 2.5 GeV machine, which has been commissioned recently to produce hard x-rays (E > 25 keV). The combination of Indus-1 and Indus-2 will cover a broad energy spectrum from IR to hard x-rays. Therefore, there is a significant need and opportunity to study MLs of different pairs of materials, with different parameters such as periodicity and optimum thickness of individual layers. The goal of the present thesis is to fabricate MLs for soft x-ray optics and to study their physics for application as polarizers in the wavelength range from 67 Å to 160 Å on the Indus-1 synchrotron source. To accomplish this task, a UHV electron beam evaporation system has been developed indigenously for the fabrication of MLs. Three different ML systems viz., Mo/Si, Fe/B4C and Mo/Y have been fabricated, and their surfaces and interfaces were investigated thoroughly for the polarizer application. X-ray reflectivity (XRR) has been used extensively in the investigations of these MLs. This is because XRR is a highly sensitive non-destructive technique for the characterization of buried interfaces, and gives microscopic information (at atomic resolution) over a macroscopic length scale (a few microns). Numerical analysis of XRR data has been carried out using computer programs. Depth-graded x-ray photoelectron spectroscopy (XPS) has been used for compositional analysis at interfaces for some of the ML structures, as a technique complementary to XRR. The performance of some of these MLs has been tested in the soft x-ray region, using the Indus-1 synchrotron radiation (SR) source. Prior to studying the MLs, a detailed study of the surfaces and interfaces of thin films, bi-layers, and tri-layers was carried out using XRR and the glancing incidence fluorescence technique. The discontinuous-to-continuous transition and the mode of film growth, which are vital to the optimization of layer thickness (basically for the high-atomic number or high-Z layer) in the ML structures, were also investigated using in situ sheet resistance measurement method. Indus-1 is a soft x-ray SR source that covers atomic absorption edges of many low-Z materials. The present work demonstrates the possibilities of characterizing low-Z thin films and multilayers using soft x-ray resonant reflectivity. In one case, we have shown for first time that soft x-ray resonant reflectivity can be employed as a non-destructive technique for the determination of interlayer composition. In a second study using the Indus-1 SR source, we have shown, by observing the effect of the anomalous optical constant on reflectivity pattern when photon energy is tuned across the atomic absorption edge of the constituent low-Z element, that soft x-ray resonant reflectivity is an element-specific technique. This thesis is organized into 7 chapters. A brief summary of individual chapters is presented below. Chapter 1 gives a brief general introduction to x-ray ML optics. This is followed by a discussion of the importance of the soft x-ray region of electromagnetic radiation. The optical properties of x-rays are reviewed and optical constants are calculated for some of the important materials used for x-ray MLs. The refractive index in the x-ray region being less than unity (except absorption edges), the consequent limitation of conventional transmission lenses is discussed. The limitation of glancing angle incidence optics is presented, motivating the need for ML optics, which is discussed along with a theoretically calculated reflectivity profile. The procedure for materials for the MLs for application in different spectral regions is discussed, along with a survey of literature related to the present thesis. The importance of the quality of surfaces and interfaces on the performance of ML structures has been shown through simulations. The applications of soft x-ray MLs are discussed with emphasis on polarization. This is followed by a review of different modes of growth of thin films. Finally, the scope of the present work is highlighted. Chapter 2 provides brief descriptions of the experimental techniques used in the present investigations and of the numerical methods employed for quantitative data analysis. The XRR technique is discussed elaborately because it has been used extensively. Detailed calculations of x-ray reflectivity from single surfaces, thin films and bi-layers are presented, along with simulated values. The effect of critical angle and Brewster’s angle is also discussed. Data analysis methods for computing x-ray reflectivity from multilayer structures, based on dynamical and kinematical models, have been discussed. The effect of roughness on XRR has been discussed based on the recursion formalism of dynamical theory. Simulations of XRR and experimental XRR data fitting are carried out using computer programs. The XRR experimental set up is also outlined. A theoretical background is given for the electrical measurements on thin films. This is followed by a brief overview of x-ray photoelectron spectroscopy (XPS) and interpretation of spectra. Finally, the glancing incidence x-ray fluorescence (GIXRF) technique is outlined. Chapter 3 describes in detail the ultra-high vacuum electron beam evaporation system developed in house especially for the fabrication of thin films and x-ray multilayer optics. At the outset, a brief overview of different deposition techniques commonly used for the fabrication of x-ray optical elements is presented. Design, fabrication, and assembly of different accessories are discussed. The control of thickness and uniformity of the films deposited has been checked through the experiments, whose results are provided. The results obtained for ML test structures are presented to show the capability of system in carrying out fabrication of high quality x-ray ML structures. Finally, the versatility of evaporation system incorporating in situ characterization facilities such as -situ electrical measurements for different substrate temperatures is illustrated. Chapter 4 presents a study of the growth of ultra-thin Mo films at different substrate temperatures using in situ sheet resistance measurements. First, a theoretical background is given on the different stages of island growth and on factors affecting thin film growth, followed by a discussion of the possible electrical conduction phenomena in continuous and discontinuous metal films. The nature of thin film growth and a detailed microscopic picture at different growth stages are derived from a modeling of sheet resistance data obtained in situ. The various conduction mechanisms have been identified in different stages of growth. In the island growth stage, the isotropic and anisotropic growth of Mo islands is identified from the model. In the insulator-metal transition region, experimentally determined values of critical exponent of conductivity agrees well with theoretically predicted values for a two-dimensional (2D) percolating system, revealing that Mo films on float glass substrate is predominantly a 2D structure. The minimum thickness for which Mo films becomes continuous is obtained as 1.8 nm and 2.2 nm for Mo deposited at substrate temperatures 300 K and 100 K, respectively. An amorphous-to- crystalline transition is also observed, and discussed. Chapter 5 covers the detailed study of the surfaces and interfaces studies in three different ML structures viz., Mo/Si, Fe/B4C and Mo/Y, meant for the polarizer application in the wavelength range of 67 Å to 160 Å. Multilayers with varying periodicity, varying number of layer pairs, and different ratios of high-Z layer thickness to the period, were fabricated using the electron beam system. Initially, a brief overview of the design aspects of ML structures is given, along with the theoretically calculated reflectivity at Brewster’s angle from the best material combinations. In Mo/Si MLs, the interlayer formed at the interfaces due to interdiffusion of the two elements is asymmetric in thickness, i.e., Mo-on-Si interlayer is thicker than the Si-on-Mo interlayer. To take account of these interlayers in XRR data fitting, a four layer model is considered. The effect of interlayers on reflectivity pattern was studied using simulations, and differences with respect to roughness are also discussed. The mechanism of formation of asymmetric interlayers is also discussed. The interlayer composition has determined using depth-graded XPS. The results reveal the formation of the MoSi2 composition at both the interfaces. The experimental results agree well with theoretical calculations based on solid-state amorphization reaction, which is a result of large heat of mixing. The effective heat of formation model reveals the formation of MoSi2 as the first phase. The soft x-ray reflectivity performance of the Mo/Si ML structure at Brewster’s angle is tested using Indus-1 synchrotron radiation (SR). Using XRR and GIXFR, a study of the surfaces and interfaces of bilayers of B4C-on-Fe and Fe-on- B4C, and tri-layers of Fe-B4C-Fe was carried out, with a systematic variation of Fe and B4C layer thicknesses. A sharp interface was observed in Fe-on-B4C, whereas a low density (w.r.t. Fe) interlayer is observed at the B4C-on-Fe interface. The interlayer properties fluctuates w.r.t. the bottom Fe layer thickness and is independent of the top B4C layer thickness. The nature of fluctuations has been discussed in detail. A study of the surfaces and interfaces of Fe/B4C MLs is described. Finally, a study of the surfaces and interfaces of bilayers, tri-layers, and MLs of the Mo/Y system is discussed in detail. Chapter 6 describes the application of soft x-ray resonant reflectivity for the characterization of low-Z thin films and interfaces in multilayer structures. Initially, a discussion of the energy dependence of atomic scattering factors and hence of optical constants is provided with simulations, with emphasis on the atomic absorption edge. Then, a brief overview of synchrotron radiation, with particular emphasis on the parameters of the Indus-1 synchrotron source is given. The possibilities of determining the composition of the buried interlayer with sub-nanometer scale sensitivity using soft x-ray resonant reflectivity are discussed. The methodology has been applied to study the Mo/Si interface both by simulations and by experiments on the Indus-1 SR, by tuning the photon energy to the Si L-absorption edge. Finally, direct evidence of elemental specificity of soft x-ray resonant reflectivity through the observation of the effect of anomalous optical constants on the reflectivity pattern is discussed. We demonstrate the method through simulations and experiments on the B4C material in B4C thin films and Fe/ B4C bi-layers, using Indus-1 SR tuned to the boron Kedge. Chapter 7 summarizes the main findings of the present work, and provides an outlook for further investigations in the field.

Spintronics in metallic multilayers, composed of ferromagnetic (F) and non-magnetic (N) metals, grew out of two complementary discoveries. The first, Giant Magnetoresistance (GMR), refers to a change in multilayer resistance when the relative orientation of magnetic moments in adjacent F-layers is altered by an applied magnetic field. The second, Spin-Transfer-Torque (STT), involves a change in the relative orientation of F-layer moments by an electrical current. This novel physical phenomenon offers unprecedented spatial and temporal control over the magnetic state of a ferromagnet and has tremendous potential in a broad range of technologies, including magnetic memory and recording. Because of its small size (<10nm), point contact is a very efficient probe of electrical transport properties in extremely small sample volumes yet inaccessible with other techniques. We have observed the point-contact excitations in magnetic multilayers at room temperature and extended the capabilities of our point-contact technique to include the sensitivity to wavelengths of the current-induced spin waves. Recently MacDonald and coworkers have predicted that similar to ferromagnetic multilayers, the magnetic state of an antiferromagnetic (AFM) system can affect its transport properties and result in antiferromagnetic analogue of giant magnetoresistance (GMR) = AGMR; while high enough electrical current density can affect the magnetic state of the system via spin-transfer-torque effect. We show that a high density dc current injected from a point contact into an exchange-biased spin valve (EBSV) can systematically change the exchange bias, increasing or decreasing it depending on the current direction. This is the first evidence for current-induced effects on magnetic moments in antiferromagnetic (FeMn or IrMn) metals. We searched for AGMR in multilayers containing different combinations of AFM=FeMn and F=CoFe layers. At low currents, no magnetoresistance (MR) was observed in any samples suggesting that no AGMR is present in these samples. In samples containing F-layers, high current densities sometimes produced a small positive MR – largest resistance at high fields. For a given contact resistance, this MR was usually larger for thicker F-layers, and for a given current, it was usually larger for larger contact resistances (smaller contacts). We tentatively attribute this positive MR to suppression at high currents of spin accumulation induced around and within the F-layers. / text

Magnetic properties of Nb/Ni superconducting (SC) / ferromagnetic (FM) multilayers exhibit interesting properties near and below SC transition. A complex Field (H) – Temperature (T) phase boundary is observed in perpendicular and parallel orientation of ML with respect to DC field. We address the critical need to develop methods to make reliable magnetic measurements on SC thin films and ML, in spite of their extreme shape anisotropy and the strong diamagnetic response of the SC state. Abrupt, highly reproducible “switching” of the SC state magnetization near the normal-state FM coercive fields has been observed in Nb/Ni ML. The SC penetration depth l(Nb) > the SC coherence length xo(Nb) » 40 nm >> the FM layer thickness y(Ni) = 5 nm, abrupt magnetic reversals might be driven by strong supercurrent densities (J x M torques) that have the potential to flow into the Ni layers. Alternatively, sharp magnetization anomalies also can result from strong flux pinning by the periodic layered structure of ML, including “lock-in” of quantized flux lines (FL) parallel to the ML plane. Strong confinement of the supercurrents within ML planes might also lead to various phase transitions of the FL lattice (FLL) composed of one-dimensional chains and other unusual structures. Possible mechanisms for the switching anomalies must be evaluated while considering other experimental properties of Nb(x)/Ni(y) ML: 1) The upper critical magnetic field Hc2(T) exhibits a highly unusual anisotropy where the SC transition temperature Tc (H®0) for DC field H ^ ML plane exceeds the value for H || ML by ~ 0.5 K. 2) Nb/Ni ML samples do not consistently exhibit magnetic signatures for the onset of superconductivity, depending on the details of the sample mounting procedure and the AC or DC method used in SQUID magnetometry experiments. 3) Unusual “wiggles” or oscillations of order 10-30 mK were observed in Hc2(T) in AC SQUID experiments with H || ML and can be even larger (~0.16 K), depending upon the AC drive amplitude ho and frequency f .

This thesis presents a study into structural colours that exist in natural samples, the principle aim of which is to produce experimental methods by which these colours may be examined and evaluated. In order to achieve this, previously observed structures are described, electromagnetic theory is summarised and a series of samples are examined constituting examples of the structures present in nature. The first sample discussed is the multilayer in the epicuticle of the buprestid beetle, C. raja. In order to evaluate the refractive indices of the layers contained within this structure, existing optical techniques are used to establish absolute reflection spectra for a number of angles of incidence in both linear polarisations. The approximate design for the structure is obtained by electron microscopy and modelled using Fresnel's equations. This model is then refined by a recursive least squares fitting routine to obtain the refractive indices. The second sample is the diffuse white scattering structure in the scales of two white beetles, Lepidiota stigma and Cyphochilus spp. The reflection from these scales is measured and found to be brilliantly white due to the irregular internal structure of the scales. Comparison of the Fast Fourier Transforms of TEM images of the internal structure with the diffraction pattern obtained from monochromatic laser light diffracting through a single scale demonstrate a link between this structure and photonic effects. The third sample type are found in the scales of the large true weevils, Eupholus schoenherri pettiti and E. magnificus. These scales are shown to have a domained structure in which the domains were oriented differently to each other. Single domains are shown to exhibit different colours at different orientation. The final sample is the highly regular 2-dimensional diffraction grating observed in a marine diatom, Coscinodiscus wailesii. Diffraction is demonstrated by measuring the in-plane diffraction from a single frustule for both monochromatic laser light and white light, showing an enhanced transmission for red wavelengths. Subsequent imaging of the transmitted diffraction pattern allows for the calculation of the transmitted power in each diffracted order.

Des revêtements céramiques sont obtenus par un procédé de dépôt chimique en phase vapeur assisté par injection liquide pulsée (DLICVD) de précurseurs organométalliques. Des dépôts de carbure de chrome (CrCx) sont élaborés dans un réacteur tubulaire à paroi chaude à partir d’une solution de bis(benzène) chrome dans du toluène pour des températures de 475 °C et sous pression partielle d’azote (pression totale 50 Torr). Une couche d’accroche pouvant être nécessaire pour revêtir des pièces métalliques, tels des aciers et alliages, par un revêtement céramique non-oxyde de type CrCx, des couches de chrome métallique (Cr) et des carbures mixtes Cr-Si-C ont également été élaborées par ce procédé DLICVD. Ainsi, l’ajout d’un additif à base de chlore ou de soufre (par exemple l’hexachlorobenzène ou le thiophénol) dans la solution BBC/toluène permet la déposition de films de chrome métallique (Cr) à 475 °C. De plus, l’utilisation d’une solution de précurseur contenant simultanément du Si et du Cr tel que le tetrakis(trimethylsilylmethyl)chromium dans du toluène mène au dépôt d’un carbure mixte Cr-Si-C pouvant jouer le rôle d’interphase dans des assemblage céramique-métal. Des films de carbure de silicium (SiC) sont obtenus à partir de deux précurseurs (1,3 disilabutane et polysilyléthylène) injectés purs ou en solution également dans du toluène. Les dépôts sont faits dans une gamme de température comprise entre 700 et 800 °C, sous pression partielle d’azote (pression totale 50 Torr). Les films obtenus sont des films amorphes de SiC contenant une faible quantité d’hydrogène (provenant du mécanisme de décomposition des précurseurs) : a-SiC:H. Les films sont stœchiométriques dans le cas de l’injection de précurseur pur, et quasi stœchiométrique lorsque les précurseurs sont dilués dans du toluène. Les films amorphes tels que déposés deviennent nanocristallins en présentant la structure cubique du SiC après recuit sous vide à 1000 °C. L’influence du solvant (toluène) sur la composition, la morphologie et la vitesse de croissance des dépôts est discutée en fonction des systèmes chimiques étudiés et des conditions expérimentales, en particulier les conditions locales dans le réacteur DLICVD telles que les gradients de température et de concentration. Des films de carbure de hafnium (HfC) sont également élaborés par le même procédé à partir d’une solution de bis(cyclopentadiényl)diméthyl hafnium dans du toluène après avoir testé plusieurs précurseurs. Une température de 750 °C est utilisée et l’utilité d’une pression partielle de dihydrogène dans le gaz vecteur azote est démontrée (pression totale 50 Torr, 423 sccm de N2 et 77 sccm de H2). Tels que déposés, ces films sont riches en carbone (C-rich HfCx) et ont une structure quasi-amorphe. Ils deviennent nanocristallins après recuit sous vide à 1000 °C. Enfin, la mise en œuvre de films multicouches céramiques par DLICVD à paroi chaude est mise en évidence par l’élaboration de revêtements multicouches HfC/SiC à 750 °C, sous pression partielle d’un mélange de gaz vecteur N2/H2. Le contrôle du procédé permet une nano structuration de ces revêtements multicouches jusqu’à une bi-période de 100 nm (empilement de 100 couches d’environ 50 nm chacune). La stabilité thermique de ces architectures et des tests préliminaires de résistance à l’oxydation à haute température des films de SiC et HfC/SiC sont discutés. / Ceramic coatings are made from metalorganic precursors by a chemical vapour deposition process assisted by pulsed liquid injection (DLICVD). Chromium carbide (CrCx) films are grown in a tubular hot wall reactor from a solution of bis(benzene)chromium in toluene under partial pressure of nitrogen at 475 °C (total pressure set at 50 Torr). Bonding layers are useful on metallic components, such as steels and alloys, with non-oxide ceramic films such as CrCx, to that purpose metallic chromium (Cr) and mixed carbides Cr-Si-C have been made by DLICVD. Furthermore, adding a chlorinated or sulfur based additive (e.g. hexachlorobenzene or thiophenol) in the BBC/toluene solution allows depositing metallic chromium (Cr) at 475 °C. Moreover, using a precursor containing Si and Cr as tetrakis(trimethylsilylmethyl)-chromium in toluene leads to the deposition of Cr-Si-C mixed carbide. Silicon carbide films are made from two precursors (1,3-disilabutane and polysilylethylene) that have been injected either pure or diluted in toluene. A temperature range of 700 to 800 °C has been used under a partial pressure of nitrogen (total pressure of 50 Torr). SiC films are amorphous and contain a small quantity of hydrogen (hydrogen comes from precursor pyrolysis mechanism): a-SiC:H. Films are stoichiometric when pure precursors are injected, and quasi stoichiometric when precursors are diluted in toluene. As deposited coatings are amorphous and become nanocristalline (cubic SiC structure) after annealing at 1000 °C under vacuum. The influences of the solvent (toluene) on the composition, morphology and growth rate are discussed as a function of the chemical system and experimental conditions, in particular reactor gradient conditions such as temperature and precursors concentration in gas phase. Hafnium carbide films are also made using a solution of bis(cyclopentadiényl)diméthyl hafnium in toluene by the same process. Temperature is set to 750 °C and hydrogen partial pressure has been shown useful (total pressure of 50 Torr, 423 sccm of N2 and 77 sccm of H2). As-deposited films are C-rich HfCx and quasi amorphous. They become nanocristalline after annealing at 1000 °C under vacuum. Finally, ceramics multilayer HfC/SiC coatings were deposited by DLICVD at 750 °C under a partial pressure of a mixture of N2/H2. The process allows a good control of the multilayer nanostructure. Thermal stability and high temperature oxidation preliminary tests on SiC and HfC/SiC films are discussed.

Esta tese de doutorado tem por objetivo aprofundar as pesquisas realizadas no mestrado, a saber, da caracterização e estudo das propriedades estruturais e ópticas de filmes de oxinitreto de silício (SiOxNy:H) ricos em silício depositados pela técnica de deposição química a vapor assistida por plasma a baixa temperatura (PECVD). Os resultados obtidos no mestrado indicaram que os filmes de SiOxNy:H ricos em silício apresentam emissão luminescente na faixa do visível cuja intensidade e freqüência de emissão estão em correlação com o excesso de silício. Os resultados sugeriram que o excesso de silício na matriz do SiOxNy:H estava disposto na forma de aglomerados de silício de dimensões nanométricas responsáveis por efeitos de tamanho quântico bem como a estados radiativos na interface dos aglomerados com a matriz isolante. Neste trabalho a fim de avaliar o efeito da separação de fases, do tamanho quântico, e da interface, foram produzidos sistemas nanoestruturados a base de silício com total e parcial separação de fases para caracterizar e analisar suas propriedades ópticas e estruturais e compará-las com as dos filmes ricos em silício. Assim foram produzidas multicamadas de a-Si:H de poucos nanômetros de espessura com materiais dielétricos. Em algumas destas multicamadas foi promovida a mistura parcial das camadas por meio de bombardeamento iônico. O estudo nas estruturas de multicamadas permitiu caracterizar e analisar as propriedades estruturais e ópticas de materiais nanoestruturados com total e parcial separação de fases para posteriormente contrastá-los com as características dos filmes de oxinitreto de silício ricos em silício. A fim de analisar a influência da interface nas propriedades ópticas destes sistemas as multicamadas foram fabricadas com dois dielétricos diferentes: o óxido de silício e o ni treto de silício. A espessura das camadas dielétricas foi mantida fixa entanto que a das camadas de silício foi variada para avaliar efeitos de confinamento no silício. A caracterização foi feita utilizando técnicas de absorção óptica no UV-Vis, absorção no infravermelho (FTIR), espectroscopia Raman, fotoluminescência (PL), espectroscopia de absorção de raios X próximos 7 à borda do silício (XANES), e microscopia eletrônica de transmissão de alta resolução (HRTEM). Da análise dos resultados concluiu-se que o confinamento é fundamental para a existência da emissão luminescente embora o tipo de interface influencie a energia e a intensidade da emissão. A análise comparativa com as multicamadas permitiu verificar que os filmes de oxinitreto de silício ricos em silício apresentam, separação parcial de fases já como depositados, os tratamentos térmicos promovem a segregação do silício aumentando conseqüentemente a separação de fases. / The aim of this doctorate thesis is to enhance the knowledge in the research conducted along the Master degree based on the characterization and study of the structural and luminescent properties of silicon rich silicon oxynitride films (SiOxNy:H) deposited at low temperature by Plasma Enhanced Chemical Vapor Deposition (PECVD). The results of this study indicated that silicon rich SiOxNy:H films present luminescence in the visible spectra range with intensity and frequency in correlation with the silicon excess. The results suggested that the silicon excess in the SiOxNy:H matrix is confined in nanometric silicon clusters responsible for the to quantum size effects as well as for radiactive states at the interface of the silicon clusters with the insulating matrix. In the present work in order to evaluate the effect of phase separation, quantum size and interface effects si licon based nanostructured systems presenting total and partial phase separation were produced and their structural and optical properties were characterized in order to correlate them with the silicon rich films ones. In this way multilayers with few nanometers thick a-Si layers with dielectric materials were produced. The mixture of the layers was promoted by ion bombardment in some of these multilayers. The study of these structures permitted the characterization of structural and optical properties of materials with total and partial phase separation with the purpose of comparing them to the silicon-rich silicon oxynitride films characteristics. In order to analyze the interface influence in the optical properties, multilayers systems with two different dielectric materials, silicon oxide and silicon nitride, were fabricated. The dielectric layer thickness was kept constant while the silicon layer was varied in order to study the confinement effect. The characterization was done utilizing UV-Vis optical absorption, infrared absorption (FTIR), Raman spectroscopy, Photoluminescence (PL), X-ray absorption near edge spectroscopy (XANES) and high-resolution transmission electron microscopy (HRTEM) techniques. From the results analysis it was concluded that confinement is essent ial for the existence of luminescent 9 emission although the type of interface also influences the energy and intensity of the emission. The comparative analysis with the multilayers permitted to verify that the silicon-rich silicon oxynitride films present, as deposited, partial phase separation and that the thermal treatments promotes silicon aggregation thus increasing the phase separation.

Em virtude do crescente volume da utilização de embalagens multicamadas na preservação de alimentos, torna-se necessário o estudo visando a reciclagem desses materiais através de seu reaproveitamento como matéria-prima e a transformação em novos produtos ou materiais. Dentre os vários tipos de reciclagem utilizados atualmente, a formação de blendas poliméricas com material descartado apresenta-se como uma alternativa viável, pois se trata de uma atividade moderna que une o desenvolvimento tecnológico e a preservação ambiental. O presente trabalho faz um estudo sobre a reciclagem de resíduos de embalagens multicamadas pós-consumo no setor alimentício para a formação de uma blenda. O filme multicamada composto por poliamida 6 e polietileno de baixa densidade foi previamente moído para obtenção de flocos e a ele foi adicionado primeiramente o aditivo etileno-propileno-dieno monômero e em seguida foi feito uma nova mistura composta apenas de anidrido maléico com filme multicamada na forma de flocos, no intuito de melhorar as propriedades mecânicas das blendas formadas pelo processo da extrusão. Para a verificação dos resultados obtidos foram realizados testes de tração, alongamento e permeabilidade ao gás oxigênio no filme de poliamida 6 e polietileno, e ensaios mecânicos, análises térmicas e microscopia eletrônica de varredura nas blendas obtidas. Também se estudou o efeito da radiação (100 kGy) sobre as propriedades das blendas utilizando-se um acelerador de elétrons. / In virtue of the increasing volume of the multilayers packings use in the food preservation, the study for the recycling of these materials through its reverse speed-exploitation as raw material and the transformation in new products or materials becomes necessary. Amongst some types of recycling used currently, the polymers blendes formation with discarded material is presented as a viable alternative, therefore if it deals with a modern activity that joins the technological development and the ambient preservation. The present research, therefore makes a study on the recycling of residues from multilayers packings after-consumes in the nourishing sector for the blend formation. The multilayer film composed by polyamide 6 and polyethylene of low density was previously worn out for flake attainment and it was added first the Ethylene-Propylene-Diene-Monomer (EPDM) additive and after that a new composed maleic anhydride mixture was made only with multilayer film in the flake form, in intention to improve the mechanical properties of blendes formed for the process of the drawing. For verification of the results assays had been carried through traction tests, rupture lengthening tests and permeability to the gas oxygen in the film of polyamide 6 and mechanical properties of blendes formed for the process of the drawing. For verification of the results assays had been carried through traction tests, rupture lengthening tests and permeability to the gas oxygen in the film of polyamide 6 and mechanical polyethylene, and assays, thermal analyses and scanning electronic microscopy in the blendes. It was also studied radiation dose (100 kGy) on the blends properties using an electron beam accelerator.

"Polyelectrolyte multilayer (PEM) thin films prepared via the Layer-by-Layer (LbL) deposition technique are of special interest in this research. The purpose of this study is to replace current mechanical closure systems, based on hook-and-loop type fasteners (i.e. Velcro), with PEM thin film systems. The technique is simple, cheap, versatile and environmental friendly; as a consequence a variety of thin films can be easily fabricated. By proposing PEMs as non-mechanical and nanoscopic molecular closures, we aim to obtain hermetic sealing, good adhesive strength, and peel off ease. Atomic force microscopy (AFM) and colloidal probe techniques were used to characterize the morphology, roughness and adhesive properties of PEMs. AFM measurements were conducted in air, necessarily requiring careful control of ambient humidity. PEMs were formed by consecutive deposition of polyanions and polycations on a charged polyethylene terephthalate (PET) solid surface, the result of which was stable nanostructured films. By systemically varying the parameters of PEM build-up process: different combinations of polyelectrolytes, different numbers of bilayers (polyanion/polycation pairs), and miscellaneous types and concentrations of salts (NaCl, NaBr and NaF salts at 0.5 M and 1.0 M concentrations), the adhesion and morphology of PEMs were thoroughly investigated. The PEM thin films specifically investigated include poly(ethyleneimine) (PEI), poly(styrene sulfonate) (PSS), poly(allylamine hydrochloride) (PAH), poly(acrylic acid) (PAA), and poly(diallydimethylammonium chloride) (PDADMAC). Silica colloidal probes were utilized in the investigation, some of which were functionalized with COOH and/or coated with PEI-PSS. Silica colloidal probes were used in order to quantify interaction forces on the PEMs. A functionalized silica colloidal probe (a probe with COOH surface chemistry) and a silica colloidal probe coated with PEI-PSS were used to simulate PEM-PEM interactions. The results suggest that adhesion in the PEMs depend on the number of layers, the salt concentration and the salt type used during the build-up process, the environmental conditions where the adhesion force measurements were made, and the choice of probe. "

Esta tese de doutorado tem por objetivo aprofundar as pesquisas realizadas no mestrado, a saber, da caracterização e estudo das propriedades estruturais e ópticas de filmes de oxinitreto de silício (SiOxNy:H) ricos em silício depositados pela técnica de deposição química a vapor assistida por plasma a baixa temperatura (PECVD). Os resultados obtidos no mestrado indicaram que os filmes de SiOxNy:H ricos em silício apresentam emissão luminescente na faixa do visível cuja intensidade e freqüência de emissão estão em correlação com o excesso de silício. Os resultados sugeriram que o excesso de silício na matriz do SiOxNy:H estava disposto na forma de aglomerados de silício de dimensões nanométricas responsáveis por efeitos de tamanho quântico bem como a estados radiativos na interface dos aglomerados com a matriz isolante. Neste trabalho a fim de avaliar o efeito da separação de fases, do tamanho quântico, e da interface, foram produzidos sistemas nanoestruturados a base de silício com total e parcial separação de fases para caracterizar e analisar suas propriedades ópticas e estruturais e compará-las com as dos filmes ricos em silício. Assim foram produzidas multicamadas de a-Si:H de poucos nanômetros de espessura com materiais dielétricos. Em algumas destas multicamadas foi promovida a mistura parcial das camadas por meio de bombardeamento iônico. O estudo nas estruturas de multicamadas permitiu caracterizar e analisar as propriedades estruturais e ópticas de materiais nanoestruturados com total e parcial separação de fases para posteriormente contrastá-los com as características dos filmes de oxinitreto de silício ricos em silício. A fim de analisar a influência da interface nas propriedades ópticas destes sistemas as multicamadas foram fabricadas com dois dielétricos diferentes: o óxido de silício e o ni treto de silício. A espessura das camadas dielétricas foi mantida fixa entanto que a das camadas de silício foi variada para avaliar efeitos de confinamento no silício. A caracterização foi feita utilizando técnicas de absorção óptica no UV-Vis, absorção no infravermelho (FTIR), espectroscopia Raman, fotoluminescência (PL), espectroscopia de absorção de raios X próximos 7 à borda do silício (XANES), e microscopia eletrônica de transmissão de alta resolução (HRTEM). Da análise dos resultados concluiu-se que o confinamento é fundamental para a existência da emissão luminescente embora o tipo de interface influencie a energia e a intensidade da emissão. A análise comparativa com as multicamadas permitiu verificar que os filmes de oxinitreto de silício ricos em silício apresentam, separação parcial de fases já como depositados, os tratamentos térmicos promovem a segregação do silício aumentando conseqüentemente a separação de fases. / The aim of this doctorate thesis is to enhance the knowledge in the research conducted along the Master degree based on the characterization and study of the structural and luminescent properties of silicon rich silicon oxynitride films (SiOxNy:H) deposited at low temperature by Plasma Enhanced Chemical Vapor Deposition (PECVD). The results of this study indicated that silicon rich SiOxNy:H films present luminescence in the visible spectra range with intensity and frequency in correlation with the silicon excess. The results suggested that the silicon excess in the SiOxNy:H matrix is confined in nanometric silicon clusters responsible for the to quantum size effects as well as for radiactive states at the interface of the silicon clusters with the insulating matrix. In the present work in order to evaluate the effect of phase separation, quantum size and interface effects si licon based nanostructured systems presenting total and partial phase separation were produced and their structural and optical properties were characterized in order to correlate them with the silicon rich films ones. In this way multilayers with few nanometers thick a-Si layers with dielectric materials were produced. The mixture of the layers was promoted by ion bombardment in some of these multilayers. The study of these structures permitted the characterization of structural and optical properties of materials with total and partial phase separation with the purpose of comparing them to the silicon-rich silicon oxynitride films characteristics. In order to analyze the interface influence in the optical properties, multilayers systems with two different dielectric materials, silicon oxide and silicon nitride, were fabricated. The dielectric layer thickness was kept constant while the silicon layer was varied in order to study the confinement effect. The characterization was done utilizing UV-Vis optical absorption, infrared absorption (FTIR), Raman spectroscopy, Photoluminescence (PL), X-ray absorption near edge spectroscopy (XANES) and high-resolution transmission electron microscopy (HRTEM) techniques. From the results analysis it was concluded that confinement is essent ial for the existence of luminescent 9 emission although the type of interface also influences the energy and intensity of the emission. The comparative analysis with the multilayers permitted to verify that the silicon-rich silicon oxynitride films present, as deposited, partial phase separation and that the thermal treatments promotes silicon aggregation thus increasing the phase separation.

Les développements récents en physique, et technologiques, ont permis l’élaboration de nouveaux matériaux magnéto-électro-élastique, comme les composites multicouches piézoélectriques / piézomagnétiques. Leur coefficient magnétoélectrique, très grand en comparaison de celui des matériaux constitués d’une seule phase, a suscité récemment un grand nombre de travaux, menant au développement de capteurs, d’actionneurs, de systèmes de conversion d’énergie magnétique-électrique, et dans les mémoires à état solide.Cette thèse porte sur l’étude théorique et expérimentale des ondes acoustiques de surface dans des structures multicouches piézomagnétiques. Une description théorique des matériaux magnéto-élastiques, reposant sur la dérivation d’un modèle de matériau piézomagnétique équivalent, est utilisée conjointement à une technique numérique afin de calculer les courbes de dispersion et les formes des modes des ondes acoustiques se propageant dans des composites piézo-électro-magnétiques déposés sur un substrat. Ce modèle, très général, peut être utilisé pour différents types de structures et pour une intensité et une direction quelconques du champ magnétique externe appliqué. Les structures réalisées en salle blanche sont constituées d’un film mince de 20 couches de TbCo2 (5nm)/FeCo(5nm) déposé sur un substrat de LiNbO3 entre deux peignes interdigités. Une comparaison, entre les variations de la vitesse de phase d’ondes acoustiques de surface induites par l’application d’un champ magnétique externe modélisées et mesurées, est réalisée. Un bon accord quantitatif entre les mesures et les calculs théoriques, et cela pour toutes les orientations du champ magnétique (suivant l’axe facile ou l’axe difficile) et pour différents modes acoustiques, est obtenu. Le mode transverse horizontal présente les plus grandes variations de vitesse, proche de 20% pour un film dont l’épaisseur serait celle de la longueur d’onde acoustique / Recent developments in physics and technology allow the elaboration of new magneto-electro- elastic materials such as multilayered piezoelectric-piezomagnetic composites. Their large magne- toelectric coefficient, compared to the one of single phase materials, recently attracted a large number of studies, and they are now widely used in the development of sensors, actuators, magnetic- electric energy converting devices, and solid state memories.This PhD thesis addresses the experimental and theoretical investigations of guided elastic waves propagation in piezomagnetic multi-layered structure. A theoretical description of magneto- elastic materials, based on the derivation of an equivalent piezomagnetic material of a magnetostric- tive thin film, is used in conjunction with a numerical method to compute propagation constants, i.e. dispersion curves, and mode shapes of elastic waves in layered piezoelectric-piezomagnetic com- posites deposited on a substrate. This model can be used for different structures, and for an applied external magnetic field of any intensity and direction.The realized structures are composed of a 20xTbCo2(5nm)/FeCo(5nm) nanostructured multi- layer deposited between two Aluminum Inter-Digitals Transducers forming a surface acoustic wave delay line, on a LiNbO3 substrate. A comparison between the calculated and measured phase velocity variation under the action of the external magnetic field orientation and magnitude is made. A quantitative agreement between the measured and modeled phase velocity shift for all external magnetic field configurations (hard axis and easy axis) and for different shape modes of elastic waves at their first and third harmonic operation frequencies is obtained. The shear horizontal mode exhibits a maximum phase velocity shift close to 20% for a ratio close to 1 between magneto-elastic film thickness and wavelength