Avec le développement de nouvelles sources d’énergie, les technologies dédiées à son stockage ont un rôle capital. Le zirconate de Plomb (PZ de structure Pérovskite) présente un grand intérêt pour les futures capacités rapides permettant le stockage de forte densité d’énergie. Cette propriété est associée à la transition de phase ferroélectrique – anti ferroélectrique induite par le champ électrique et qui s’accompagne d’une grande capacité de stockage. Le PZ a été déposé par pulvérisation cathodique RF sur différents types de substrats et notamment le SrTiO3, les cibles sont obtenues par mélange des poudres et pressage à froid. L’étude s’est focalisée sur les effets d’interfaces entre le film et l’électrode inférieure (LaNiO3 dans notre cas), l’orientation préférentielle des films et la réalisation de films épitaxiés de PZ. La structure, la micro structure des films ainsi que leurs épaisseurs ont un impact sur les contraintes existantes dans le film et nous avons évalué ces effets sur la capacité de stockage du PZ dans la phase anti ferroélectrique. L’optimisation des propriétés des interfaces et de l’ingénierie des contraintes permettent d’améliorer la densité d’énergie stockée dans un film anti ferroélectrique. C’est une voie sérieuse pour les supers condensateurs à base de matériaux fonctionnels de type PZ. / With the development of new energy resources, the advanced energy storage technologies are also becoming more and more important. Perovskite lead zirconate PbZrO3 is of great interest for future high-energy and fast-speed storage capacitors, due to the field-forced phase transition into the ferroelectric state accompanied by large charge storage. The material is deposited on SrTiO3 by RF magnetron sputtering from cold pressed target made in laboratory. The study focuses on the effect of interface between films and electrodes, preferred orientations, epitaxial strain and measuring conditions on the energy storage properties of PbZrO3-based antiferroelectric films. The improvement of interface properties and strain engineering enhance the energy storage density of antiferroelectric film, which may open a route to advance studies on PbZrO3-based antiferroelectric functional devices.

Metal oxides crystallized in perovskite structure are generally modified in two different ways. According to the general structural formula ABO3, the two ways are A-site modification and B-site modification. The primary significance of perovskite metal oxides rests on their importance in electronic devices. A particular class of perovskites, namely Lead Zirconate or modified Lead Zirconate has received a special attention because of their unique antiferroelectricity and various applications in devices. Among the other modifications, A-site modification of PbZrO3 by La is rare and not much explored. Chapter 1 describes various applications of antiferroelectric thin films along with the synthesis and characterization of pure and La modified PbZrO3, which are relevant to the work presented in this thesis. Sol-gel processing and spin coating technique to deposit solid oxide thin films are well known for their low cost of deposition as well as for their ability to achieve better stoichiometric chemical composition. Common crack formation problem of sol-gel grown films can be prevented by ‘drying control chemical adhesive’ like polyvinylpyrrolidone (PVP). Heat treatment of sol-gel derived thin films is generally determined by TGA and DTA. Crystalline phase of deposited solid thin films is determined by XRD whereas effect of modification can be ascertained by XRD peak assignment and relative crystalline peak shifting. Sol-gel grown film thickness is measured by common cross sectional SEM whereas AFM can detail the surface morphology. Chapter 2 summarizes the deposition and characterization of pure and La modified PbZrO3 thin films. Any nonmetal, which is insulator, is dielectric material and show dielectric dispersion in a frequency domain of low field alternative current. Among the most common feature of dielectric dispersion, Maxwell – Wagner type dispersion is well known. Similar kind of dielectric dispersion, named Maxwell – Wagner like dispersion, can be observed while the equivalent circuit consists of parallel G – C along with a series R. Universal power law of ac conductivity is the deciding factor to distinguish the nature of dispersion. Structural phase transition can be determined by dielectric response and it is widely known as dielectric phase transition. Effect of La modification on dielectric phase transition of PbZrO3 thin films depends on stabilization or destabilization of antiferroelectricity. Maximum dielectric constants of pure and modified PbZrO3 thin films depend on the crystallographic orientations of the growth. Chapter 3 presents dielectric properties of pure and La modified PbZrO3 thin films and these properties are correlated to the stabilization or destabilization of antiferroelectricity, relative integrated intensity of (202)O film orientation and trapped electron charge due to oxygen vacancies. Charge storage property of a capacitor is determined by the polarization of the capacitor on application of electric field whereas field dependent integrated area of polarization on withdrawal of electric field determines the recoverable capacitive energy storage. Among the three kinds of capacitors like linear or paraelectric, ferroelectric and antiferroelectric capacitors, antiferroelectric capacitor is known to be best for their ability to store huge amount of recoverable energy. The recoverable energy in antiferroelectrics can be increased by increasing squareness of the P – E hysteresis loop, applicable electric field, polarization or by the all possible combinations of them. Chapter 4 describes the correlation of relative integrated intensity of (202)O [RI(202)O] with critical applied electric field of P – E saturation to provide enhanced squareness of the hysteresis loops. This chapter also describes the variation of charge and recoverable energy storage properties with respect to RI(202)O. Like magnetocaloric effect, electrocaloric effect is capable to alter the temperature of a system by adiabatic polarization or depolarization. From the Maxwell’s relation of thermodynamics, assuming, (∂p ) = (∂s )electrocaloric effect can be calculated from temperature dependent polarization value of a paraelectric, ferroelectric or an antiferroelectric. Chapter 5 presents the electrocaloric effect of pure and La modified PbZrO3 thin films. Summary of present study and discussion have been delineated in Chapter 6 along with the future work which can give more insight into the understanding of antiferroelectric PbZrO3 thin films with respect to Pb and Zr site modification and with respect to different electrodes. (For formulas pl see the pdf file of the thesis)