This dissertation presents novel Harmonic Rejection (HR) Mixer architectures to obtain a high level of harmonic rejection. This is achieved by reducing the sensitivity to mismatches in devices operating at high frequencies. Consequently, the HR performance for this mixer architecture is primarily determined by resistor and capacitor matching at low intermediate frequencies (IF). Since large resistor areas can be used at relatively less power penalty in the low frequency IF section, superior HR performance is realized. A design fabricated in 110 nm CMOS process, rejects up to the fi rst 14 local oscillator (LO) harmonics and achieves 3rd, 5th and 7th HR ratios in excess of 52, 54 and 55 dB respectively, without any calibration or trimming. This mixer architecture also rejects flicker noise, has improved image rejection (IR) and second-order input-intercept-point (IIP2) performance. By using a clock N times the desired LO frequency, this scheme rejects the (N-1)th LO harmonic only by an amount of 20log(N-1) dB. A new technique is presented that enables better HR for the (N-1)th harmonic while preserving the level of rejection for other harmonics. This mixer fabricated in 55 nm standard CMOS process has a programmable number of 8, 10, 12 or 14 mixer phases and achieves an improvement of 29 dB for the (N-1)th harmonic while achieving 52 dB of rejection for the 3rd harmonic. It also rejects flicker noise and has an IIP2 performance of 68 dBm. The mixers presented in this dissertation set the state-of-the-art in HR performance for single-stage mixers with configurable number of phases without using any calibration or trimming. / text