This work focuses on a simple template assisted approach for fabricating I-III-VI semiconductor nanowire arrays. Vertically aligned nanowires of p-CIS of controllable diameter and thickness are electrodeposited, from an acidic electrolyte solution, inside porous aluminum templates using a three electrode set up with saturated calomel electrode as the reference. AAO template over ITO-glass was used as starting template for the device fabrication. The deposited CIS is annealed at different temperatures in a reducing environment (95% Ar+ 5% H2) for 30 minutes. X-ray diffraction of the nanowires showed nanocrystalline cubic phase structures with a strong orientation in the <112> direction. The effective bandgap of the deposited CIS nanowires determined using the Near Infrared (NIR) Spectrometer was found to be 1.07eV. The type of CIS electrodeposited inside the porous alumina template is determined to be p-type from the Schottky diode obtained with ITO-CIS-Au structure. Schottky diodes were characterized and analyzed at room temperature.

Vertically aligned nanowire arrays of copper phthalocyanine (CuPc) and CuPc-Al Schottky diodes, of controllable diameter and length were fabricated by cathodic electrodeposition of CuPc into anodized alumina (AAO) templates, followed by annealing at 300 ºC in Argon. AAO over Aluminum tape and that over ITO-glass were both used as starting templates for the device fabrication. Depending on the dimensions of the starting AAO template, diameters of CuPc nanowires ranged from 30 nm to 40 nm and the lengths ranged from 500 nm to 1 μm. The temperature dependence of the phase and the absorption spectrum of the nanowires are reported. The electrodeposited nanowires (as prepared) had the preferred crystallite orientation of the α-phase. ITO formed the ohmic contact and Schottky contacts were formed between CuPc and aluminum. Insertion of a thin layer of PEDOT:PSS between CuPc nanowires and the ITO electrode improved the contact and reduced the series resistance by an order of magnitude. Schottky diodes were characterized and analyzed at room temperature and at cryogenic temperatures.

This work focuses on the growth of vertically aligned CdTe nanowire arrays of controllable diameter and length using cathodic electro deposition in anodized alumina templates. This step was followed by annealing at 250° C in a reducing environment (95% Ar + 5% H2). AAO template over ITO-glass was used as starting template for the device fabrication. The deposited nanowires showed nanocrystalline cubic phase structures with a strong preference in [111] direction. First gold (Au) was deposited into AAO using cathodic electro deposition. This was followed by CdTe deposition into the pore. Gold was deposited first as it aids the growth of CdTe inside AAO and it makes Schottky contact with the deposited n type CdTe. CdTe was determined to be n-type from the fact that back to back diode was obtained with Au-CdTe-Au test structure. Aluminum (Al) was sputtered on the top to make the ohmic contact to the n type CdTe deposited in AAO. Analysis of Schottky diodes yielded a diode ideality factor of 10.03 under dark and 10.08 under light and reverse saturation current density of 34.9μA/cm2 under dark and 39.7μA/cm2 under light.

In this study, InSe and CdS thin films were deposited by thermal evaporation method onto glass substrates. Schottky and heterojunction devices were fabricated by deposition of InSe and CdS thin films onto SnO2 coated glass substrates with various top metal contacts such as Ag, Au, In, Al and C. The structural, electrical and optical properties of the films were investigated prior to characterization of the fabricated devices. The structural properties of the deposited InSe and CdS thin films were examined through SEM and EDXA analysis. XRD and electrical measurements have indicated that undoped InSe thin films deposited on cold substrates were amorphous with p-type conductivity lying in the range of 10-4-10-5 (&amp / #61527 / .cm)-1 at room temperature. Cd doping and post-depositional annealing effect on the samples were investigated and it was observed that annealing at 100 oC did not show any significant effect on the film properties, whereas the conductivity of the samples increased as the Cd content increases. Temperature dependent I-V and Hall effect measurements have shown that conductivity and carrier concentration increases with increasing absolute temperature while mobility is almost temperature independent in the studied temperature range of 100-430 K. The structural and electrical analysis on the as-grown CdS thin films have shown that the films were polycrystalline with n-type conductivity. Temperature dependent conductivity and Hall effect measurements have indicated that conductivity, mobility and carrier concentrations increases with increasing temperature. Transmission measurements on the as-grown InSe and CdS films revealed optical band gaps around 1.74 and 2.36 eV, respectively. Schottky diode structures in the form of TO/p-InSe/Metal were fabricated with a contact area of around 8x10-3 cm2 and characterized. The best rectifying devices obtained with Ag contacts while diodes with Au contacts have shown slight rectification. The ideality factor and barrier height of the best rectifying structure were determined to be 2.0 and 0.7 eV, respectively. Illuminated I-V measurements revealed open-circuit voltages around 300 mV with short circuit current 3.2x10-7 A. High series resistance effect was observed for the structure which was found to be around 588 &amp / #61527 / . Validity of SCLC mechanism for Schottky structures was also investigated and it was found that the mechanism was related with the bulk of InSe itself. Heterostructures were obtained in the form of TO/n-CdS/p-InSe/Metal and the devices with Au and C contacts have shown the best photovoltaic response with open circuit voltage around 400 mV and short circuit current 4.9x10-8 A. The ideality factor of the cells was found to be around 2.5. High series resistance effect was also observed for the heterojunction devices and the fill factors were determined to be around 0.4 which explains low efficiencies observed for the devices.

Die vorliegenden Arbeit befasst sich mit der Herstellung und Charakterisierung von transparenten Metall-Halbleiter- Feldeffekttransistoren. Dazu werden im ersten Kapitel transparente gleichrichtende Kontakte, basierend auf dem Konzept von Metalloxidkontakten, hergestellt und im Hinblick auf chemische Zusammensetzung des Kontaktmaterials, Barriereninhomogenität und Kompatibilität mit amorphen Halbleitern untersucht. Außerdem wird die Anwendbarkeit der Kontakte als UV-Sensor studiert. Im zweiten Kapitel werden transparente leitfähige Oxide vorgestellt und insbesondere deren optische und elektrische Eigenschaften in Abhängigkeit von den Herstellungsbedingungen studiert. Das dritte Kapitel beinhaltet Untersuchungen zu transparenten Feldeffektransistoren, die auf den im ersten Kapitel untersuchten transparenten gleichrichtenden Kontakten basieren (TMESFETs). Insbesondere die elektrischen Stabilität der Bauelemente hinsichtlich Beleuchtung, erhöhten Temperaturen und Spannungsstress wird untersucht. Auch die Langzeitstabilität, Reproduzierbarkeit und der Effekt gepulster Spannungen wird betrachtet. Weiterhin wird die Verwendung amorpher Halbleiter im Kanal und damit auch die Herstellung flexibler Transistoren auf Folie demonstriert. Zuletzt werden die TMESFETs integriert und als Inverterschaltkreise aufgebaut und untersucht. Außerdem wird die Eignung der Transistoren zur Messung von Aktionspotentialen von Nervenzellen studiert.

Zugl.: Darmstadt, Techn. Univ., Diss., 2008

Title of dissertation: GROWTH OF Zn POLAR BeMgZnO/ZnO HETEROSTRUCTURE WITH TWO DIMENSIONAL ELECTRON GAS (2DEG) AND FABRICATION OF SILVER SCHOTTKY DIODE ON BeMgZnO/ZnO HETEROSTRUCTURE By Md Barkat Ullah, Ph.D A dissertation submitted in partial fulfillment of the requirements for the degree of Doctor of Philosophy in Electrical and Computer Engineering at Virginia Commonwealth University. Virginia Commonwealth University,2017 Major Director: Dr. Hadis Morkoç, Professor, Electrical and Computer Engineering This thesis focuses on growth of Zn polar BeMgZnO/ZnO heterostructure on GaN/sapphire template with two dimensional electron gas (2DEG) for the application of UV photodetector/emitter and high speed electronics. The motivation of using BeMgZnO as a barrier layer originates from the need to reach plasmon-LO phonon resonance in order to obtain minimum longitudinal optical (LO) phonon lifetime. Presence of 2DEG was realized in BeMgZnO/ZnO heterostructure only when the Zn polarity was achieved during the nucleation growth of ZnO on GaN/sapphire template. It was found that, polarity of ZnO on (0001) GaN/sapphire template can be controlled by the oxygen to Zn ratio used during the nucleation growth. To obtain high structural and optical quality of BeMgZnO quaternary alloy, growth kinetics of BeMgZnO layer has been studied at the temperature range from 450°C-500°C. We have achieved the growth of single crystal Be.03Mg00.15ZnO alloy at 500 °C, more than 100°C higher compared to what reported in literature, on the (0001) GaN/sapphire template through the control of Zn/(Be+Mg) flux ratio. We have also observed a thermodynamic limitation of Mg incorporation into the wurtzite BeMgZnO alloy where the excess Mg adatom accumulated in the growing surface as a MgO rich cluster. Two dimensional electron gas with high (1.2×1013cm-2) sheet carrier density was achieved at the Be0.03Mg0.41ZnO/ZnO interface through strain engineering by incorporating Be into MgZnO ternary alloy. To obtain the similar sheet carrier density it would require above 60% of Mg in MgZnO/ZnO heterostructure with reduced structural quality. A systematic comparison of sheet carrier density has been made with the already reported results from Zn polar MgZnO/ZnO heterostructure as well as with the theoretical calculation. Silver Schottky diode on Be0.02Mg0.26ZnO/ZnO heterostructure with barrier height 1.07 eV and ideality factor 1.22 was obtained with 8 order of rectification ratio. The temperature-dependent electrical characteristics were studied by using temperature dependent current-voltage (I-V) measurements. Richardson constant value of 34.8 Acm-2K-2 was found experimentally which was close to the theoretical value of 36 Acm-2K-2 known for Be0.02Mg0.26ZnO alloy.

Die vorliegenden Arbeit befasst sich mit der Herstellung und Charakterisierung von transparenten Metall-Halbleiter- Feldeffekttransistoren. Dazu werden im ersten Kapitel transparente gleichrichtende Kontakte, basierend auf dem Konzept von Metalloxidkontakten, hergestellt und im Hinblick auf chemische Zusammensetzung des Kontaktmaterials, Barriereninhomogenität und Kompatibilität mit amorphen Halbleitern untersucht. Außerdem wird die Anwendbarkeit der Kontakte als UV-Sensor studiert. Im zweiten Kapitel werden transparente leitfähige Oxide vorgestellt und insbesondere deren optische und elektrische Eigenschaften in Abhängigkeit von den Herstellungsbedingungen studiert. Das dritte Kapitel beinhaltet Untersuchungen zu transparenten Feldeffektransistoren, die auf den im ersten Kapitel untersuchten transparenten gleichrichtenden Kontakten basieren (TMESFETs). Insbesondere die elektrischen Stabilität der Bauelemente hinsichtlich Beleuchtung, erhöhten Temperaturen und Spannungsstress wird untersucht. Auch die Langzeitstabilität, Reproduzierbarkeit und der Effekt gepulster Spannungen wird betrachtet. Weiterhin wird die Verwendung amorpher Halbleiter im Kanal und damit auch die Herstellung flexibler Transistoren auf Folie demonstriert. Zuletzt werden die TMESFETs integriert und als Inverterschaltkreise aufgebaut und untersucht. Außerdem wird die Eignung der Transistoren zur Messung von Aktionspotentialen von Nervenzellen studiert.

Le domaine du Térahertz a suscité beaucoup d’intérêt de la part de la communauté scientifique ces dernières années. La diode Schottky constitue la pierre angulaire des circuits de détection, des multiplieurs de fréquence ou encore des mélangeurs dans cette bande de fréquence, notamment grâce à son comportement non-linéaire. Les travaux menés durant cette thèse visent à optimiser les caractéristiques de ce composant pour deux fonctions non-linéaires – la détection et la multiplication de fréquence – celles-ci ayant des facteurs de mérites bien spécifiques. Un même dispositif ne saurait les satisfaire conjointement La non-linéarité capacitive est généralement mise à profit pour la multiplication de fréquence alors que la détection s’appuie sur la non-linéarité résistive associée à la caractéristique statique. Pour réaliser cette optimisation, un code particulaire Monte-Carlo (MC) résolvant l’équation de Boltzmann couplée à l’équation de Poisson a été développé. La diode Schottky est un composant largement contrôlé par l’interface métal/semi-conducteur et la gestion des conditions aux limites constitue une étape clef dans la modélisation du dispositif. Le principe d’exclusion de Pauli doit être considéré pour un semi-conducteur très dopé et une distribution spécifique pour les porteurs injectés du côté du contact ohmique a été optimisée puis utilisée dans la modélisation de la diode. D’autres effets physiques à l’interface métal/semi-conducteur ont été implémentés tels que l’effet tunnel suivant différents degrés de raffinement, le phénomène de force image ou encore l’abaissement de la hauteur de barrière par le champ électrique dû aux états de surface. Cette modélisation MC a permis de déduire un schéma équivalent électrique petit-signal aux fréquences Térahertz dont les différents paramètres sont ajustés en prenant en compte la déplétion possible du substrat pour des diodes courtes. L’extraction du schéma équivalent peut s’effectuer suivant différentes stratégies : en excitant la diode avec un signal de faible amplitude ou encore à partir de l’étude des densités spectrales associées aux fluctuations de courant et de tension. Les phénomènes physiques pouvant mettre en défaut ce schéma électrique tels que la vitesse de saturation des porteurs ou le phénomène d’ionisation par choc en polarisation inverse sont discutés. Le recours à un schéma électrique est motivé par une volonté de l’intégrer facilement au cœur d’un circuit pour une fonction spécifique et de l’exploiter avec un logiciel commercial tel que ADS (Advanced Design System) dans une logique d’optimisation. Des simulations de type « Harmonic Balance » ont été menées afin d’étudier le rendement d’un circuit de détection et d’un multiplieur de fréquence pour dégager les caractéristiques optimales de la diode sur chacun de ces circuits. Le GaAs est souvent un semi-conducteur de choix pour la réalisation de circuits aux fréquences Térahertz grâce à sa maturité technologique et à sa haute mobilité électronique. D’autres semi-conducteurs tels que l’InGaAs, le GaSb ou encore le GaN sont également étudiés. Une diode avec un couple métal/semi-conducteur présentant une faible hauteur de barrière donne les meilleurs rendements de conversion pour la détection. Pour le multiplieur de fréquence, il existe un dopage optimal en fonction de la longueur de la couche active permettant de maximiser le rendement du circuit. / The terahertz field has generated significant interest from the scientific community in recent years. The Schottky diode is the cornerstone of detection circuits, frequency multipliers or mixers in this frequency band, thanks to its non-linear behavior. The work carried out during this thesis aims at optimizing the characteristics of this component for two non-linear functions - detection and frequency multiplication - these having very specific figures of merit. The same device can not satisfy them together. Capacitive non-linearity is generally used for frequency multiplication while the detection is based on the resistive non-linearity associated with the current-voltage characteristic. To achieve this optimization, a Monte Carlo (MC) particle code solving the Boltzmann transport equation coupled to the Poisson equation was developed. The Schottky diode is a component essentially controlled by the metal / semiconductor interface and the boundary conditions are a key step in the device modeling. The Pauli exclusion principle must be considered for a highly doped semiconductor and a specific distribution for the carriers injected on the ohmic contact side has been optimized and then used in the diode modeling. Other physical effects at the metal / semiconductor interface have been implemented, such as tunneling following different degrees of refinement, image force barrier lowering or the barrier height lowering by the electric field due to surface states. A small-signal equivalent circuit at Terahertz frequencies was deduced from the MC modeling. The parameters of this circuit are adjusted by taking into account the possible depletion of the substrate for short diodes. The extraction of the equivalent circuit can be carried out according to different strategies: exciting the diode with a low amplitude signal or studying the spectral densities associated with the current and voltage fluctuations. The physical phenomena that can make the equivalent circuit defective, such as the saturation velocity of carriers or the impact ionization at reverse bias, are discussed. An electrical circuit of the diode was used to be easily integrated into a global circuit for a specific function and exploit it in commercial software such as ADS (Advanced Design System). Harmonic balance simulations were conducted to study the performance of a detection circuit and a frequency multiplier to reach the optimal characteristics of the diode on each of these circuits. GaAs is often a semiconductor of choice for the design of circuits at Terahertz frequencies thanks to its technological maturity and its high electronic mobility. Other semiconductors such as InGaAs, GaSb or GaN are also investigated. A diode with a metal / semiconductor couple having a low barrier height gives the best conversion efficiencies for detection. For the frequency multiplier, there is an optimal doping as a function of the active layer length which maximizes the circuit efficiency.

No description available.