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  • About
  • The Global ETD Search service is a free service for researchers to find electronic theses and dissertations. This service is provided by the Networked Digital Library of Theses and Dissertations.
    Our metadata is collected from universities around the world. If you manage a university/consortium/country archive and want to be added, details can be found on the NDLTD website.
1

3D inspection of wafer bump quality without explicit 3D reconstruction.

January 2004 (has links)
Zhao Yang. / Thesis (M.Phil.)--Chinese University of Hong Kong, 2004. / Includes bibliographical references (leaves 87-95). / Abstracts in English and Chinese. / Chapter 1 --- Introduction --- p.1 / Chapter 1.1 --- Objectives of the Thesis --- p.1 / Chapter 1.2 --- Wafer bumping inspection by using Biplanar Disparity approach --- p.2 / Chapter 1.3 --- Thesis Outline --- p.4 / Chapter 2 --- Background --- p.5 / Chapter 2.1 --- What is wafer bump? --- p.5 / Chapter 2.1.1 --- Common defects of wafer bump --- p.6 / Chapter 2.1.2 --- Literature review on exist wafer bump inspection method --- p.11 / Chapter 3 --- Model 1: the one camera model-Homography approach --- p.21 / Chapter 3.1 --- The introduction of the theoretical base of model 1 --- p.21 / Chapter 3.1.1 --- The objective of model 1 --- p.21 / Chapter 3.1.2 --- Desires --- p.22 / Chapter 3.1.3 --- Some background knowledge on Homography --- p.22 / Chapter 3.2 --- "Model 1- ""Pseudo Homography"" Approach" --- p.24 / Chapter 3.2.1 --- The description of the configuration of model 1 --- p.24 / Chapter 3.2.2 --- The condition of pseudo Homography --- p.25 / Chapter 3.2.3 --- The formation of pseudo Homgraphy H --- p.26 / Chapter 3.3 --- Methodology of treatment of the answer set --- p.32 / Chapter 3.3.1 --- Singular Value Decomposition-SVD --- p.32 / Chapter 3.3.2 --- The Robust Estimation --- p.33 / Chapter 3.3.3 --- Some experimental results by using manmade Ping Pang balls to test SVD[31] and Robust Estimation [24] --- p.35 / Chapter 3.3.4 --- the measurement of the Homography matrix answer set --- p.37 / Chapter 3.4 --- Preliminary experiment about model 1 --- p.43 / Chapter 3.5 --- Problems unsolved --- p.47 / Chapter 4 --- Model 2: the two camera model-Biplanar Disparity approach --- p.48 / Chapter 4.1 --- Theoretical Background --- p.48 / Chapter 4.1.1 --- the linearization of Homography matrix changes --- p.49 / Chapter 4.1.2 --- Problem Nature --- p.51 / Chapter 4.1.3 --- Imaging system setup --- p.52 / Chapter 4.1.4 --- Camera Calibration[13] --- p.52 / Chapter 4.2 --- Methodology --- p.54 / Chapter 4.2.1 --- Invariance measure --- p.54 / Chapter 4.2.2 --- The Geometric meaning of the Biplanar Disparity matrix --- p.58 / Chapter 4.3 --- RANSAC-Random Sample Consensus --- p.64 / Chapter 4.3.1 --- finding Homography matrix by using RANSAC[72] [35] --- p.64 / Chapter 4.3.2 --- finding Fundamental matrix by using RANSAC[73] [34] --- p.65 / Chapter 4.4 --- Harris Corner detection --- p.65 / Chapter 5 --- Simulation and experimental results --- p.67 / Chapter 5.1 --- Simulation experiments --- p.67 / Chapter 5.1.1 --- Preliminary experiments --- p.67 / Chapter 5.1.2 --- Specification for the synthetic data system --- p.71 / Chapter 5.1.3 --- Allowed error in the experiment --- p.71 / Chapter 5.2 --- Real images experiments --- p.72 / Chapter 5.2.1 --- Experiment instrument --- p.72 / Chapter 5.2.2 --- The Inspection Procedure --- p.74 / Chapter 5.2.3 --- Images grabbed under above system --- p.75 / Chapter 5.2.4 --- Experimental Results --- p.81 / Chapter 6 --- CONCLUSION AND FUTURE WORKS --- p.83 / Chapter 6.1 --- Summary on the contribution of my work --- p.83 / Chapter 6.2 --- Some Weakness of The Method --- p.84 / Chapter 6.3 --- Future Works and Further Development --- p.84 / Chapter 6.3.1 --- About the synthetic experiment --- p.84 / Chapter 6.3.2 --- About the real image experiment --- p.85 / Bibliography --- p.87
2

Analysis of Shipley Microposit Remover 1165 and AZ P4620 Photoresist waste disposal for Company XYZ

Barthen, Michael L. January 2001 (has links) (PDF)
Thesis--PlanB (M.S.)--University of Wisconsin--Stout, 2001. / Includes bibliographical references.
3

Plastic deformation in silicon at room temperature as a mode for stacking fault formation

Coppus, George Mitchell, 1953- January 1978 (has links)
No description available.
4

An analysis of chlorine trifluoride as an effective substitute for nitrogen triflouride in the chemical vapor deposition reactor cleaning process

Van Dyke, Stephanie A. January 1998 (has links) (PDF)
Thesis--PlanB (M.S.)--University of Wisconsin--Stout, 1998. / Includes bibliographical references.
5

Analysis of production control methods for semiconductor research and development fabs using simulation /

Ramamurthi, Vikram. January 2004 (has links)
Thesis (M.S.)--Rochester Institute of Technology, 2004. / Typescript. Includes bibliographical references (leaves 72-75).
6

Off-axis illumination for extending optical microlithographic system performance /

Brainerd, Steve, January 1993 (has links)
Thesis (M.S.), Oregon Graduate Institute of Science & Technology, 1993.
7

Advanced process control and optimal sampling in semiconductor manufacturing

Lee, Hyung Joo, January 1900 (has links)
Thesis (Ph. D.)--University of Texas at Austin, 2008. / Vita. Includes bibliographical references.
8

GCA 4800 DSW wafer stepper /

Comard, Matthew J. January 1988 (has links)
Thesis (M.S.)--Rochester Institute of Technology, 1988. / Typescript. Includes bibliographical references (leaves 94-95).
9

Construction of an integrated down-converter for operation at 200 GHz

Digby, John William January 1999 (has links)
No description available.
10

Electromigration induced step instabilities on silicon surfaces

Gibbons, Brian J., January 2006 (has links)
Thesis (Ph. D.)--Ohio State University, 2006. / Title from first page of PDF file. Includes bibliographical references (p. 161-165).

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